Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation : ADVANCES IN ELECTROSTATIC DISCHARGE (ESD) PROTECTION FOR ICs

Bibliographische Detailangaben

Veröffentlicht in:	Microelectronics and reliability 2013, Vol.53 (2), p.221-228
Hauptverfasser:	MONNEREAU, N, CAIGNET, F, TREMOUILLES, D, NOLHIER, N, BAFLEUR, M
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online-Zugang:	Volltext
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