Determination of composition of CdSxSe1-x microcrystals in semiconductor-doped glasses using Raman scattering
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| Veröffentlicht in: | Japanese journal of applied physics 1995, Vol.34 (4A), p.1835-1836 |
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| container_end_page | 1836 |
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| container_issue | 4A |
| container_start_page | 1835 |
| container_title | Japanese journal of applied physics |
| container_volume | 34 |
| creator | MIYOSHI, T NAKATSUKA, T MATSUO, N |
| description | |
| doi_str_mv | 10.1143/jjap.34.1835 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0021-4922 |
| ispartof | Japanese journal of applied physics, 1995, Vol.34 (4A), p.1835-1836 |
| issn | 0021-4922 1347-4065 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_3488805 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Iii-v and ii-vi semiconductors Infrared and raman spectra and scattering Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Physics |
| title | Determination of composition of CdSxSe1-x microcrystals in semiconductor-doped glasses using Raman scattering |
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