Comparison of electrodeposited and sputtered intrinsic and aluminium-doped zinc oxide thin films
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| Veröffentlicht in: | Semiconductor science and technology 2008-12, Vol.23 (12), p.125003 |
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| container_issue | 12 |
| container_start_page | 125003 |
| container_title | Semiconductor science and technology |
| container_volume | 23 |
| creator | Wellings, J S Samantilleke, A P Warren, P Heavens, S N Dharmadasa, I M |
| description | |
| doi_str_mv | 10.1088/0268-1242/23/12/125003 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0268-1242 |
| ispartof | Semiconductor science and technology, 2008-12, Vol.23 (12), p.125003 |
| issn | 0268-1242 1361-6641 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_20939160 |
| source | Institute of Physics Journals |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Electrical properties of specific thin films Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Ii-vi semiconductors Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics |
| title | Comparison of electrodeposited and sputtered intrinsic and aluminium-doped zinc oxide thin films |
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