100 GHz+ Gain-B andwidth Differential Amplifiers in a Wafer Scale Heterogeneously Integrated Technology Using 250 nm InP DHBTs and 130 nm CMOS
Gespeichert in:
Hauptverfasser: | , , , , , , , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 2670 |
---|---|
container_issue | 10 |
container_start_page | 2663 |
container_title | |
container_volume | 44 |
creator | CHINGWEI LI, James ELLIOTT, Kenneth R MATTHEWS, David S HITKO, Donald A ZEHNDER, Daniel ROYTER, Yakov PATTERSON, Pamela R HUSSAIN, Tahir JENSEN, Joseph F |
description | |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_22157593</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>22157593</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_221575933</originalsourceid><addsrcrecordid>eNqNjc1Kw0AUhQdRMP68w924ksBM0qHp0rbauBCFptRduSR30pHJTZgZkfgQPrNRfABXh3POB9-JSJTWRarm-eupSKRURbrIpDwXFyG8TXU2K1QivpSUsCk_b2GDltMlIDcftolHWFtjyBNHiw7uusFZY8kHsAwIe5w-2NboCEqK5PuWmPr34EZ45Eitx0gNVFQfuXd9O8IuWG4h0xK4m5AXWJfLKvzoQOW_4-rpeXslzgy6QNd_eSluHu6rVZkOGCaZ8ci1DYfB2w79eMgyped6kef_5b4BJXVUsg</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>100 GHz+ Gain-B andwidth Differential Amplifiers in a Wafer Scale Heterogeneously Integrated Technology Using 250 nm InP DHBTs and 130 nm CMOS</title><source>IEEE Electronic Library (IEL)</source><creator>CHINGWEI LI, James ; ELLIOTT, Kenneth R ; MATTHEWS, David S ; HITKO, Donald A ; ZEHNDER, Daniel ; ROYTER, Yakov ; PATTERSON, Pamela R ; HUSSAIN, Tahir ; JENSEN, Joseph F</creator><creatorcontrib>CHINGWEI LI, James ; ELLIOTT, Kenneth R ; MATTHEWS, David S ; HITKO, Donald A ; ZEHNDER, Daniel ; ROYTER, Yakov ; PATTERSON, Pamela R ; HUSSAIN, Tahir ; JENSEN, Joseph F</creatorcontrib><identifier>ISSN: 0018-9200</identifier><identifier>EISSN: 1558-173X</identifier><identifier>CODEN: IJSCBC</identifier><language>eng</language><publisher>New York, NY: Institute of Electrical and Electronics Engineers</publisher><subject>Amplifiers ; Applied sciences ; Circuit properties ; Design. Technologies. Operation analysis. Testing ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronics ; Exact sciences and technology ; Integrated circuits ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Transistors</subject><ispartof>IEEE journal of solid-state circuits, 2009, Vol.44 (10), p.2663-2670</ispartof><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,776,780,785,786,4036,4037,23909,23910,25118</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22157593$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>CHINGWEI LI, James</creatorcontrib><creatorcontrib>ELLIOTT, Kenneth R</creatorcontrib><creatorcontrib>MATTHEWS, David S</creatorcontrib><creatorcontrib>HITKO, Donald A</creatorcontrib><creatorcontrib>ZEHNDER, Daniel</creatorcontrib><creatorcontrib>ROYTER, Yakov</creatorcontrib><creatorcontrib>PATTERSON, Pamela R</creatorcontrib><creatorcontrib>HUSSAIN, Tahir</creatorcontrib><creatorcontrib>JENSEN, Joseph F</creatorcontrib><title>100 GHz+ Gain-B andwidth Differential Amplifiers in a Wafer Scale Heterogeneously Integrated Technology Using 250 nm InP DHBTs and 130 nm CMOS</title><title>IEEE journal of solid-state circuits</title><subject>Amplifiers</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Transistors</subject><issn>0018-9200</issn><issn>1558-173X</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNqNjc1Kw0AUhQdRMP68w924ksBM0qHp0rbauBCFptRduSR30pHJTZgZkfgQPrNRfABXh3POB9-JSJTWRarm-eupSKRURbrIpDwXFyG8TXU2K1QivpSUsCk_b2GDltMlIDcftolHWFtjyBNHiw7uusFZY8kHsAwIe5w-2NboCEqK5PuWmPr34EZ45Eitx0gNVFQfuXd9O8IuWG4h0xK4m5AXWJfLKvzoQOW_4-rpeXslzgy6QNd_eSluHu6rVZkOGCaZ8ci1DYfB2w79eMgyped6kef_5b4BJXVUsg</recordid><startdate>2009</startdate><enddate>2009</enddate><creator>CHINGWEI LI, James</creator><creator>ELLIOTT, Kenneth R</creator><creator>MATTHEWS, David S</creator><creator>HITKO, Donald A</creator><creator>ZEHNDER, Daniel</creator><creator>ROYTER, Yakov</creator><creator>PATTERSON, Pamela R</creator><creator>HUSSAIN, Tahir</creator><creator>JENSEN, Joseph F</creator><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope></search><sort><creationdate>2009</creationdate><title>100 GHz+ Gain-B andwidth Differential Amplifiers in a Wafer Scale Heterogeneously Integrated Technology Using 250 nm InP DHBTs and 130 nm CMOS</title><author>CHINGWEI LI, James ; ELLIOTT, Kenneth R ; MATTHEWS, David S ; HITKO, Donald A ; ZEHNDER, Daniel ; ROYTER, Yakov ; PATTERSON, Pamela R ; HUSSAIN, Tahir ; JENSEN, Joseph F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_221575933</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Amplifiers</topic><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>CHINGWEI LI, James</creatorcontrib><creatorcontrib>ELLIOTT, Kenneth R</creatorcontrib><creatorcontrib>MATTHEWS, David S</creatorcontrib><creatorcontrib>HITKO, Donald A</creatorcontrib><creatorcontrib>ZEHNDER, Daniel</creatorcontrib><creatorcontrib>ROYTER, Yakov</creatorcontrib><creatorcontrib>PATTERSON, Pamela R</creatorcontrib><creatorcontrib>HUSSAIN, Tahir</creatorcontrib><creatorcontrib>JENSEN, Joseph F</creatorcontrib><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>CHINGWEI LI, James</au><au>ELLIOTT, Kenneth R</au><au>MATTHEWS, David S</au><au>HITKO, Donald A</au><au>ZEHNDER, Daniel</au><au>ROYTER, Yakov</au><au>PATTERSON, Pamela R</au><au>HUSSAIN, Tahir</au><au>JENSEN, Joseph F</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>100 GHz+ Gain-B andwidth Differential Amplifiers in a Wafer Scale Heterogeneously Integrated Technology Using 250 nm InP DHBTs and 130 nm CMOS</atitle><btitle>IEEE journal of solid-state circuits</btitle><date>2009</date><risdate>2009</risdate><volume>44</volume><issue>10</issue><spage>2663</spage><epage>2670</epage><pages>2663-2670</pages><issn>0018-9200</issn><eissn>1558-173X</eissn><coden>IJSCBC</coden><cop>New York, NY</cop><pub>Institute of Electrical and Electronics Engineers</pub></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9200 |
ispartof | IEEE journal of solid-state circuits, 2009, Vol.44 (10), p.2663-2670 |
issn | 0018-9200 1558-173X |
language | eng |
recordid | cdi_pascalfrancis_primary_22157593 |
source | IEEE Electronic Library (IEL) |
subjects | Amplifiers Applied sciences Circuit properties Design. Technologies. Operation analysis. Testing Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transistors |
title | 100 GHz+ Gain-B andwidth Differential Amplifiers in a Wafer Scale Heterogeneously Integrated Technology Using 250 nm InP DHBTs and 130 nm CMOS |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T07%3A49%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=100%20GHz+%20Gain-B%20andwidth%20Differential%20Amplifiers%20in%20a%20Wafer%20Scale%20Heterogeneously%20Integrated%20Technology%20Using%20250%20nm%20InP%20DHBTs%20and%20130%20nm%20CMOS&rft.btitle=IEEE%20journal%20of%20solid-state%20circuits&rft.au=CHINGWEI%20LI,%20James&rft.date=2009&rft.volume=44&rft.issue=10&rft.spage=2663&rft.epage=2670&rft.pages=2663-2670&rft.issn=0018-9200&rft.eissn=1558-173X&rft.coden=IJSCBC&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E22157593%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |