Defect coverage analysis of partitioned testing
Research in improving test quality has focused on identifying better fault models and coverage metrics and tools to achieve high coverage. The test generation and test application methodology is usually not considered. We attempt to understand the implication of a test generation and test applicatio...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 915 |
|---|---|
| container_issue | |
| container_start_page | 907 |
| container_title | |
| container_volume | |
| creator | Chakravarty, S. Savage, E.W. Tran, E.N. |
| description | Research in improving test quality has focused on identifying better fault models and coverage metrics and tools to achieve high coverage. The test generation and test application methodology is usually not considered. We attempt to understand the implication of a test generation and test application methodology, viz, partitioned testing, on product quality. In partitioned testing, patterns are applied to one part of the design while the other parts are maintained in a quiescent state. Quantitative data on several aspects of partitioned testing, using some industrial test cases, are presented. It highlights the need for generating patterns using different partition sizes, generating longer test sequences and the need to include functional testing in the test suite. In addition, we argue that a different metric is needed to evaluate functional pattern quality to cover the gaps identified. |
| doi_str_mv | 10.1109/TEST.2004.1387355 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>pascalfrancis_6IE</sourceid><recordid>TN_cdi_pascalfrancis_primary_18631440</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1387355</ieee_id><sourcerecordid>18631440</sourcerecordid><originalsourceid>FETCH-LOGICAL-i205t-68581372b1c2eff9f44e4d26908af5f647633751529ff754f43fe6f77f4ad1df3</originalsourceid><addsrcrecordid>eNpFj09Lw0AUxBdEUGs_gHjJxWPSt_83R6m1CgUPxnNZk_fKSkzC7iL02xuI4FzmMD9mGMbuOFScQ71pdu9NJQBUxaWzUusLdgPWgXTagbhi65S-YJasjTH6mm2ekLDNRTv-YPQnLPzg-3MKqRipmHzMIYdxwK7ImHIYTrfsknyfcP3nK_bxvGu2L-Xhbf-6fTyUQYDOpZnnuLTik7cCiWpSClUnTA3OkyajrJHSaq5FTWS1IiUJDVlLyne8I7liD0vv5FPre4p-aEM6TjF8-3g-cmckVwpm7n7hAiL-x8t3-QvoN04l</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Defect coverage analysis of partitioned testing</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Chakravarty, S. ; Savage, E.W. ; Tran, E.N.</creator><creatorcontrib>Chakravarty, S. ; Savage, E.W. ; Tran, E.N.</creatorcontrib><description>Research in improving test quality has focused on identifying better fault models and coverage metrics and tools to achieve high coverage. The test generation and test application methodology is usually not considered. We attempt to understand the implication of a test generation and test application methodology, viz, partitioned testing, on product quality. In partitioned testing, patterns are applied to one part of the design while the other parts are maintained in a quiescent state. Quantitative data on several aspects of partitioned testing, using some industrial test cases, are presented. It highlights the need for generating patterns using different partition sizes, generating longer test sequences and the need to include functional testing in the test suite. In addition, we argue that a different metric is needed to evaluate functional pattern quality to cover the gaps identified.</description><identifier>ISBN: 0780385802</identifier><identifier>ISBN: 9780780385801</identifier><identifier>DOI: 10.1109/TEST.2004.1387355</identifier><language>eng</language><publisher>Piscataway NJ: IEEE</publisher><subject>Applied sciences ; Built-in self-test ; Design methodology ; Distributed control ; Electronics ; Exact sciences and technology ; Fault diagnosis ; Logic design ; Logic testing ; Signal design ; Test pattern generators ; Testing, measurement, noise and reliability</subject><ispartof>2004 International Conferce on Test, 2004, p.907-915</ispartof><rights>2007 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1387355$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>310,311,781,785,790,791,2059,4051,4052,27927,54922</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1387355$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18631440$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Chakravarty, S.</creatorcontrib><creatorcontrib>Savage, E.W.</creatorcontrib><creatorcontrib>Tran, E.N.</creatorcontrib><title>Defect coverage analysis of partitioned testing</title><title>2004 International Conferce on Test</title><addtitle>TEST</addtitle><description>Research in improving test quality has focused on identifying better fault models and coverage metrics and tools to achieve high coverage. The test generation and test application methodology is usually not considered. We attempt to understand the implication of a test generation and test application methodology, viz, partitioned testing, on product quality. In partitioned testing, patterns are applied to one part of the design while the other parts are maintained in a quiescent state. Quantitative data on several aspects of partitioned testing, using some industrial test cases, are presented. It highlights the need for generating patterns using different partition sizes, generating longer test sequences and the need to include functional testing in the test suite. In addition, we argue that a different metric is needed to evaluate functional pattern quality to cover the gaps identified.</description><subject>Applied sciences</subject><subject>Built-in self-test</subject><subject>Design methodology</subject><subject>Distributed control</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fault diagnosis</subject><subject>Logic design</subject><subject>Logic testing</subject><subject>Signal design</subject><subject>Test pattern generators</subject><subject>Testing, measurement, noise and reliability</subject><isbn>0780385802</isbn><isbn>9780780385801</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFj09Lw0AUxBdEUGs_gHjJxWPSt_83R6m1CgUPxnNZk_fKSkzC7iL02xuI4FzmMD9mGMbuOFScQ71pdu9NJQBUxaWzUusLdgPWgXTagbhi65S-YJasjTH6mm2ekLDNRTv-YPQnLPzg-3MKqRipmHzMIYdxwK7ImHIYTrfsknyfcP3nK_bxvGu2L-Xhbf-6fTyUQYDOpZnnuLTik7cCiWpSClUnTA3OkyajrJHSaq5FTWS1IiUJDVlLyne8I7liD0vv5FPre4p-aEM6TjF8-3g-cmckVwpm7n7hAiL-x8t3-QvoN04l</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Chakravarty, S.</creator><creator>Savage, E.W.</creator><creator>Tran, E.N.</creator><general>IEEE</general><general>International Test Conference</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>IQODW</scope></search><sort><creationdate>2004</creationdate><title>Defect coverage analysis of partitioned testing</title><author>Chakravarty, S. ; Savage, E.W. ; Tran, E.N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i205t-68581372b1c2eff9f44e4d26908af5f647633751529ff754f43fe6f77f4ad1df3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Applied sciences</topic><topic>Built-in self-test</topic><topic>Design methodology</topic><topic>Distributed control</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fault diagnosis</topic><topic>Logic design</topic><topic>Logic testing</topic><topic>Signal design</topic><topic>Test pattern generators</topic><topic>Testing, measurement, noise and reliability</topic><toplevel>online_resources</toplevel><creatorcontrib>Chakravarty, S.</creatorcontrib><creatorcontrib>Savage, E.W.</creatorcontrib><creatorcontrib>Tran, E.N.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chakravarty, S.</au><au>Savage, E.W.</au><au>Tran, E.N.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Defect coverage analysis of partitioned testing</atitle><btitle>2004 International Conferce on Test</btitle><stitle>TEST</stitle><date>2004</date><risdate>2004</risdate><spage>907</spage><epage>915</epage><pages>907-915</pages><isbn>0780385802</isbn><isbn>9780780385801</isbn><abstract>Research in improving test quality has focused on identifying better fault models and coverage metrics and tools to achieve high coverage. The test generation and test application methodology is usually not considered. We attempt to understand the implication of a test generation and test application methodology, viz, partitioned testing, on product quality. In partitioned testing, patterns are applied to one part of the design while the other parts are maintained in a quiescent state. Quantitative data on several aspects of partitioned testing, using some industrial test cases, are presented. It highlights the need for generating patterns using different partition sizes, generating longer test sequences and the need to include functional testing in the test suite. In addition, we argue that a different metric is needed to evaluate functional pattern quality to cover the gaps identified.</abstract><cop>Piscataway NJ</cop><cop>Washington DC</cop><pub>IEEE</pub><doi>10.1109/TEST.2004.1387355</doi><tpages>9</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISBN: 0780385802 |
| ispartof | 2004 International Conferce on Test, 2004, p.907-915 |
| issn | |
| language | eng |
| recordid | cdi_pascalfrancis_primary_18631440 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Applied sciences Built-in self-test Design methodology Distributed control Electronics Exact sciences and technology Fault diagnosis Logic design Logic testing Signal design Test pattern generators Testing, measurement, noise and reliability |
| title | Defect coverage analysis of partitioned testing |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T09%3A40%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Defect%20coverage%20analysis%20of%20partitioned%20testing&rft.btitle=2004%20International%20Conferce%20on%20Test&rft.au=Chakravarty,%20S.&rft.date=2004&rft.spage=907&rft.epage=915&rft.pages=907-915&rft.isbn=0780385802&rft.isbn_list=9780780385801&rft_id=info:doi/10.1109/TEST.2004.1387355&rft_dat=%3Cpascalfrancis_6IE%3E18631440%3C/pascalfrancis_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1387355&rfr_iscdi=true |