A new CDM test method and protective circuits against the excessive mobile charge

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Veröffentlicht in:	Semiconductor science and technology 1998-10, Vol.13 (10), p.1065-1070, Article 1065
Hauptverfasser:	Suzuki, K, Muranoi, T, Sugita, R, Takeuchi, M, Hariu, T
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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source	IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link
subjects	Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title	A new CDM test method and protective circuits against the excessive mobile charge
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