Cantilever energy effects on bimodal AFM: phase and amplitude contrast of multicomponent samples

Bimodal atomic force microscopy (AFM) is a recently developed technique of dynamic AFM where a higher eigenmode of the cantilever is simultaneously excited along with the fundamental eigenmode. The effects of different operating parameters while imaging an impact copolymer blend of polypropylene (PP...

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Veröffentlicht in:	Nanotechnology 2013-11, Vol.24 (47), p.475706-475706
Hauptverfasser:	Chakraborty, Ishita, Yablon, Dalia G
Format:	Artikel
Sprache:	eng
Schlagworte:	Amplitudes Atomic force microscopy Computer simulation Condensed matter: structure, mechanical and thermal properties Dynamics Electron, ion, and scanning probe microscopy Exact sciences and technology Kinetic energy Mathematical models Physics Polypropylenes Rubber Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Structure of solids and liquids crystallography
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