Self-checking comparator with one periodic output
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered.
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| Veröffentlicht in: | IEEE transactions on computers 1996-03, Vol.45 (3), p.379-380 |
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| container_end_page | 380 |
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| container_issue | 3 |
| container_start_page | 379 |
| container_title | IEEE transactions on computers |
| container_volume | 45 |
| creator | Kundu, S. Sogomonyan, E.S. Goessel, M. Tarnick, S. |
| description | In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. |
| doi_str_mv | 10.1109/12.485577 |
| format | Article |
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The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered.</description><subject>Added delay</subject><subject>Applied sciences</subject><subject>Circuit faults</subject><subject>Computer errors</subject><subject>Costs</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fault detection</subject><subject>Fault tolerant systems</subject><subject>Hardware</subject><subject>Integrated circuits</subject><subject>Markov processes</subject><subject>Operations research</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. 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| identifier | ISSN: 0018-9340 |
| ispartof | IEEE transactions on computers, 1996-03, Vol.45 (3), p.379-380 |
| issn | 0018-9340 1557-9956 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_3041865 |
| source | IEEE Electronic Library (IEL) |
| subjects | Added delay Applied sciences Circuit faults Computer errors Costs Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Fault detection Fault tolerant systems Hardware Integrated circuits Markov processes Operations research Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Testing |
| title | Self-checking comparator with one periodic output |
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