Design of self-diagnostic boards by multiple signature analysis

A new design approach, based on multiple signature analysis, for self-diagnostic boards is presented. For this approach, test responses from all chips on the board are compressed into space-time signatures using nonbinary multiple error-correcting codes, and faulty chips are identified by analyzing...

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Veröffentlicht in:	IEEE transactions on computers 1993-09, Vol.42 (9), p.1035-1044
Hauptverfasser:	Karpovsky, M.G., Chaudhry, S.M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithm design and analysis Applied sciences Automatic testing Built-in self-test Design. Technologies. Operation analysis. Testing Electronics Error correction codes Exact sciences and technology Fault diagnosis Hardware Integrated circuits Linear feedback shift registers Pattern analysis Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Sequential analysis Test pattern generators
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