Far infrared spectroscopy of Pb0.85Sn0.15Te alloy doped with Ni
Far infrared reflectivity spectra of single crystal Pb Sn Te doped with Ni were measured in the temperature range between 10 K and 300 K. Analysis of the experimental spectra was made using a fitting procedure based on the modified model of plasmon-phonon interactions and the optical parameters were...
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Veröffentlicht in: | International journal of materials research 2008-12, Vol.99 (12), p.1393-1396 |
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container_title | International journal of materials research |
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creator | Nikolić, Pantelija M. Vujatović, Stevan S. Golić, Danijela Lukovic Labus, Nebojša J. Paraskevopoulos, Konstantinos M. Zorbas, Kostas T. Nikolić, Maria Vesna Bojičić, Aleksandar Blagojević, Vladimir König, Wolfgang |
description | Far infrared reflectivity spectra of single crystal Pb
Sn
Te doped with Ni were measured in the temperature range between 10 K and 300 K. Analysis of the experimental spectra was made using a fitting procedure based on the modified model of plasmon-phonon interactions and the optical parameters were calculated. Two local modes were observed and their origin was discussed. |
doi_str_mv | 10.3139/146.101772 |
format | Article |
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Sn
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Sn
Te doped with Ni were measured in the temperature range between 10 K and 300 K. Analysis of the experimental spectra was made using a fitting procedure based on the modified model of plasmon-phonon interactions and the optical parameters were calculated. Two local modes were observed and their origin was discussed.</description><subject>Applied sciences</subject><subject>Exact sciences and technology</subject><subject>Far infrared reflectivity</subject><subject>Impurity in semiconductors</subject><subject>Metals. Metallurgy</subject><subject>PbSnTe</subject><issn>1862-5282</issn><issn>2195-8556</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNotkE1LxDAURYMoOI5u_AXZuGzNS5o0cSMyOCoMKjiuQ76qHWpbkg5D_72RcXUfl8PjchC6BlIyYOoWKlECgbqmJ2hBQfFCci5O0QKkoAWnkp6ji5R2hHAQNV2g-7WJuO2baGLwOI3BTXFIbhhnPDT43ZJS8o-elMC3AZuuG2bshzGjh3b6xq_tJTprTJfC1X8u0ef6cbt6LjZvTy-rh00xMiKmQoLwlTMyNNJb5mjlrOI0WA7MMB-UMOCcBaNsRZkHqRpmVMUbT8BxYwNbopvj39EkZ7q8t3dt0mNsf0ycNSVKCkFl5u6O3MF0U4g-fMX9nA-9G_axzws1EP2nSmdV-qhKKaC5YewX1cBcGQ</recordid><startdate>20081201</startdate><enddate>20081201</enddate><creator>Nikolić, Pantelija M.</creator><creator>Vujatović, Stevan S.</creator><creator>Golić, Danijela Lukovic</creator><creator>Labus, Nebojša J.</creator><creator>Paraskevopoulos, Konstantinos M.</creator><creator>Zorbas, Kostas T.</creator><creator>Nikolić, Maria Vesna</creator><creator>Bojičić, Aleksandar</creator><creator>Blagojević, Vladimir</creator><creator>König, Wolfgang</creator><general>De Gruyter</general><general>Hanser</general><scope>IQODW</scope></search><sort><creationdate>20081201</creationdate><title>Far infrared spectroscopy of Pb0.85Sn0.15Te alloy doped with Ni</title><author>Nikolić, Pantelija M. ; Vujatović, Stevan S. ; Golić, Danijela Lukovic ; Labus, Nebojša J. ; Paraskevopoulos, Konstantinos M. ; Zorbas, Kostas T. ; Nikolić, Maria Vesna ; Bojičić, Aleksandar ; Blagojević, Vladimir ; König, Wolfgang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p306t-816d4ca8ef8db3c24cb952eb513a3de96a1ccb1a9b423d189f3a945fd01c5abe3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Applied sciences</topic><topic>Exact sciences and technology</topic><topic>Far infrared reflectivity</topic><topic>Impurity in semiconductors</topic><topic>Metals. Metallurgy</topic><topic>PbSnTe</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nikolić, Pantelija M.</creatorcontrib><creatorcontrib>Vujatović, Stevan S.</creatorcontrib><creatorcontrib>Golić, Danijela Lukovic</creatorcontrib><creatorcontrib>Labus, Nebojša J.</creatorcontrib><creatorcontrib>Paraskevopoulos, Konstantinos M.</creatorcontrib><creatorcontrib>Zorbas, Kostas T.</creatorcontrib><creatorcontrib>Nikolić, Maria Vesna</creatorcontrib><creatorcontrib>Bojičić, Aleksandar</creatorcontrib><creatorcontrib>Blagojević, Vladimir</creatorcontrib><creatorcontrib>König, Wolfgang</creatorcontrib><collection>Pascal-Francis</collection><jtitle>International journal of materials research</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nikolić, Pantelija M.</au><au>Vujatović, Stevan S.</au><au>Golić, Danijela Lukovic</au><au>Labus, Nebojša J.</au><au>Paraskevopoulos, Konstantinos M.</au><au>Zorbas, Kostas T.</au><au>Nikolić, Maria Vesna</au><au>Bojičić, Aleksandar</au><au>Blagojević, Vladimir</au><au>König, Wolfgang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Far infrared spectroscopy of Pb0.85Sn0.15Te alloy doped with Ni</atitle><jtitle>International journal of materials research</jtitle><date>2008-12-01</date><risdate>2008</risdate><volume>99</volume><issue>12</issue><spage>1393</spage><epage>1396</epage><pages>1393-1396</pages><issn>1862-5282</issn><eissn>2195-8556</eissn><abstract>Far infrared reflectivity spectra of single crystal Pb
Sn
Te doped with Ni were measured in the temperature range between 10 K and 300 K. Analysis of the experimental spectra was made using a fitting procedure based on the modified model of plasmon-phonon interactions and the optical parameters were calculated. Two local modes were observed and their origin was discussed.</abstract><cop>Munich</cop><pub>De Gruyter</pub><doi>10.3139/146.101772</doi><tpages>4</tpages></addata></record> |
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subjects | Applied sciences Exact sciences and technology Far infrared reflectivity Impurity in semiconductors Metals. Metallurgy PbSnTe |
title | Far infrared spectroscopy of Pb0.85Sn0.15Te alloy doped with Ni |
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