Performance Consideration of MOS and Junction Diodes for Varactor Application

The engineering and tradeoffs for quality factor, capacitance tuning ratio, capacitance mismatch, and low- frequency noise for different varactor device structures, geometry sizes, and operations have been compared to provide a comprehensive guideline of an optimized structure for the advanced radio...

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Veröffentlicht in:	IEEE transactions on electron devices 2007-09, Vol.54 (9), p.2570-2573
Hauptverfasser:	CHAN, Yi-Jen, HUANG, Chi-Feng, WU, Chun-Chieh, CHEN, Chun-Hon, CHAO, Chih-Ping
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Capacitance Capacitors Circuit properties CMOS Compound structure devices Design. Technologies. Operation analysis. Testing Devices Diodes Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Guidelines Integrated circuits Junctions Logic gates Metal oxide semiconductors Noise Oscillators, resonators, synthetizers Q -factor Quality factor Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Tuning tuning ratio varactor Varactors
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