Effect of film thickness on ferroelectric properties of sol-gel-derived Pb(Ti, Al)O3 thin films
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Veröffentlicht in: | Japanese journal of applied physics 1997, Vol.36 (9B), p.5829-5833 |
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container_issue | 9B |
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container_title | Japanese journal of applied physics |
container_volume | 36 |
creator | IIJIMA, T KUDO, S SANADA, N |
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doi_str_mv | 10.1143/jjap.36.5829 |
format | Article |
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identifier | ISSN: 0021-4922 |
ispartof | Japanese journal of applied physics, 1997, Vol.36 (9B), p.5829-5833 |
issn | 0021-4922 1347-4065 |
language | eng |
recordid | cdi_pascalfrancis_primary_2060215 |
source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric thin films Dielectrics, piezoelectrics, and ferroelectrics and their properties Domain structure hysteresis Exact sciences and technology Ferroelectricity and antiferroelectricity Physics |
title | Effect of film thickness on ferroelectric properties of sol-gel-derived Pb(Ti, Al)O3 thin films |
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