Electron Optics Simulator: A Three-Dimensional Finite-Element Electron Gun and Collector Design Tool
This paper reports the development of a fully 3-D finite-element (FE) design tool for the design of electron guns and collectors called the electron optics simulator (EOS). It is a module of the microwave tube simulator suite (MTSS) developed by the University of Electronic Science and Technology of...
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Veröffentlicht in: | IEEE transactions on electron devices 2009-01, Vol.56 (1), p.140-148 |
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container_title | IEEE transactions on electron devices |
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creator | Huang, Tao Hu, Quan Yang, Zhong Hai Li, Bin Li, Jian Qing Jin, Xiao Lin Hu, Yu Lu Zhu, Xiao Fang Liao, Li Xiao, Li He, Guo Xian |
description | This paper reports the development of a fully 3-D finite-element (FE) design tool for the design of electron guns and collectors called the electron optics simulator (EOS). It is a module of the microwave tube simulator suite (MTSS) developed by the University of Electronic Science and Technology of China. EOS specifically targets problem classes including axisymmetric gun, gridded gun, multibeam gun, and multistage depressed collector. EOS is a steady-state trajectory code, which is a solver of electrostatic field and trajectory that takes into account secondary electrons, space-charge effects, and the external magnetic field. The simulator is dependent on the following two front-end features in MTSS: preprocessing that includes a solid modeling tool and a fully 3-D tetrahedral FE mesh automatic generator, and post processing for analysis and display of the results. A friendly interface is provided to design, test, optimize, and validate the electron optics systems. The aforementioned theoretical models are discussed in detail in this paper. In the end, some comparisons between simulation and experiment are presented. |
doi_str_mv | 10.1109/TED.2008.2008377 |
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It is a module of the microwave tube simulator suite (MTSS) developed by the University of Electronic Science and Technology of China. EOS specifically targets problem classes including axisymmetric gun, gridded gun, multibeam gun, and multistage depressed collector. EOS is a steady-state trajectory code, which is a solver of electrostatic field and trajectory that takes into account secondary electrons, space-charge effects, and the external magnetic field. The simulator is dependent on the following two front-end features in MTSS: preprocessing that includes a solid modeling tool and a fully 3-D tetrahedral FE mesh automatic generator, and post processing for analysis and display of the results. A friendly interface is provided to design, test, optimize, and validate the electron optics systems. The aforementioned theoretical models are discussed in detail in this paper. In the end, some comparisons between simulation and experiment are presented.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2008.2008377</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>3-D ; Accumulators ; Applied sciences ; Collectors ; Computational modeling ; Computer simulation ; Design engineering ; Earth Observing System ; Electron gun ; Electron optics ; electron optics simulator (EOS) ; Electronic tubes, masers ; Electronics ; Electrostatics ; Exact sciences and technology ; Finite element method ; finite-element method (FEM) ; Integrated circuit modeling ; microwave tube simulator suite (MTSS) ; multistage depressed collector (MDC) ; Object oriented modeling ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Simulation ; Solid modeling ; Studies ; Trajectory ; Vacuum microelectronics</subject><ispartof>IEEE transactions on electron devices, 2009-01, Vol.56 (1), p.140-148</ispartof><rights>2009 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c430t-fd196101c7fe173b222e6c56411395aa8cde0b5bca53ad921b5ba61f2d2d3f7a3</citedby><cites>FETCH-LOGICAL-c430t-fd196101c7fe173b222e6c56411395aa8cde0b5bca53ad921b5ba61f2d2d3f7a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4703267$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,4009,27902,27903,27904,54737</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4703267$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=20998248$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Huang, Tao</creatorcontrib><creatorcontrib>Hu, Quan</creatorcontrib><creatorcontrib>Yang, Zhong Hai</creatorcontrib><creatorcontrib>Li, Bin</creatorcontrib><creatorcontrib>Li, Jian Qing</creatorcontrib><creatorcontrib>Jin, Xiao Lin</creatorcontrib><creatorcontrib>Hu, Yu Lu</creatorcontrib><creatorcontrib>Zhu, Xiao Fang</creatorcontrib><creatorcontrib>Liao, Li</creatorcontrib><creatorcontrib>Xiao, Li</creatorcontrib><creatorcontrib>He, Guo Xian</creatorcontrib><title>Electron Optics Simulator: A Three-Dimensional Finite-Element Electron Gun and Collector Design Tool</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>This paper reports the development of a fully 3-D finite-element (FE) design tool for the design of electron guns and collectors called the electron optics simulator (EOS). It is a module of the microwave tube simulator suite (MTSS) developed by the University of Electronic Science and Technology of China. EOS specifically targets problem classes including axisymmetric gun, gridded gun, multibeam gun, and multistage depressed collector. EOS is a steady-state trajectory code, which is a solver of electrostatic field and trajectory that takes into account secondary electrons, space-charge effects, and the external magnetic field. The simulator is dependent on the following two front-end features in MTSS: preprocessing that includes a solid modeling tool and a fully 3-D tetrahedral FE mesh automatic generator, and post processing for analysis and display of the results. A friendly interface is provided to design, test, optimize, and validate the electron optics systems. The aforementioned theoretical models are discussed in detail in this paper. In the end, some comparisons between simulation and experiment are presented.</description><subject>3-D</subject><subject>Accumulators</subject><subject>Applied sciences</subject><subject>Collectors</subject><subject>Computational modeling</subject><subject>Computer simulation</subject><subject>Design engineering</subject><subject>Earth Observing System</subject><subject>Electron gun</subject><subject>Electron optics</subject><subject>electron optics simulator (EOS)</subject><subject>Electronic tubes, masers</subject><subject>Electronics</subject><subject>Electrostatics</subject><subject>Exact sciences and technology</subject><subject>Finite element method</subject><subject>finite-element method (FEM)</subject><subject>Integrated circuit modeling</subject><subject>microwave tube simulator suite (MTSS)</subject><subject>multistage depressed collector (MDC)</subject><subject>Object oriented modeling</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Simulation</subject><subject>Solid modeling</subject><subject>Studies</subject><subject>Trajectory</subject><subject>Vacuum microelectronics</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kb1v2zAQxYkiBeK43QN0IQqknZTyS6SYzfBHGiBAhrqzQFOnhAFNuqQ05L8PVRseOnTh8e5-7xHgQ-iakltKif6xXa9uGSHN34Mr9QHNaF2rSkshL9CMENpUmjf8El3l_FpaKQSboW7twQ4pBvx0GJzN-Jfbj94MMd3hBd6-JIBq5fYQsovBeLxxwQ1QFVWZDfisvh8DNqHDy-inUUx4Bdk9B7yN0X9CH3vjM3w-1Tn6vVlvlz-rx6f7h-XisbKCk6HqO6olJdSqHqjiO8YYSFtLQSnXtTGN7YDs6p01NTedZrTcjaQ961jHe2X4HH0_-h5S_DNCHtq9yxa8NwHimNtG6kYIwlUhv_2X5EJoXQtawK__gK9xTOUnilstNZNKTG7kCNkUc07Qt4fk9ia9tZS0UzptSaedgmlP6RTJzcnXZGt8n0ywLp91jGjdMNEU7suRcwBwXgtFeHmavwO9lJda</recordid><startdate>200901</startdate><enddate>200901</enddate><creator>Huang, Tao</creator><creator>Hu, Quan</creator><creator>Yang, Zhong Hai</creator><creator>Li, Bin</creator><creator>Li, Jian Qing</creator><creator>Jin, Xiao Lin</creator><creator>Hu, Yu Lu</creator><creator>Zhu, Xiao Fang</creator><creator>Liao, Li</creator><creator>Xiao, Li</creator><creator>He, Guo Xian</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Solid state devices</topic><topic>Simulation</topic><topic>Solid modeling</topic><topic>Studies</topic><topic>Trajectory</topic><topic>Vacuum microelectronics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Huang, Tao</creatorcontrib><creatorcontrib>Hu, Quan</creatorcontrib><creatorcontrib>Yang, Zhong Hai</creatorcontrib><creatorcontrib>Li, Bin</creatorcontrib><creatorcontrib>Li, Jian Qing</creatorcontrib><creatorcontrib>Jin, Xiao Lin</creatorcontrib><creatorcontrib>Hu, Yu Lu</creatorcontrib><creatorcontrib>Zhu, Xiao Fang</creatorcontrib><creatorcontrib>Liao, Li</creatorcontrib><creatorcontrib>Xiao, Li</creatorcontrib><creatorcontrib>He, Guo Xian</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Huang, Tao</au><au>Hu, Quan</au><au>Yang, Zhong Hai</au><au>Li, Bin</au><au>Li, Jian Qing</au><au>Jin, Xiao Lin</au><au>Hu, Yu Lu</au><au>Zhu, Xiao Fang</au><au>Liao, Li</au><au>Xiao, Li</au><au>He, Guo Xian</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron Optics Simulator: A Three-Dimensional Finite-Element Electron Gun and Collector Design Tool</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2009-01</date><risdate>2009</risdate><volume>56</volume><issue>1</issue><spage>140</spage><epage>148</epage><pages>140-148</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>This paper reports the development of a fully 3-D finite-element (FE) design tool for the design of electron guns and collectors called the electron optics simulator (EOS). It is a module of the microwave tube simulator suite (MTSS) developed by the University of Electronic Science and Technology of China. EOS specifically targets problem classes including axisymmetric gun, gridded gun, multibeam gun, and multistage depressed collector. EOS is a steady-state trajectory code, which is a solver of electrostatic field and trajectory that takes into account secondary electrons, space-charge effects, and the external magnetic field. The simulator is dependent on the following two front-end features in MTSS: preprocessing that includes a solid modeling tool and a fully 3-D tetrahedral FE mesh automatic generator, and post processing for analysis and display of the results. A friendly interface is provided to design, test, optimize, and validate the electron optics systems. The aforementioned theoretical models are discussed in detail in this paper. In the end, some comparisons between simulation and experiment are presented.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TED.2008.2008377</doi><tpages>9</tpages></addata></record> |
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subjects | 3-D Accumulators Applied sciences Collectors Computational modeling Computer simulation Design engineering Earth Observing System Electron gun Electron optics electron optics simulator (EOS) Electronic tubes, masers Electronics Electrostatics Exact sciences and technology Finite element method finite-element method (FEM) Integrated circuit modeling microwave tube simulator suite (MTSS) multistage depressed collector (MDC) Object oriented modeling Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Simulation Solid modeling Studies Trajectory Vacuum microelectronics |
title | Electron Optics Simulator: A Three-Dimensional Finite-Element Electron Gun and Collector Design Tool |
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