Measurements of Raman crystallinity profiles in thin-film microcrystalline silicon solar cells

Wedge-polished thin film microcrystalline silicon solar cells are prepared and used for micro-Raman measurements. Thereby, the variations of the Raman crystallinity with depth are accessed easily. Depth resolution limits of the measurement set-up are established and calculations evidencing the role...

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Veröffentlicht in:	Journal of physics. D, Applied physics Applied physics, 2013-06, Vol.46 (23), p.235105
Hauptverfasser:	Choong, G, Vallat-Sauvain, E, Multone, X, Fesquet, L, Kroll, U, Meier, J
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences crystallinity profile Energy Exact sciences and technology microcrystalline silicon Natural energy Photovoltaic conversion Raman spectroscopy Solar cells. Photoelectrochemical cells Solar energy thin film silicon solar cell
Online-Zugang:	Volltext
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