A 5.75 to 44 Gb/s Quarter Rate CDR With Data Rate Selection in 90 nm Bulk CMOS: Special Issue on the 34TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE (ESSCIRC)
Gespeichert in:
Veröffentlicht in: | IEEE journal of solid-state circuits 2009, Vol.44 (7), p.1927-1941 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 1941 |
---|---|
container_issue | 7 |
container_start_page | 1927 |
container_title | IEEE journal of solid-state circuits |
container_volume | 44 |
creator | RODONI, Lucio VON BÜREN, George HUBER, Alex SCHMATZ, Martin JÄCKEL, Heinz |
description | |
format | Article |
fullrecord | <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_21975249</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>21975249</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_219752493</originalsourceid><addsrcrecordid>eNqNiksKwjAUAIMoWD93eBuX1aQmtFlq62ej4gd0J8-SYrSNkqQLb6-gB3A1zDANEjAhkpDF41OTBJSyJJQRpW3Sce72Uc4TFpD1BMQwFuAfwDksLiMH2xqtVxZ26BWk2Q6O2l8hQ4_ftFelyr1-GNAGJAVTwbQu75CuNvseaRVYOtX_sUsG89khXYZPdDmWhUWTa3d-Wl2hfZ0jJmMRcTn-93sDQQc8rQ</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>A 5.75 to 44 Gb/s Quarter Rate CDR With Data Rate Selection in 90 nm Bulk CMOS: Special Issue on the 34TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE (ESSCIRC)</title><source>IEEE/IET Electronic Library (IEL)</source><creator>RODONI, Lucio ; VON BÜREN, George ; HUBER, Alex ; SCHMATZ, Martin ; JÄCKEL, Heinz</creator><creatorcontrib>RODONI, Lucio ; VON BÜREN, George ; HUBER, Alex ; SCHMATZ, Martin ; JÄCKEL, Heinz</creatorcontrib><identifier>ISSN: 0018-9200</identifier><identifier>EISSN: 1558-173X</identifier><identifier>CODEN: IJSCBC</identifier><language>eng</language><publisher>New York, NY: Institute of Electrical and Electronics Engineers</publisher><subject>Applied sciences ; Circuit properties ; Circuits of signal characteristics conditioning (including delay circuits) ; Design. Technologies. Operation analysis. Testing ; Digital circuits ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronics ; Exact sciences and technology ; Integrated circuits ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>IEEE journal of solid-state circuits, 2009, Vol.44 (7), p.1927-1941</ispartof><rights>2009 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,4010</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21975249$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>RODONI, Lucio</creatorcontrib><creatorcontrib>VON BÜREN, George</creatorcontrib><creatorcontrib>HUBER, Alex</creatorcontrib><creatorcontrib>SCHMATZ, Martin</creatorcontrib><creatorcontrib>JÄCKEL, Heinz</creatorcontrib><title>A 5.75 to 44 Gb/s Quarter Rate CDR With Data Rate Selection in 90 nm Bulk CMOS: Special Issue on the 34TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE (ESSCIRC)</title><title>IEEE journal of solid-state circuits</title><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Circuits of signal characteristics conditioning (including delay circuits)</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Digital circuits</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>0018-9200</issn><issn>1558-173X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNqNiksKwjAUAIMoWD93eBuX1aQmtFlq62ej4gd0J8-SYrSNkqQLb6-gB3A1zDANEjAhkpDF41OTBJSyJJQRpW3Sce72Uc4TFpD1BMQwFuAfwDksLiMH2xqtVxZ26BWk2Q6O2l8hQ4_ftFelyr1-GNAGJAVTwbQu75CuNvseaRVYOtX_sUsG89khXYZPdDmWhUWTa3d-Wl2hfZ0jJmMRcTn-93sDQQc8rQ</recordid><startdate>2009</startdate><enddate>2009</enddate><creator>RODONI, Lucio</creator><creator>VON BÜREN, George</creator><creator>HUBER, Alex</creator><creator>SCHMATZ, Martin</creator><creator>JÄCKEL, Heinz</creator><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope></search><sort><creationdate>2009</creationdate><title>A 5.75 to 44 Gb/s Quarter Rate CDR With Data Rate Selection in 90 nm Bulk CMOS</title><author>RODONI, Lucio ; VON BÜREN, George ; HUBER, Alex ; SCHMATZ, Martin ; JÄCKEL, Heinz</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_219752493</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Circuits of signal characteristics conditioning (including delay circuits)</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Digital circuits</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>RODONI, Lucio</creatorcontrib><creatorcontrib>VON BÜREN, George</creatorcontrib><creatorcontrib>HUBER, Alex</creatorcontrib><creatorcontrib>SCHMATZ, Martin</creatorcontrib><creatorcontrib>JÄCKEL, Heinz</creatorcontrib><collection>Pascal-Francis</collection><jtitle>IEEE journal of solid-state circuits</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>RODONI, Lucio</au><au>VON BÜREN, George</au><au>HUBER, Alex</au><au>SCHMATZ, Martin</au><au>JÄCKEL, Heinz</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A 5.75 to 44 Gb/s Quarter Rate CDR With Data Rate Selection in 90 nm Bulk CMOS: Special Issue on the 34TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE (ESSCIRC)</atitle><jtitle>IEEE journal of solid-state circuits</jtitle><date>2009</date><risdate>2009</risdate><volume>44</volume><issue>7</issue><spage>1927</spage><epage>1941</epage><pages>1927-1941</pages><issn>0018-9200</issn><eissn>1558-173X</eissn><coden>IJSCBC</coden><cop>New York, NY</cop><pub>Institute of Electrical and Electronics Engineers</pub></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9200 |
ispartof | IEEE journal of solid-state circuits, 2009, Vol.44 (7), p.1927-1941 |
issn | 0018-9200 1558-173X |
language | eng |
recordid | cdi_pascalfrancis_primary_21975249 |
source | IEEE/IET Electronic Library (IEL) |
subjects | Applied sciences Circuit properties Circuits of signal characteristics conditioning (including delay circuits) Design. Technologies. Operation analysis. Testing Digital circuits Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
title | A 5.75 to 44 Gb/s Quarter Rate CDR With Data Rate Selection in 90 nm Bulk CMOS: Special Issue on the 34TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE (ESSCIRC) |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T18%3A35%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%205.75%20to%2044%20Gb/s%20Quarter%20Rate%20CDR%20With%20Data%20Rate%20Selection%20in%2090%20nm%20Bulk%20CMOS:%20Special%20Issue%20on%20the%2034TH%20EUROPEAN%20SOLID-STATE%20CIRCUITS%20CONFERENCE%20(ESSCIRC)&rft.jtitle=IEEE%20journal%20of%20solid-state%20circuits&rft.au=RODONI,%20Lucio&rft.date=2009&rft.volume=44&rft.issue=7&rft.spage=1927&rft.epage=1941&rft.pages=1927-1941&rft.issn=0018-9200&rft.eissn=1558-173X&rft.coden=IJSCBC&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E21975249%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |