Investigation of phonons in HgCdTe using Raman scattering and far-infrared reflectivity

Investigation of phonons in HgCdTe using Raman scattering and far-infrared reflectivity

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Hauptverfasser: AMIRTHARAJ, P. M, DHAR, N. K, BAARS, J, SEELEWIND, H
Format: Tagungsbericht
Sprache:eng
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Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Physics
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creator AMIRTHARAJ, P. M
DHAR, N. K
BAARS, J
SEELEWIND, H
description
doi_str_mv 10.1088/0268-1242/5/3S/015
format Conference Proceeding
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identifier ISSN: 0268-1242
ispartof Semiconductor science and technology, 1990, Vol.5 (3S), p.S68-S72
issn 0268-1242
1361-6641
language eng
recordid cdi_pascalfrancis_primary_19380843
source IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link
subjects Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Physics
title Investigation of phonons in HgCdTe using Raman scattering and far-infrared reflectivity
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