A Low-Noise High-Dynamic-Range 17-b 1.3-Megapixel 30-fps CMOS Image Sensor With Column-Parallel Two-Stage Folding-Integration/Cyclic ADC

A 1.3-megapixel CMOS image sensor (CIS) with digital correlated double sampling and 17-b column-parallel two-stage folding-integration/cyclic analog-to-digital converters (ADCs) is developed. The image sensor has 0.021-e rms - vertical fixed pattern noise, 1.2-e rms - pixel temporal noise, and 85.0-...

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Veröffentlicht in:	IEEE transactions on electron devices 2012-12, Vol.59 (12), p.3396-3400
Hauptverfasser:	Min-Woong Seo, Sawamoto, T., Akahori, T., Zheng Liu, Iida, T., Takasawa, T., Kosugi, T., Watanabe, T., Isobe, K., Kawahito, S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Capacitors Circuit properties CMOS image sensor (CIS) CMOS image sensors column-parallel folding-integration/cyclic analog-to-digital (A/D) converter (ADC) digital correlated double sampling (CDS) Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Gain Gray-scale high dynamic range (DR) Imaging devices low vertical fixed pattern noise (FPN) (vFPN) multiple sampling technique Neural networks Noise measurement Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Signal convertors Solid state circuits
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