Stationary Mode Distribution and Sidewall Roughness Effects in Overmoded Optical Waveguides
In this paper, the authors investigate analytically the transformation from the initial guided mode distribution to the stationary state and the effects of the bidimensional roughness profile, in multimode polymeric buried waveguides. In these structures, due to the geometrical dimensions and the op...
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| Veröffentlicht in: | Journal of lightwave technology 2010-05, Vol.28 (10), p.1510-1520 |
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| container_title | Journal of lightwave technology |
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| creator | Di Donato, Andrea Farina, Marco Mencarelli, Davide Lucesoli, Agnese Fabiani, Silvia Rozzi, Tullio Di Gregorio, Giordano M Angeloni, Giacomo |
| description | In this paper, the authors investigate analytically the transformation from the initial guided mode distribution to the stationary state and the effects of the bidimensional roughness profile, in multimode polymeric buried waveguides. In these structures, due to the geometrical dimensions and the operating wavelength, about a thousands of guided modes can propagate, even for weak core/cladding dielectric contrast. The coupling coefficients are computed by exploiting the geometrical features of the optical channels, such as the waveguide dimensions and the roughness surface statistics. The analysis gives insight on the guided/guided and guided/radiated mode interaction, and higher order solution is proposed, in the case of a great number of modes interacting over distances that are extremely long as compared to the signal wavelength and the roughness correlation length. Experimental results are valuated by means of semicontact atomic force microscopy as well as compared with existing numerical models. |
| doi_str_mv | 10.1109/JLT.2010.2045154 |
| format | Article |
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In these structures, due to the geometrical dimensions and the operating wavelength, about a thousands of guided modes can propagate, even for weak core/cladding dielectric contrast. The coupling coefficients are computed by exploiting the geometrical features of the optical channels, such as the waveguide dimensions and the roughness surface statistics. The analysis gives insight on the guided/guided and guided/radiated mode interaction, and higher order solution is proposed, in the case of a great number of modes interacting over distances that are extremely long as compared to the signal wavelength and the roughness correlation length. Experimental results are valuated by means of semicontact atomic force microscopy as well as compared with existing numerical models.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/JLT.2010.2045154</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Atomic force microscopy ; Circuit properties ; Dielectrics ; Electric, optical and optoelectronic circuits ; Electronics ; Exact sciences and technology ; Geometrical optics ; Integrated optics. Optical fibers and wave guides ; Miscellaneous ; Multimode polymeric waveguide ; Optical and optoelectronic circuits ; Optical computing ; Optical coupling ; optical interconnections ; Optical polymers ; optical printed circuit board (PCB) ; Optical propagation ; Optical waveguides ; Stationary state ; Surface waves</subject><ispartof>Journal of lightwave technology, 2010-05, Vol.28 (10), p.1510-1520</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c353t-f1c3356ed85ee88677755b61a4d6115ab2c25d9c02938c542470b625258bc79c3</citedby><cites>FETCH-LOGICAL-c353t-f1c3356ed85ee88677755b61a4d6115ab2c25d9c02938c542470b625258bc79c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5430946$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5430946$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22907489$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Di Donato, Andrea</creatorcontrib><creatorcontrib>Farina, Marco</creatorcontrib><creatorcontrib>Mencarelli, Davide</creatorcontrib><creatorcontrib>Lucesoli, Agnese</creatorcontrib><creatorcontrib>Fabiani, Silvia</creatorcontrib><creatorcontrib>Rozzi, Tullio</creatorcontrib><creatorcontrib>Di Gregorio, Giordano M</creatorcontrib><creatorcontrib>Angeloni, Giacomo</creatorcontrib><title>Stationary Mode Distribution and Sidewall Roughness Effects in Overmoded Optical Waveguides</title><title>Journal of lightwave technology</title><addtitle>JLT</addtitle><description>In this paper, the authors investigate analytically the transformation from the initial guided mode distribution to the stationary state and the effects of the bidimensional roughness profile, in multimode polymeric buried waveguides. In these structures, due to the geometrical dimensions and the operating wavelength, about a thousands of guided modes can propagate, even for weak core/cladding dielectric contrast. The coupling coefficients are computed by exploiting the geometrical features of the optical channels, such as the waveguide dimensions and the roughness surface statistics. The analysis gives insight on the guided/guided and guided/radiated mode interaction, and higher order solution is proposed, in the case of a great number of modes interacting over distances that are extremely long as compared to the signal wavelength and the roughness correlation length. Experimental results are valuated by means of semicontact atomic force microscopy as well as compared with existing numerical models.</description><subject>Applied sciences</subject><subject>Atomic force microscopy</subject><subject>Circuit properties</subject><subject>Dielectrics</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Geometrical optics</subject><subject>Integrated optics. Optical fibers and wave guides</subject><subject>Miscellaneous</subject><subject>Multimode polymeric waveguide</subject><subject>Optical and optoelectronic circuits</subject><subject>Optical computing</subject><subject>Optical coupling</subject><subject>optical interconnections</subject><subject>Optical polymers</subject><subject>optical printed circuit board (PCB)</subject><subject>Optical propagation</subject><subject>Optical waveguides</subject><subject>Stationary state</subject><subject>Surface waves</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkM1LwzAYh4MoOKd3wUtAxFM1n016FJ1fTAZO8eChpOlbzejambSK_70pGzt4Ckme3-99eRA6puSCUpJdPk5fLhiJN0aEpFLsoBGVUieMUb6LRkRxnmjFxD46CGFBCBVCqxF6n3emc21j_C9-akvANy503hX98IhNU-K5K-HH1DV-bvuPzwZCwJOqAtsF7Bo8-wa_jLkSz1ads6bGb-YbPvoYCodorzJ1gKPNOUavt5OX6_tkOrt7uL6aJpZL3iUVtZzLFEotAbROlVJSFik1okwplaZglskys4RlXFspmFCkSJlkUhdWZZaP0fm6d-Xbrx5Cly9dsFDXpoG2D7kSXEmV0iySp__IRdv7Ji6XU6KpSHlKSaTImrK-DcFDla-8W0ZDEcoH2XmUnQ-y843sGDnbFJsQJVTeNNaFbY6xjCihhwVO1pwDgO13LCBZHP4HGiSGhg</recordid><startdate>20100515</startdate><enddate>20100515</enddate><creator>Di Donato, Andrea</creator><creator>Farina, Marco</creator><creator>Mencarelli, Davide</creator><creator>Lucesoli, Agnese</creator><creator>Fabiani, Silvia</creator><creator>Rozzi, Tullio</creator><creator>Di Gregorio, Giordano M</creator><creator>Angeloni, Giacomo</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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In these structures, due to the geometrical dimensions and the operating wavelength, about a thousands of guided modes can propagate, even for weak core/cladding dielectric contrast. The coupling coefficients are computed by exploiting the geometrical features of the optical channels, such as the waveguide dimensions and the roughness surface statistics. The analysis gives insight on the guided/guided and guided/radiated mode interaction, and higher order solution is proposed, in the case of a great number of modes interacting over distances that are extremely long as compared to the signal wavelength and the roughness correlation length. Experimental results are valuated by means of semicontact atomic force microscopy as well as compared with existing numerical models.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/JLT.2010.2045154</doi><tpages>11</tpages></addata></record> |
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| subjects | Applied sciences Atomic force microscopy Circuit properties Dielectrics Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Geometrical optics Integrated optics. Optical fibers and wave guides Miscellaneous Multimode polymeric waveguide Optical and optoelectronic circuits Optical computing Optical coupling optical interconnections Optical polymers optical printed circuit board (PCB) Optical propagation Optical waveguides Stationary state Surface waves |
| title | Stationary Mode Distribution and Sidewall Roughness Effects in Overmoded Optical Waveguides |
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