Absolute radical densities in etching plasmas determined by broad-band UV absorption spectroscopy
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Veröffentlicht in: | Plasma sources science & technology 1998-08, Vol.7 (3), p.423-430 |
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container_issue | 3 |
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container_title | Plasma sources science & technology |
container_volume | 7 |
creator | Booth, Jean-Paul Cunge, Gilles Neuilly, François Sadeghi, Nader |
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doi_str_mv | 10.1088/0963-0252/7/3/021 |
format | Article |
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ispartof | Plasma sources science & technology, 1998-08, Vol.7 (3), p.423-430 |
issn | 0963-0252 1361-6595 |
language | eng |
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source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
subjects | Analytical chemistry Chemical analysis and related physical methods of analysis Chemistry Exact sciences and technology Physics Physics of gases, plasmas and electric discharges Physics of plasmas and electric discharges Plasma applications Plasma properties Spectrometric and optical methods |
title | Absolute radical densities in etching plasmas determined by broad-band UV absorption spectroscopy |
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