Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniques

We present the results of SHORTEST, a BRITE EURAM II project for the introduction in industry of an advanced approach to the reliability evaluation of electronic assemblies. The achievements so far are the development and validation of seven in‐situ test techniques. Five of the test techniques demon...

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Veröffentlicht in:Quality and reliability engineering international 1996-07, Vol.12 (4), p.247-252
Hauptverfasser: Gregoris, G., Bouton, F., De Keukeleire, C., Siliprandi, P., Baio, F., De Schepper, L., De Ceuninck, W., Tielemans, L., Ahrens, T., Krumm, M.
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container_end_page 252
container_issue 4
container_start_page 247
container_title Quality and reliability engineering international
container_volume 12
creator Gregoris, G.
Bouton, F.
De Keukeleire, C.
Siliprandi, P.
Baio, F.
De Schepper, L.
De Ceuninck, W.
Tielemans, L.
Ahrens, T.
Krumm, M.
description We present the results of SHORTEST, a BRITE EURAM II project for the introduction in industry of an advanced approach to the reliability evaluation of electronic assemblies. The achievements so far are the development and validation of seven in‐situ test techniques. Five of the test techniques demonstrate the capability of detecting failure mechanisms at 48 hours with moderate stress conditions, and half of the in‐situ test results obtained at 48 hours on 10 subtechnologies correlate with conventional tests. All correlation results are presented. The application of the method for quality assurance and building‐in reliability is discussed. The final aim of SHORTEST is to look for the exploitation of the developed in‐situ techniques. The marketing study that will define the industrial needs of European companies is presented. In parallel, the insertion in the CECC specification of recommendations based on the SHORTEST principle is foreseen.
doi_str_mv 10.1002/(SICI)1099-1638(199607)12:4<247::AID-QRE22>3.0.CO;2-O
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subjects Applied sciences
Electronics
Exact sciences and technology
reliability
short duration test
Testing, measurement, noise and reliability
title Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniques
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