Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons

CMOS operational amplifier transistors containing a single gate oxide short (GOS) fault between the source and drain were diagnosed from SPICE simulations of the supply current responses to ramp and sinusoidal test stimuli. Multilayer perceptron (MLP) artificial neural networks were trained to class...

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Veröffentlicht in:	IEEE transactions on computer-aided design of integrated circuits and systems 1997-08, Vol.16 (8), p.930-935
Hauptverfasser:	Yu, S., Jervis, B.W., Eckersall, K.R., Bell, I.M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Artificial neural networks Circuit faults Circuit testing Current supplies Diodes Electronics Exact sciences and technology Fault diagnosis Multilayer perceptrons Operational amplifiers Pins SPICE Testing, measurement, noise and reliability
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