Diagnosis of scan cells in BIST environment

Diagnosis of scan cells in BIST environment

The paper presents a new fault diagnosis technique for scan-based designs with BIST. It can be used for nonadaptive identification of the scan cells that are driven by erroneous signals. The proposed scheme employs a pseudorandom scan cell selection routine which, in conjunction with a conventional...

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Veröffentlicht in:IEEE transactions on computers 1999, Vol.48 (7), p.724-731
Hauptverfasser: Rajski, J., Tyszer, J.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Built-in self-test
Circuit faults
Circuit testing
Compaction
Design engineering
Design. Technologies. Operation analysis. Testing
Diagnosis
Diagnostic software
Electronics
Exact sciences and technology
Failure analysis
Fault diagnosis
Flip-flops
Hardware
Integrated circuits
Logic devices
Logic testing
Pseudorandom
Reasoning
Routines
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Tradeoffs
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Beschreibung
Zusammenfassung:The paper presents a new fault diagnosis technique for scan-based designs with BIST. It can be used for nonadaptive identification of the scan cells that are driven by erroneous signals. The proposed scheme employs a pseudorandom scan cell selection routine which, in conjunction with a conventional signature analysis and simple reasoning procedure, allows flexible trade-offs between the test application time and the diagnostic resolution.
ISSN:0018-9340
1557-9956
DOI:10.1109/12.780879