Links between Electrical and Optical Fatigue in Pb (Zr,Ti)O3 Thin Films
Switchable polarization can be significantly suppressed in ferroelectric (FE) materials by electrical or optical processes. Electrical suppression can occur by subjecting the FE to repeated polarization reversals; optical suppression can occur while biasing the FE near the switching threshold and il...
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| Veröffentlicht in: | Journal of the American Ceramic Society 1996-06, Vol.79 (6), p.1714-1716 |
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| container_end_page | 1716 |
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| container_issue | 6 |
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| container_title | Journal of the American Ceramic Society |
| container_volume | 79 |
| creator | Warren, William L. Dimos, Duane Al-Shareef, Husam N. Raymond, Mark V. Turtle, Bruce A. Pike, Gordon E. |
| description | Switchable polarization can be significantly suppressed in ferroelectric (FE) materials by electrical or optical processes. Electrical suppression can occur by subjecting the FE to repeated polarization reversals; optical suppression can occur while biasing the FE near the switching threshold and illuminating with bandgap light. A link between the two processes in Pb(Zr,Ti)O3 (PZT) thin film capacitors is demonstrated by showing a relationship between the amount of the suppressed polarization induced by the two methods. This observation suggests that the optical method may be a useful, simple, and time‐saving probe of a material's susceptibility to fatigue. These results further support the view that polarization suppression in PZT thin films induced by electrical fatigue largely involves electronic charge trapping. |
| doi_str_mv | 10.1111/j.1151-2916.1996.tb08792.x |
| format | Article |
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Electrical suppression can occur by subjecting the FE to repeated polarization reversals; optical suppression can occur while biasing the FE near the switching threshold and illuminating with bandgap light. A link between the two processes in Pb(Zr,Ti)O3 (PZT) thin film capacitors is demonstrated by showing a relationship between the amount of the suppressed polarization induced by the two methods. This observation suggests that the optical method may be a useful, simple, and time‐saving probe of a material's susceptibility to fatigue. 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| ispartof | Journal of the American Ceramic Society, 1996-06, Vol.79 (6), p.1714-1716 |
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| source | Wiley Online Library Journals Frontfile Complete |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric properties of solids and liquids Dielectric, piezoelectric, ferroelectric and antiferroelectric materials Dielectrics, piezoelectrics, and ferroelectrics and their properties Exact sciences and technology Ferroelectricity and antiferroelectricity Niobates, titanates, tantalates, pzt ceramics, etc Physics Polarization and depolarization |
| title | Links between Electrical and Optical Fatigue in Pb (Zr,Ti)O3 Thin Films |
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