Modeling of Vortex Paths in HTS
A random walk model of the vortex paths in high temperature superconductors is investigated for different relative densities of c-axis, ab-plane and point pinning defects. The model suggests an origin for some of the more unusual features seen in the field angle dependence of the critical current. I...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2007-06, Vol.17 (2), p.3684-3687 |
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| container_end_page | 3687 |
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| container_title | IEEE transactions on applied superconductivity |
| container_volume | 17 |
| creator | Long, N.J. Strickland, N.M. Talantsev, E.F. |
| description | A random walk model of the vortex paths in high temperature superconductors is investigated for different relative densities of c-axis, ab-plane and point pinning defects. The model suggests an origin for some of the more unusual features seen in the field angle dependence of the critical current. It also predicts greater noise in critical currents for fields parallel to the plane of the dominant pinning defects and anomalous behavior of n-values. The random walk model also suggests an alternative form for the expected field angle dependence of the upper critical fields in disordered layered superconductors. |
| doi_str_mv | 10.1109/TASC.2007.899119 |
| format | Article |
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The model suggests an origin for some of the more unusual features seen in the field angle dependence of the critical current. It also predicts greater noise in critical currents for fields parallel to the plane of the dominant pinning defects and anomalous behavior of n-values. The random walk model also suggests an alternative form for the expected field angle dependence of the upper critical fields in disordered layered superconductors.</description><subject>Anisotropic magnetoresistance</subject><subject>Applied sciences</subject><subject>Critical current</subject><subject>Critical currents</subject><subject>critical fields</subject><subject>Defects</subject><subject>Density</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electronics</subject><subject>Equations</subject><subject>Exact sciences and technology</subject><subject>Fluctuations</subject><subject>Fluid flow</subject><subject>High temperature superconductors</subject><subject>Materials</subject><subject>Mathematical models</subject><subject>Physics</subject><subject>Pinning</subject><subject>Probability distribution</subject><subject>Random walk</subject><subject>Shape</subject><subject>Statistical distributions</subject><subject>Superconducting device noise</subject><subject>Superconductivity</subject><subject>Vortices</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkNFLwzAQh4MoOKfvgg8WQXzqzCVNc3kcQ50wUdj0NaRtoh1dO5MO9L-3pUPBpzu47_fj-Ag5BzoBoOp2NV3OJoxSOUGlANQBGYEQGDMB4rDbqYAYGePH5CSENaWQYCJG5PKpKWxV1u9R46K3xrf2K3ox7UeIyjqar5an5MiZKtiz_RyT1_u71WweL54fHmfTRZxzpdo4y1SCPGUiRSkAmDSFYSbLiwxNKpVLCuCQMivB5qA4COkkOmtkgQIdzfmY3Ay9W9987mxo9aYMua0qU9tmFzSi4hIxpR159Y9cNztfd89pBYwxirSH6ADlvgnBW6e3vtwY_62B6t6X7n3p3pcefHWR632vCbmpnDd1Xoa_nKIggSYddzFwpbX295wwiYCc_wBV8m_Z</recordid><startdate>20070601</startdate><enddate>20070601</enddate><creator>Long, N.J.</creator><creator>Strickland, N.M.</creator><creator>Talantsev, E.F.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Electrical power engineering</topic><topic>Electronics</topic><topic>Equations</topic><topic>Exact sciences and technology</topic><topic>Fluctuations</topic><topic>Fluid flow</topic><topic>High temperature superconductors</topic><topic>Materials</topic><topic>Mathematical models</topic><topic>Physics</topic><topic>Pinning</topic><topic>Probability distribution</topic><topic>Random walk</topic><topic>Shape</topic><topic>Statistical distributions</topic><topic>Superconducting device noise</topic><topic>Superconductivity</topic><topic>Vortices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Long, N.J.</creatorcontrib><creatorcontrib>Strickland, N.M.</creatorcontrib><creatorcontrib>Talantsev, E.F.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Long, N.J.</au><au>Strickland, N.M.</au><au>Talantsev, E.F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modeling of Vortex Paths in HTS</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>2007-06-01</date><risdate>2007</risdate><volume>17</volume><issue>2</issue><spage>3684</spage><epage>3687</epage><pages>3684-3687</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>A random walk model of the vortex paths in high temperature superconductors is investigated for different relative densities of c-axis, ab-plane and point pinning defects. The model suggests an origin for some of the more unusual features seen in the field angle dependence of the critical current. It also predicts greater noise in critical currents for fields parallel to the plane of the dominant pinning defects and anomalous behavior of n-values. The random walk model also suggests an alternative form for the expected field angle dependence of the upper critical fields in disordered layered superconductors.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TASC.2007.899119</doi><tpages>4</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Anisotropic magnetoresistance Applied sciences Critical current Critical currents critical fields Defects Density Electrical engineering. Electrical power engineering Electronics Equations Exact sciences and technology Fluctuations Fluid flow High temperature superconductors Materials Mathematical models Physics Pinning Probability distribution Random walk Shape Statistical distributions Superconducting device noise Superconductivity Vortices |
| title | Modeling of Vortex Paths in HTS |
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