Modeling, validation and control of manufacturing systems

In this paper we elaborate on the problem of supply chain control in semiconductor manufacturing. First, we introduce the problem. Next, we propose the use of effective processing times (which can be measured from real factory data) to arrive at 'simple' discrete-event models for manufactu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Lefeber, E., van den Berg, R.A., Rooda, J.E.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 4588 vol.5
container_issue
container_start_page 4583
container_title
container_volume 5
creator Lefeber, E.
van den Berg, R.A.
Rooda, J.E.
description In this paper we elaborate on the problem of supply chain control in semiconductor manufacturing. First, we introduce the problem. Next, we propose the use of effective processing times (which can be measured from real factory data) to arrive at 'simple' discrete-event models for manufacturing systems. We explain why existing models can not be used for solving the problem and explain the need for PDE-models that consider the flow of products as a compressible fluid flow. Next, we present a validation study in which we compare the response of the currently available PDE-models to the results of discrete-event simulation. We conclude the paper by analytically deriving a controller that solves the ramp-up problem. The resulting controller is often used in practice.
doi_str_mv 10.23919/ACC.2004.1384033
format Conference Proceeding
fullrecord <record><control><sourceid>proquest_6IE</sourceid><recordid>TN_cdi_pascalfrancis_primary_18352163</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1384033</ieee_id><sourcerecordid>29873990</sourcerecordid><originalsourceid>FETCH-LOGICAL-c214t-9790b538cbeba8f6e96a66ee0099eae5648c1f50491c1e23fc7a32b739a12ce73</originalsourceid><addsrcrecordid>eNpF0EtLw0AUBeDBB1hrf4C4yUZXJs7MTWbmLkvwBRU3ug430xuJ5FEzidB_b6AF4cJZnI-zuEJcK5loQIUP6zxPtJRposClEuBELDRYF2fOqFOxQuvkfOAAMnsmFtKmECuj8EJchvAtpUI0ciHwrd9yU3df99EvNfWWxrrvIuq2ke-7ceibqK-ilrqpIj9OwwyjsA8jt-FKnFfUBF4dcyk-nx4_8pd48_78mq83sdcqHWO0KMsMnC-5JFcZRkPGMEuJyMSZSZ1XVSZTVF6xhspbAl1aQFLas4WluDvs7ob-Z-IwFm0dPDcNddxPodDoZoxyhrdHSMFTUw3U-ToUu6FuadgXykGmlYHZ3Rxczcz_9eGN8AdODmNA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>29873990</pqid></control><display><type>conference_proceeding</type><title>Modeling, validation and control of manufacturing systems</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Lefeber, E. ; van den Berg, R.A. ; Rooda, J.E.</creator><creatorcontrib>Lefeber, E. ; van den Berg, R.A. ; Rooda, J.E.</creatorcontrib><description>In this paper we elaborate on the problem of supply chain control in semiconductor manufacturing. First, we introduce the problem. Next, we propose the use of effective processing times (which can be measured from real factory data) to arrive at 'simple' discrete-event models for manufacturing systems. We explain why existing models can not be used for solving the problem and explain the need for PDE-models that consider the flow of products as a compressible fluid flow. Next, we present a validation study in which we compare the response of the currently available PDE-models to the results of discrete-event simulation. We conclude the paper by analytically deriving a controller that solves the ramp-up problem. The resulting controller is often used in practice.</description><identifier>ISSN: 0743-1619</identifier><identifier>ISBN: 9780780383357</identifier><identifier>ISBN: 0780383354</identifier><identifier>EISSN: 2378-5861</identifier><identifier>DOI: 10.23919/ACC.2004.1384033</identifier><language>eng</language><publisher>Piscataway NJ: IEEE</publisher><subject>Applied sciences ; Assembly ; Computer science; control theory; systems ; Control system synthesis ; Control theory. Systems ; Exact sciences and technology ; Fluid flow control ; Inventory control, production control. Distribution ; Manufacturing processes ; Manufacturing systems ; Operational research and scientific management ; Operational research. Management science ; Production facilities ; Pulp manufacturing ; Semiconductor device manufacture ; Semiconductor device modeling ; Supply chains</subject><ispartof>2004 American Control Conference Proceedings; Volume 5 of 6, 2004, Vol.5, p.4583-4588 vol.5</ispartof><rights>2007 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c214t-9790b538cbeba8f6e96a66ee0099eae5648c1f50491c1e23fc7a32b739a12ce73</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1384033$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,2051,27903,27904,54899</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1384033$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=18352163$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Lefeber, E.</creatorcontrib><creatorcontrib>van den Berg, R.A.</creatorcontrib><creatorcontrib>Rooda, J.E.</creatorcontrib><title>Modeling, validation and control of manufacturing systems</title><title>2004 American Control Conference Proceedings; Volume 5 of 6</title><addtitle>ACC</addtitle><description>In this paper we elaborate on the problem of supply chain control in semiconductor manufacturing. First, we introduce the problem. Next, we propose the use of effective processing times (which can be measured from real factory data) to arrive at 'simple' discrete-event models for manufacturing systems. We explain why existing models can not be used for solving the problem and explain the need for PDE-models that consider the flow of products as a compressible fluid flow. Next, we present a validation study in which we compare the response of the currently available PDE-models to the results of discrete-event simulation. We conclude the paper by analytically deriving a controller that solves the ramp-up problem. The resulting controller is often used in practice.</description><subject>Applied sciences</subject><subject>Assembly</subject><subject>Computer science; control theory; systems</subject><subject>Control system synthesis</subject><subject>Control theory. Systems</subject><subject>Exact sciences and technology</subject><subject>Fluid flow control</subject><subject>Inventory control, production control. Distribution</subject><subject>Manufacturing processes</subject><subject>Manufacturing systems</subject><subject>Operational research and scientific management</subject><subject>Operational research. Management science</subject><subject>Production facilities</subject><subject>Pulp manufacturing</subject><subject>Semiconductor device manufacture</subject><subject>Semiconductor device modeling</subject><subject>Supply chains</subject><issn>0743-1619</issn><issn>2378-5861</issn><isbn>9780780383357</isbn><isbn>0780383354</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpF0EtLw0AUBeDBB1hrf4C4yUZXJs7MTWbmLkvwBRU3ug430xuJ5FEzidB_b6AF4cJZnI-zuEJcK5loQIUP6zxPtJRposClEuBELDRYF2fOqFOxQuvkfOAAMnsmFtKmECuj8EJchvAtpUI0ciHwrd9yU3df99EvNfWWxrrvIuq2ke-7ceibqK-ilrqpIj9OwwyjsA8jt-FKnFfUBF4dcyk-nx4_8pd48_78mq83sdcqHWO0KMsMnC-5JFcZRkPGMEuJyMSZSZ1XVSZTVF6xhspbAl1aQFLas4WluDvs7ob-Z-IwFm0dPDcNddxPodDoZoxyhrdHSMFTUw3U-ToUu6FuadgXykGmlYHZ3Rxczcz_9eGN8AdODmNA</recordid><startdate>20040101</startdate><enddate>20040101</enddate><creator>Lefeber, E.</creator><creator>van den Berg, R.A.</creator><creator>Rooda, J.E.</creator><general>IEEE</general><general>American Automatic Control Council</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>IQODW</scope><scope>7SC</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>20040101</creationdate><title>Modeling, validation and control of manufacturing systems</title><author>Lefeber, E. ; van den Berg, R.A. ; Rooda, J.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c214t-9790b538cbeba8f6e96a66ee0099eae5648c1f50491c1e23fc7a32b739a12ce73</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Applied sciences</topic><topic>Assembly</topic><topic>Computer science; control theory; systems</topic><topic>Control system synthesis</topic><topic>Control theory. Systems</topic><topic>Exact sciences and technology</topic><topic>Fluid flow control</topic><topic>Inventory control, production control. Distribution</topic><topic>Manufacturing processes</topic><topic>Manufacturing systems</topic><topic>Operational research and scientific management</topic><topic>Operational research. Management science</topic><topic>Production facilities</topic><topic>Pulp manufacturing</topic><topic>Semiconductor device manufacture</topic><topic>Semiconductor device modeling</topic><topic>Supply chains</topic><toplevel>online_resources</toplevel><creatorcontrib>Lefeber, E.</creatorcontrib><creatorcontrib>van den Berg, R.A.</creatorcontrib><creatorcontrib>Rooda, J.E.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Pascal-Francis</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lefeber, E.</au><au>van den Berg, R.A.</au><au>Rooda, J.E.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Modeling, validation and control of manufacturing systems</atitle><btitle>2004 American Control Conference Proceedings; Volume 5 of 6</btitle><stitle>ACC</stitle><date>2004-01-01</date><risdate>2004</risdate><volume>5</volume><spage>4583</spage><epage>4588 vol.5</epage><pages>4583-4588 vol.5</pages><issn>0743-1619</issn><eissn>2378-5861</eissn><isbn>9780780383357</isbn><isbn>0780383354</isbn><abstract>In this paper we elaborate on the problem of supply chain control in semiconductor manufacturing. First, we introduce the problem. Next, we propose the use of effective processing times (which can be measured from real factory data) to arrive at 'simple' discrete-event models for manufacturing systems. We explain why existing models can not be used for solving the problem and explain the need for PDE-models that consider the flow of products as a compressible fluid flow. Next, we present a validation study in which we compare the response of the currently available PDE-models to the results of discrete-event simulation. We conclude the paper by analytically deriving a controller that solves the ramp-up problem. The resulting controller is often used in practice.</abstract><cop>Piscataway NJ</cop><cop>Evanston IL</cop><pub>IEEE</pub><doi>10.23919/ACC.2004.1384033</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0743-1619
ispartof 2004 American Control Conference Proceedings; Volume 5 of 6, 2004, Vol.5, p.4583-4588 vol.5
issn 0743-1619
2378-5861
language eng
recordid cdi_pascalfrancis_primary_18352163
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Applied sciences
Assembly
Computer science
control theory
systems
Control system synthesis
Control theory. Systems
Exact sciences and technology
Fluid flow control
Inventory control, production control. Distribution
Manufacturing processes
Manufacturing systems
Operational research and scientific management
Operational research. Management science
Production facilities
Pulp manufacturing
Semiconductor device manufacture
Semiconductor device modeling
Supply chains
title Modeling, validation and control of manufacturing systems
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T00%3A56%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Modeling,%20validation%20and%20control%20of%20manufacturing%20systems&rft.btitle=2004%20American%20Control%20Conference%20Proceedings;%20Volume%205%20of%206&rft.au=Lefeber,%20E.&rft.date=2004-01-01&rft.volume=5&rft.spage=4583&rft.epage=4588%20vol.5&rft.pages=4583-4588%20vol.5&rft.issn=0743-1619&rft.eissn=2378-5861&rft.isbn=9780780383357&rft.isbn_list=0780383354&rft_id=info:doi/10.23919/ACC.2004.1384033&rft_dat=%3Cproquest_6IE%3E29873990%3C/proquest_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=29873990&rft_id=info:pmid/&rft_ieee_id=1384033&rfr_iscdi=true