Reduction of recombination velocity on GaAs surface by Ga-S and As-S bond-related surface states from (NH4)2Sx treatment
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Veröffentlicht in: | Journal of the Electrochemical Society 1997, Vol.144 (6), p.2106-2115 |
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container_issue | 6 |
container_start_page | 2106 |
container_title | Journal of the Electrochemical Society |
container_volume | 144 |
creator | SIK, H FEURPRIER, Y CARDINAUD, C TURBAN, G SCAVENNEC, A |
description | |
doi_str_mv | 10.1149/1.1837749 |
format | Article |
fullrecord | <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_2737305</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2737305</sourcerecordid><originalsourceid>FETCH-LOGICAL-p97t-6d7581fed51838d8435b6f56d23339c24fd5c3223f2270d5d7947d35758b34da3</originalsourceid><addsrcrecordid>eNo9j01LAzEQhoMoWKsH_0EOHvSQuskkm91jKbYVioLtvWQzCazsR0lSaf-9QcXT-zzDzMBLyD0vZpzL-pnPeAVay_qCTHgtFdOc80syKQoOTJaKX5ObGD-z8krqCTl9ODza1I4DHT0Nzo590w7mZ_DlutG26Uwzr8w80ngM3lhHm3N2tqVmQDqPGZpxQBZcZ5LD_62Yskbqw9jTx7e1fBLbE03BmdS7Id2SK2-66O7-ckp2y5fdYs0276vXxXzDDrVOrEStKu4dqlyrwkqCakqvShQAUFshPSoLQoAXQheoUNdSI6h81YBEA1Py8Pv2YKI1nQ9msG3cH0Lbm3DeCw0aCgXfJp9cTA</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Reduction of recombination velocity on GaAs surface by Ga-S and As-S bond-related surface states from (NH4)2Sx treatment</title><source>Institute of Physics Journals</source><creator>SIK, H ; FEURPRIER, Y ; CARDINAUD, C ; TURBAN, G ; SCAVENNEC, A</creator><creatorcontrib>SIK, H ; FEURPRIER, Y ; CARDINAUD, C ; TURBAN, G ; SCAVENNEC, A</creatorcontrib><identifier>ISSN: 0013-4651</identifier><identifier>EISSN: 1945-7111</identifier><identifier>DOI: 10.1149/1.1837749</identifier><identifier>CODEN: JESOAN</identifier><language>eng</language><publisher>Pennington, NJ: Electrochemical Society</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Exact sciences and technology ; Physics ; Surface and interface electron states ; Surface states, band structure, electron density of states</subject><ispartof>Journal of the Electrochemical Society, 1997, Vol.144 (6), p.2106-2115</ispartof><rights>1997 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,4010,27900,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2737305$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>SIK, H</creatorcontrib><creatorcontrib>FEURPRIER, Y</creatorcontrib><creatorcontrib>CARDINAUD, C</creatorcontrib><creatorcontrib>TURBAN, G</creatorcontrib><creatorcontrib>SCAVENNEC, A</creatorcontrib><title>Reduction of recombination velocity on GaAs surface by Ga-S and As-S bond-related surface states from (NH4)2Sx treatment</title><title>Journal of the Electrochemical Society</title><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Surface and interface electron states</subject><subject>Surface states, band structure, electron density of states</subject><issn>0013-4651</issn><issn>1945-7111</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNo9j01LAzEQhoMoWKsH_0EOHvSQuskkm91jKbYVioLtvWQzCazsR0lSaf-9QcXT-zzDzMBLyD0vZpzL-pnPeAVay_qCTHgtFdOc80syKQoOTJaKX5ObGD-z8krqCTl9ODza1I4DHT0Nzo590w7mZ_DlutG26Uwzr8w80ngM3lhHm3N2tqVmQDqPGZpxQBZcZ5LD_62Yskbqw9jTx7e1fBLbE03BmdS7Id2SK2-66O7-ckp2y5fdYs0276vXxXzDDrVOrEStKu4dqlyrwkqCakqvShQAUFshPSoLQoAXQheoUNdSI6h81YBEA1Py8Pv2YKI1nQ9msG3cH0Lbm3DeCw0aCgXfJp9cTA</recordid><startdate>1997</startdate><enddate>1997</enddate><creator>SIK, H</creator><creator>FEURPRIER, Y</creator><creator>CARDINAUD, C</creator><creator>TURBAN, G</creator><creator>SCAVENNEC, A</creator><general>Electrochemical Society</general><scope>IQODW</scope></search><sort><creationdate>1997</creationdate><title>Reduction of recombination velocity on GaAs surface by Ga-S and As-S bond-related surface states from (NH4)2Sx treatment</title><author>SIK, H ; FEURPRIER, Y ; CARDINAUD, C ; TURBAN, G ; SCAVENNEC, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p97t-6d7581fed51838d8435b6f56d23339c24fd5c3223f2270d5d7947d35758b34da3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Surface and interface electron states</topic><topic>Surface states, band structure, electron density of states</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SIK, H</creatorcontrib><creatorcontrib>FEURPRIER, Y</creatorcontrib><creatorcontrib>CARDINAUD, C</creatorcontrib><creatorcontrib>TURBAN, G</creatorcontrib><creatorcontrib>SCAVENNEC, A</creatorcontrib><collection>Pascal-Francis</collection><jtitle>Journal of the Electrochemical Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SIK, H</au><au>FEURPRIER, Y</au><au>CARDINAUD, C</au><au>TURBAN, G</au><au>SCAVENNEC, A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reduction of recombination velocity on GaAs surface by Ga-S and As-S bond-related surface states from (NH4)2Sx treatment</atitle><jtitle>Journal of the Electrochemical Society</jtitle><date>1997</date><risdate>1997</risdate><volume>144</volume><issue>6</issue><spage>2106</spage><epage>2115</epage><pages>2106-2115</pages><issn>0013-4651</issn><eissn>1945-7111</eissn><coden>JESOAN</coden><cop>Pennington, NJ</cop><pub>Electrochemical Society</pub><doi>10.1149/1.1837749</doi><tpages>10</tpages></addata></record> |
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identifier | ISSN: 0013-4651 |
ispartof | Journal of the Electrochemical Society, 1997, Vol.144 (6), p.2106-2115 |
issn | 0013-4651 1945-7111 |
language | eng |
recordid | cdi_pascalfrancis_primary_2737305 |
source | Institute of Physics Journals |
subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Physics Surface and interface electron states Surface states, band structure, electron density of states |
title | Reduction of recombination velocity on GaAs surface by Ga-S and As-S bond-related surface states from (NH4)2Sx treatment |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T18%3A41%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Reduction%20of%20recombination%20velocity%20on%20GaAs%20surface%20by%20Ga-S%20and%20As-S%20bond-related%20surface%20states%20from%20(NH4)2Sx%20treatment&rft.jtitle=Journal%20of%20the%20Electrochemical%20Society&rft.au=SIK,%20H&rft.date=1997&rft.volume=144&rft.issue=6&rft.spage=2106&rft.epage=2115&rft.pages=2106-2115&rft.issn=0013-4651&rft.eissn=1945-7111&rft.coden=JESOAN&rft_id=info:doi/10.1149/1.1837749&rft_dat=%3Cpascalfrancis%3E2737305%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |