Aqueous lateral epitaxy overgrowth of ZnO on (0001 ) GaN at 90 °C Part II: Stress determination

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Thin solid films 2010-08, Vol.518 (21), p.6030-6035
Hauptverfasser: FILLERY, Scott P, CLARKE, David R, LANGE, Frederick F
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 6035
container_issue 21
container_start_page 6030
container_title Thin solid films
container_volume 518
creator FILLERY, Scott P
CLARKE, David R
LANGE, Frederick F
description
doi_str_mv 10.1016/j.tsf.2010.03.073
format Article
fullrecord <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_23078205</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>23078205</sourcerecordid><originalsourceid>FETCH-LOGICAL-p100t-d9c2ff02064981116052ec196cfa74366b6de284bbcf89d49cfa66c4a743c4e23</originalsourceid><addsrcrecordid>eNotjE1OwzAUhC0EEqFwAHZvgwSLhOefOjG7KoJSqaJIwIZNcR0bUqVJsF2gt-IMnIxWsBrNfJqPkFOKGUUqL5dZDC5juO3IM8z5HklokauU5ZzukwRRYCpR4SE5CmGJiJQxnpCX0fvadusAjY7W6wZsX0f9tYHuw_pX333GN-gcPLcz6Fo43_3gAsb6DnQEhfDzXcK99hEmkyt4iN6GAJXdqlZ1q2PdtcfkwOkm2JP_HJCnm-vH8jadzsaTcjRNe4oY00oZ5hwylEIVlFKJQ2YNVdI4nQsu5UJWlhVisTCuUJVQ211KI3bQCMv4gJz9eXsdjG6c162pw7z39Ur7zZxxzAuGQ_4Le7tWSw</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Aqueous lateral epitaxy overgrowth of ZnO on (0001 ) GaN at 90 °C Part II: Stress determination</title><source>Elsevier ScienceDirect Journals</source><creator>FILLERY, Scott P ; CLARKE, David R ; LANGE, Frederick F</creator><creatorcontrib>FILLERY, Scott P ; CLARKE, David R ; LANGE, Frederick F</creatorcontrib><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/j.tsf.2010.03.073</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Amsterdam: Elsevier</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Defects and impurities in crystals; microstructure ; Exact sciences and technology ; Materials science ; Methods of nanofabrication ; Microscopic defects (voids, inclusions, etc.) ; Nanoscale pattern formation ; Other semiconductors ; Physics ; Specific materials ; Structure and morphology; thickness ; Structure of solids and liquids; crystallography ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology</subject><ispartof>Thin solid films, 2010-08, Vol.518 (21), p.6030-6035</ispartof><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=23078205$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>FILLERY, Scott P</creatorcontrib><creatorcontrib>CLARKE, David R</creatorcontrib><creatorcontrib>LANGE, Frederick F</creatorcontrib><title>Aqueous lateral epitaxy overgrowth of ZnO on (0001 ) GaN at 90 °C Part II: Stress determination</title><title>Thin solid films</title><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Defects and impurities in crystals; microstructure</subject><subject>Exact sciences and technology</subject><subject>Materials science</subject><subject>Methods of nanofabrication</subject><subject>Microscopic defects (voids, inclusions, etc.)</subject><subject>Nanoscale pattern formation</subject><subject>Other semiconductors</subject><subject>Physics</subject><subject>Specific materials</subject><subject>Structure and morphology; thickness</subject><subject>Structure of solids and liquids; crystallography</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNotjE1OwzAUhC0EEqFwAHZvgwSLhOefOjG7KoJSqaJIwIZNcR0bUqVJsF2gt-IMnIxWsBrNfJqPkFOKGUUqL5dZDC5juO3IM8z5HklokauU5ZzukwRRYCpR4SE5CmGJiJQxnpCX0fvadusAjY7W6wZsX0f9tYHuw_pX333GN-gcPLcz6Fo43_3gAsb6DnQEhfDzXcK99hEmkyt4iN6GAJXdqlZ1q2PdtcfkwOkm2JP_HJCnm-vH8jadzsaTcjRNe4oY00oZ5hwylEIVlFKJQ2YNVdI4nQsu5UJWlhVisTCuUJVQ211KI3bQCMv4gJz9eXsdjG6c162pw7z39Ur7zZxxzAuGQ_4Le7tWSw</recordid><startdate>20100831</startdate><enddate>20100831</enddate><creator>FILLERY, Scott P</creator><creator>CLARKE, David R</creator><creator>LANGE, Frederick F</creator><general>Elsevier</general><scope>IQODW</scope></search><sort><creationdate>20100831</creationdate><title>Aqueous lateral epitaxy overgrowth of ZnO on (0001 ) GaN at 90 °C Part II: Stress determination</title><author>FILLERY, Scott P ; CLARKE, David R ; LANGE, Frederick F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p100t-d9c2ff02064981116052ec196cfa74366b6de284bbcf89d49cfa66c4a743c4e23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Defects and impurities in crystals; microstructure</topic><topic>Exact sciences and technology</topic><topic>Materials science</topic><topic>Methods of nanofabrication</topic><topic>Microscopic defects (voids, inclusions, etc.)</topic><topic>Nanoscale pattern formation</topic><topic>Other semiconductors</topic><topic>Physics</topic><topic>Specific materials</topic><topic>Structure and morphology; thickness</topic><topic>Structure of solids and liquids; crystallography</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>FILLERY, Scott P</creatorcontrib><creatorcontrib>CLARKE, David R</creatorcontrib><creatorcontrib>LANGE, Frederick F</creatorcontrib><collection>Pascal-Francis</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>FILLERY, Scott P</au><au>CLARKE, David R</au><au>LANGE, Frederick F</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Aqueous lateral epitaxy overgrowth of ZnO on (0001 ) GaN at 90 °C Part II: Stress determination</atitle><jtitle>Thin solid films</jtitle><date>2010-08-31</date><risdate>2010</risdate><volume>518</volume><issue>21</issue><spage>6030</spage><epage>6035</epage><pages>6030-6035</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><cop>Amsterdam</cop><pub>Elsevier</pub><doi>10.1016/j.tsf.2010.03.073</doi><tpages>6</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0040-6090
ispartof Thin solid films, 2010-08, Vol.518 (21), p.6030-6035
issn 0040-6090
1879-2731
language eng
recordid cdi_pascalfrancis_primary_23078205
source Elsevier ScienceDirect Journals
subjects Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Defects and impurities in crystals
microstructure
Exact sciences and technology
Materials science
Methods of nanofabrication
Microscopic defects (voids, inclusions, etc.)
Nanoscale pattern formation
Other semiconductors
Physics
Specific materials
Structure and morphology
thickness
Structure of solids and liquids
crystallography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
title Aqueous lateral epitaxy overgrowth of ZnO on (0001 ) GaN at 90 °C Part II: Stress determination
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T14%3A25%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Aqueous%20lateral%20epitaxy%20overgrowth%20of%20ZnO%20on%20(0001%20)%20GaN%20at%2090%20%C2%B0C%20Part%20II:%20Stress%20determination&rft.jtitle=Thin%20solid%20films&rft.au=FILLERY,%20Scott%20P&rft.date=2010-08-31&rft.volume=518&rft.issue=21&rft.spage=6030&rft.epage=6035&rft.pages=6030-6035&rft.issn=0040-6090&rft.eissn=1879-2731&rft.coden=THSFAP&rft_id=info:doi/10.1016/j.tsf.2010.03.073&rft_dat=%3Cpascalfrancis%3E23078205%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true