Monolithic Rectangular Coaxial Lines and Resonators With Embedded Dielectric Support
Monolithic rectangular coaxial lines and related transmission line resonators with dielectric support embedded within the body of the inner conductor are demonstrated in this letter. Effects of dielectric straps are thoroughly studied and conclusions are verified through simulations and experiments....
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| Veröffentlicht in: | IEEE microwave and wireless components letters 2008-11, Vol.18 (11), p.740-742 |
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| container_end_page | 742 |
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| container_issue | 11 |
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| container_title | IEEE microwave and wireless components letters |
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| creator | Filipovic, D.S. Lukic, M.V. Yongjae Lee Fontaine, D.L. |
| description | Monolithic rectangular coaxial lines and related transmission line resonators with dielectric support embedded within the body of the inner conductor are demonstrated in this letter. Effects of dielectric straps are thoroughly studied and conclusions are verified through simulations and experiments. A very low-loss of below 0.1 dB/cm and unloaded Q -factors around 400 are measured at Ka-band. It is shown that the high-end performance is maintained for different components distributed across a 6 '' wafer. |
| doi_str_mv | 10.1109/LMWC.2008.2005228 |
| format | Article |
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Effects of dielectric straps are thoroughly studied and conclusions are verified through simulations and experiments. A very low-loss of below 0.1 dB/cm and unloaded Q -factors around 400 are measured at Ka-band. It is shown that the high-end performance is maintained for different components distributed across a 6 '' wafer.</description><identifier>ISSN: 1531-1309</identifier><identifier>ISSN: 2771-957X</identifier><identifier>EISSN: 1558-1764</identifier><identifier>EISSN: 2771-9588</identifier><identifier>DOI: 10.1109/LMWC.2008.2005228</identifier><identifier>CODEN: IMWCBJ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Attenuation constant ; Circuit properties ; Coaxial components ; Conductors ; Design. Technologies. Operation analysis. Testing ; Dielectric measurements ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronics ; Exact sciences and technology ; Integrated circuits ; Micromachining ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; Nickel ; Oscillators, resonators, synthetizers ; Propagation losses ; Scanning electron microscopy ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Stability ; Transmission line measurements ; transmission line resonators ; Transmission lines ; unloaded Q -factor</subject><ispartof>IEEE microwave and wireless components letters, 2008-11, Vol.18 (11), p.740-742</ispartof><rights>2008 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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Effects of dielectric straps are thoroughly studied and conclusions are verified through simulations and experiments. A very low-loss of below 0.1 dB/cm and unloaded Q -factors around 400 are measured at Ka-band. It is shown that the high-end performance is maintained for different components distributed across a 6 '' wafer.</description><subject>Applied sciences</subject><subject>Attenuation constant</subject><subject>Circuit properties</subject><subject>Coaxial components</subject><subject>Conductors</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Dielectric measurements</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>Micromachining</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>Nickel</subject><subject>Oscillators, resonators, synthetizers</subject><subject>Propagation losses</subject><subject>Scanning electron microscopy</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Stability</subject><subject>Transmission line measurements</subject><subject>transmission line resonators</subject><subject>Transmission lines</subject><subject>unloaded Q -factor</subject><issn>1531-1309</issn><issn>2771-957X</issn><issn>1558-1764</issn><issn>2771-9588</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1Lw0AQhoMoWKs_QLwEQW-p-53NUWr9gBRBKz0u281Et6TZupuA_ns3tPTgZWaYed6X4U2SS4wmGKPirpwvpxOCkBwKJ0QeJSPMucxwLtjxMFOcYYqK0-QshDVCmEmGR8li7lrX2O7LmvQNTKfbz77RPp06_WN1k5a2hZDqtorX4FrdOR_SZeTT2WYFVQVV-mChiUofHd777db57jw5qXUT4GLfx8nH42wxfc7K16eX6X2ZGcppl9WkZgXHHCPCgeqVgLyqkKiEEbAyGjOUi1wTopmEPO4KbLBYMR4fl6aSBR0ntzvfrXffPYRObWww0DS6BdcHRRmP1hxF8PofuHa9b-NvSgrKClQUeYTwDjLeheChVltvN9r_KozUELIaQlZDyGofctTc7I11MLqpvW6NDQchQZILSVjkrnacBYDDmQkhcibpHy7AhKA</recordid><startdate>20081101</startdate><enddate>20081101</enddate><creator>Filipovic, D.S.</creator><creator>Lukic, M.V.</creator><creator>Yongjae Lee</creator><creator>Fontaine, D.L.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Testing</topic><topic>Dielectric measurements</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>Micromachining</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>Nickel</topic><topic>Oscillators, resonators, synthetizers</topic><topic>Propagation losses</topic><topic>Scanning electron microscopy</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Stability</topic><topic>Transmission line measurements</topic><topic>transmission line resonators</topic><topic>Transmission lines</topic><topic>unloaded Q -factor</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Filipovic, D.S.</creatorcontrib><creatorcontrib>Lukic, M.V.</creatorcontrib><creatorcontrib>Yongjae Lee</creatorcontrib><creatorcontrib>Fontaine, D.L.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE/IET Electronic Library</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE microwave and wireless components letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Filipovic, D.S.</au><au>Lukic, M.V.</au><au>Yongjae Lee</au><au>Fontaine, D.L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Monolithic Rectangular Coaxial Lines and Resonators With Embedded Dielectric Support</atitle><jtitle>IEEE microwave and wireless components letters</jtitle><stitle>LMWC</stitle><date>2008-11-01</date><risdate>2008</risdate><volume>18</volume><issue>11</issue><spage>740</spage><epage>742</epage><pages>740-742</pages><issn>1531-1309</issn><issn>2771-957X</issn><eissn>1558-1764</eissn><eissn>2771-9588</eissn><coden>IMWCBJ</coden><abstract>Monolithic rectangular coaxial lines and related transmission line resonators with dielectric support embedded within the body of the inner conductor are demonstrated in this letter. Effects of dielectric straps are thoroughly studied and conclusions are verified through simulations and experiments. A very low-loss of below 0.1 dB/cm and unloaded Q -factors around 400 are measured at Ka-band. It is shown that the high-end performance is maintained for different components distributed across a 6 '' wafer.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/LMWC.2008.2005228</doi><tpages>3</tpages></addata></record> |
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| ispartof | IEEE microwave and wireless components letters, 2008-11, Vol.18 (11), p.740-742 |
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| language | eng |
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| source | IEEE/IET Electronic Library |
| subjects | Applied sciences Attenuation constant Circuit properties Coaxial components Conductors Design. Technologies. Operation analysis. Testing Dielectric measurements Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Integrated circuits Micromachining Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits Nickel Oscillators, resonators, synthetizers Propagation losses Scanning electron microscopy Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Stability Transmission line measurements transmission line resonators Transmission lines unloaded Q -factor |
| title | Monolithic Rectangular Coaxial Lines and Resonators With Embedded Dielectric Support |
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