$Accurate Estimation of Low ( ≪ \hbox^\ \Omega \cdot \hbox^) Values of Specific Contact Resistivity$

Accurate Estimation of Low ( ≪ \hbox^\ \Omega \cdot \hbox^) Values of Specific Contact Resistivity

Advancements in nanotechnology have created the need for efficient means of communication of electrical signals to nanostructures, which can be addressed using low resistance contacts. In order to study and estimate the resistance of such contacts or the resistance posed by the interface(s) in such...

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Veröffentlicht in:	IEEE electron device letters 2008-03, Vol.29 (3), p.259-261
Hauptverfasser:	Bhaskaran, M., Sriram, S., Holland, A.S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Conductivity Contact Contact resistance cross Kelvin resistor (CKR) Devices Electric contacts Electric resistance Electrical resistance measurement Electrical resistivity Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Estimating Exact sciences and technology Interfaces Kelvin Nanostructure Nanostructures Nanotechnology Resistors Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices specific contact resistivity (SCR) Studies Testing Testing, measurement, noise and reliability Thyristors Ultrasonic testing
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