The influence of ion bombardment intensity during deposition on nickel films microstructure

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: POPOVIC, N, BOGDANOV, Z, GONCIC, B, ZEC, S, RAKOCEVIC, Z
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 80
container_issue
container_start_page 75
container_title
container_volume 343-4
creator POPOVIC, N
BOGDANOV, Z
GONCIC, B
ZEC, S
RAKOCEVIC, Z
description
format Conference Proceeding
fullrecord <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_1868579</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1868579</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_18685793</originalsourceid><addsrcrecordid>eNqNiskKwjAURYMoWId_yMJtIW21w1oUP6A7FyVNX_RphpJh0b-3gh8gHLgc7lmQJKurJs2rIluShLEjS0vWsDXZeP9ijGV5XiTk3j6BopEqghFAraRoDe2t7rkbNJgwnwGMxzDRITo0DzrAaGf_djMGxRsUlai0pxqFsz64KEJ0sCMryZWH_W-35HC9tOdbOnIvuJKOG4G-Gx1q7qYuq8v6VDXFn9kHrXBHLA</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>The influence of ion bombardment intensity during deposition on nickel films microstructure</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>POPOVIC, N ; BOGDANOV, Z ; GONCIC, B ; ZEC, S ; RAKOCEVIC, Z</creator><creatorcontrib>POPOVIC, N ; BOGDANOV, Z ; GONCIC, B ; ZEC, S ; RAKOCEVIC, Z</creatorcontrib><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Lausanne: Elsevier Science</publisher><subject>Applied sciences ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Ion and electron beam-assisted deposition; ion plating ; Materials science ; Metals. Metallurgy ; Methods of deposition of films and coatings; film growth and epitaxy ; Physics ; Structure and morphology; thickness ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology</subject><ispartof>Thin solid films, 1999, Vol.343-4, p.75-80</ispartof><rights>1999 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,780,784,789,790,4040,4041,23921,23922,25131</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=1868579$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>POPOVIC, N</creatorcontrib><creatorcontrib>BOGDANOV, Z</creatorcontrib><creatorcontrib>GONCIC, B</creatorcontrib><creatorcontrib>ZEC, S</creatorcontrib><creatorcontrib>RAKOCEVIC, Z</creatorcontrib><title>The influence of ion bombardment intensity during deposition on nickel films microstructure</title><title>Thin solid films</title><subject>Applied sciences</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Ion and electron beam-assisted deposition; ion plating</subject><subject>Materials science</subject><subject>Metals. Metallurgy</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Physics</subject><subject>Structure and morphology; thickness</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1999</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNqNiskKwjAURYMoWId_yMJtIW21w1oUP6A7FyVNX_RphpJh0b-3gh8gHLgc7lmQJKurJs2rIluShLEjS0vWsDXZeP9ijGV5XiTk3j6BopEqghFAraRoDe2t7rkbNJgwnwGMxzDRITo0DzrAaGf_djMGxRsUlai0pxqFsz64KEJ0sCMryZWH_W-35HC9tOdbOnIvuJKOG4G-Gx1q7qYuq8v6VDXFn9kHrXBHLA</recordid><startdate>1999</startdate><enddate>1999</enddate><creator>POPOVIC, N</creator><creator>BOGDANOV, Z</creator><creator>GONCIC, B</creator><creator>ZEC, S</creator><creator>RAKOCEVIC, Z</creator><general>Elsevier Science</general><scope>IQODW</scope></search><sort><creationdate>1999</creationdate><title>The influence of ion bombardment intensity during deposition on nickel films microstructure</title><author>POPOVIC, N ; BOGDANOV, Z ; GONCIC, B ; ZEC, S ; RAKOCEVIC, Z</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_18685793</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Applied sciences</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Ion and electron beam-assisted deposition; ion plating</topic><topic>Materials science</topic><topic>Metals. Metallurgy</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Physics</topic><topic>Structure and morphology; thickness</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>POPOVIC, N</creatorcontrib><creatorcontrib>BOGDANOV, Z</creatorcontrib><creatorcontrib>GONCIC, B</creatorcontrib><creatorcontrib>ZEC, S</creatorcontrib><creatorcontrib>RAKOCEVIC, Z</creatorcontrib><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>POPOVIC, N</au><au>BOGDANOV, Z</au><au>GONCIC, B</au><au>ZEC, S</au><au>RAKOCEVIC, Z</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The influence of ion bombardment intensity during deposition on nickel films microstructure</atitle><btitle>Thin solid films</btitle><date>1999</date><risdate>1999</risdate><volume>343-4</volume><spage>75</spage><epage>80</epage><pages>75-80</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><cop>Lausanne</cop><pub>Elsevier Science</pub></addata></record>
fulltext fulltext
identifier ISSN: 0040-6090
ispartof Thin solid films, 1999, Vol.343-4, p.75-80
issn 0040-6090
1879-2731
language eng
recordid cdi_pascalfrancis_primary_1868579
source ScienceDirect Journals (5 years ago - present)
subjects Applied sciences
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Ion and electron beam-assisted deposition
ion plating
Materials science
Metals. Metallurgy
Methods of deposition of films and coatings
film growth and epitaxy
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
title The influence of ion bombardment intensity during deposition on nickel films microstructure
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T04%3A11%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=The%20influence%20of%20ion%20bombardment%20intensity%20during%20deposition%20on%20nickel%20films%20microstructure&rft.btitle=Thin%20solid%20films&rft.au=POPOVIC,%20N&rft.date=1999&rft.volume=343-4&rft.spage=75&rft.epage=80&rft.pages=75-80&rft.issn=0040-6090&rft.eissn=1879-2731&rft.coden=THSFAP&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E1868579%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true