Accurate EM-Based Modeling of Cascode FETs
Cascode field-effect transistors (FETs) are widely used in the design of monolithic microwave integrated circuits (MMICs), owing to their almost unilateral and broadband behavior. However, since a dedicated model of the cell is rarely provided by foundries, a suboptimal description built by replicat...
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Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2010-04, Vol.58 (4), p.719-729 |
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creator | Resca, Davide Lonac, Julio A. Cignani, Rafael Raffo, Antonio Santarelli, Alberto Vannini, Giorgio Filicori, Fabio |
description | Cascode field-effect transistors (FETs) are widely used in the design of monolithic microwave integrated circuits (MMICs), owing to their almost unilateral and broadband behavior. However, since a dedicated model of the cell is rarely provided by foundries, a suboptimal description built by replicating the standard foundry model for both the common source and common gate device is often adopted. This might limit the success of the MMIC design at the first foundry run. This paper describes an electromagnetic-based empirical model of cascode cells, covering topics from the formulation and identification procedures to the corresponding validation described in an exhaustive experimental section. A MMIC low-noise distributed amplifier case is then presented and the proposed model is used for circuit analysis and instability detection. Clear indication is provided about the improvement in the prediction of critical behaviors with respect to conventional modeling approaches. A cascode cell with a symmetric layout is also successfully modeled. |
doi_str_mv | 10.1109/TMTT.2010.2041576 |
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However, since a dedicated model of the cell is rarely provided by foundries, a suboptimal description built by replicating the standard foundry model for both the common source and common gate device is often adopted. This might limit the success of the MMIC design at the first foundry run. This paper describes an electromagnetic-based empirical model of cascode cells, covering topics from the formulation and identification procedures to the corresponding validation described in an exhaustive experimental section. A MMIC low-noise distributed amplifier case is then presented and the proposed model is used for circuit analysis and instability detection. Clear indication is provided about the improvement in the prediction of critical behaviors with respect to conventional modeling approaches. A cascode cell with a symmetric layout is also successfully modeled.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2010.2041576</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Amplifiers ; Applied sciences ; Broadband ; Circuit analysis ; Circuit properties ; Design. Technologies. Operation analysis. Testing ; Devices ; Distributed amplifiers ; Electric, optical and optoelectronic circuits ; Electromagnetic (EM) analysis ; Electromagnetic modeling ; Electronic circuits ; Electronics ; Exact sciences and technology ; Field effect MMICs ; Foundries ; Gating and risering ; Integrated circuits ; Mathematical models ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; Microwave devices ; Microwave FET integrated circuits ; microwave field-effect transistors (FETs) ; Microwave integrated circuits ; Microwaves ; Monolithic integrated circuits ; monolithic microwave integrated circuits (MMICs) ; Predictive models ; semiconductor device modeling ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Theoretical study. 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(IEEE) Apr 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-ee358ae174b50f955c9607820636d74b792521d525a5bea14f016b754210dcd53</citedby><cites>FETCH-LOGICAL-c355t-ee358ae174b50f955c9607820636d74b792521d525a5bea14f016b754210dcd53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5427062$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5427062$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22729508$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Resca, Davide</creatorcontrib><creatorcontrib>Lonac, Julio A.</creatorcontrib><creatorcontrib>Cignani, Rafael</creatorcontrib><creatorcontrib>Raffo, Antonio</creatorcontrib><creatorcontrib>Santarelli, Alberto</creatorcontrib><creatorcontrib>Vannini, Giorgio</creatorcontrib><creatorcontrib>Filicori, Fabio</creatorcontrib><title>Accurate EM-Based Modeling of Cascode FETs</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>Cascode field-effect transistors (FETs) are widely used in the design of monolithic microwave integrated circuits (MMICs), owing to their almost unilateral and broadband behavior. However, since a dedicated model of the cell is rarely provided by foundries, a suboptimal description built by replicating the standard foundry model for both the common source and common gate device is often adopted. This might limit the success of the MMIC design at the first foundry run. This paper describes an electromagnetic-based empirical model of cascode cells, covering topics from the formulation and identification procedures to the corresponding validation described in an exhaustive experimental section. A MMIC low-noise distributed amplifier case is then presented and the proposed model is used for circuit analysis and instability detection. Clear indication is provided about the improvement in the prediction of critical behaviors with respect to conventional modeling approaches. A cascode cell with a symmetric layout is also successfully modeled.</description><subject>Amplifiers</subject><subject>Applied sciences</subject><subject>Broadband</subject><subject>Circuit analysis</subject><subject>Circuit properties</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Devices</subject><subject>Distributed amplifiers</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electromagnetic (EM) analysis</subject><subject>Electromagnetic modeling</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Field effect MMICs</subject><subject>Foundries</subject><subject>Gating and risering</subject><subject>Integrated circuits</subject><subject>Mathematical models</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>Microwave devices</subject><subject>Microwave FET integrated circuits</subject><subject>microwave field-effect transistors (FETs)</subject><subject>Microwave integrated circuits</subject><subject>Microwaves</subject><subject>Monolithic integrated circuits</subject><subject>monolithic microwave integrated circuits (MMICs)</subject><subject>Predictive models</subject><subject>semiconductor device modeling</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Theoretical study. Circuits analysis and design</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1LAzEQhoMoWKs_QLwsiAjC1kmyk-wea6kf0OJlPYc0Oytbtt2adA_-e7O09OBpeGeeGZKHsVsOE86heC6XZTkREKOAjKNWZ2zEEXVaKA3nbATA87TIcrhkVyGsY8wQ8hF7mjrXe7unZL5MX2ygKll2FbXN9jvp6mRmg4sxeZ2X4Zpd1LYNdHOsY_YV27P3dPH59jGbLlInEfcpkcTcEtfZCqEuEF2hQOcClFRVbOpCoOAVCrS4IsuzGrhaacwEh8pVKMfs8XB357ufnsLebJrgqG3tlro-GI1SyyzHgbz_R6673m_j4wwHoblSKAeKHyjnuxA81Wbnm431vxEygzwzyDODPHOUF3cejpejANvW3m5dE06LQmhRRH-RuztwDRGdxvEvGpSQfxcGcz8</recordid><startdate>20100401</startdate><enddate>20100401</enddate><creator>Resca, Davide</creator><creator>Lonac, Julio A.</creator><creator>Cignani, Rafael</creator><creator>Raffo, Antonio</creator><creator>Santarelli, Alberto</creator><creator>Vannini, Giorgio</creator><creator>Filicori, Fabio</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Testing</topic><topic>Devices</topic><topic>Distributed amplifiers</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electromagnetic (EM) analysis</topic><topic>Electromagnetic modeling</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Field effect MMICs</topic><topic>Foundries</topic><topic>Gating and risering</topic><topic>Integrated circuits</topic><topic>Mathematical models</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>Microwave devices</topic><topic>Microwave FET integrated circuits</topic><topic>microwave field-effect transistors (FETs)</topic><topic>Microwave integrated circuits</topic><topic>Microwaves</topic><topic>Monolithic integrated circuits</topic><topic>monolithic microwave integrated circuits (MMICs)</topic><topic>Predictive models</topic><topic>semiconductor device modeling</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Theoretical study. Circuits analysis and design</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Resca, Davide</creatorcontrib><creatorcontrib>Lonac, Julio A.</creatorcontrib><creatorcontrib>Cignani, Rafael</creatorcontrib><creatorcontrib>Raffo, Antonio</creatorcontrib><creatorcontrib>Santarelli, Alberto</creatorcontrib><creatorcontrib>Vannini, Giorgio</creatorcontrib><creatorcontrib>Filicori, Fabio</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Resca, Davide</au><au>Lonac, Julio A.</au><au>Cignani, Rafael</au><au>Raffo, Antonio</au><au>Santarelli, Alberto</au><au>Vannini, Giorgio</au><au>Filicori, Fabio</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Accurate EM-Based Modeling of Cascode FETs</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2010-04-01</date><risdate>2010</risdate><volume>58</volume><issue>4</issue><spage>719</spage><epage>729</epage><pages>719-729</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>Cascode field-effect transistors (FETs) are widely used in the design of monolithic microwave integrated circuits (MMICs), owing to their almost unilateral and broadband behavior. However, since a dedicated model of the cell is rarely provided by foundries, a suboptimal description built by replicating the standard foundry model for both the common source and common gate device is often adopted. This might limit the success of the MMIC design at the first foundry run. This paper describes an electromagnetic-based empirical model of cascode cells, covering topics from the formulation and identification procedures to the corresponding validation described in an exhaustive experimental section. A MMIC low-noise distributed amplifier case is then presented and the proposed model is used for circuit analysis and instability detection. Clear indication is provided about the improvement in the prediction of critical behaviors with respect to conventional modeling approaches. A cascode cell with a symmetric layout is also successfully modeled.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMTT.2010.2041576</doi><tpages>11</tpages></addata></record> |
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subjects | Amplifiers Applied sciences Broadband Circuit analysis Circuit properties Design. Technologies. Operation analysis. Testing Devices Distributed amplifiers Electric, optical and optoelectronic circuits Electromagnetic (EM) analysis Electromagnetic modeling Electronic circuits Electronics Exact sciences and technology Field effect MMICs Foundries Gating and risering Integrated circuits Mathematical models Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits Microwave devices Microwave FET integrated circuits microwave field-effect transistors (FETs) Microwave integrated circuits Microwaves Monolithic integrated circuits monolithic microwave integrated circuits (MMICs) Predictive models semiconductor device modeling Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Theoretical study. Circuits analysis and design |
title | Accurate EM-Based Modeling of Cascode FETs |
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