Structure and photoluminescence properties of Fe-doped ZnO thin films
Zn1-xFexO films were prepared by the radio-frequency (rf) magnetron sputtering technique on n-Si substrates with a composite target of a ceramic polycrystalline ZnO containing several Fe pieces on the surface. X-ray photoelectron spectroscopy study of the Zn1-xFexO films shows that Fe in the as-depo...
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| Veröffentlicht in: | Journal of physics. D, Applied physics Applied physics, 2006-11, Vol.39 (22), p.4762-4765 |
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| container_end_page | 4765 |
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| container_issue | 22 |
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| container_title | Journal of physics. D, Applied physics |
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| creator | Chen, A J Wu, X M Sha, Z D Zhuge, L J Meng, Y D |
| description | Zn1-xFexO films were prepared by the radio-frequency (rf) magnetron sputtering technique on n-Si substrates with a composite target of a ceramic polycrystalline ZnO containing several Fe pieces on the surface. X-ray photoelectron spectroscopy study of the Zn1-xFexO films shows that Fe in the as-deposited film exists mainly in the form of Fe2+. And x-ray diffraction spectra show that all the films exhibited c-axis orientation. The room temperature photoluminescence (PL) properties of the Zn1-xFexO films were also discussed. Two obvious PL peaks appear at 378 nm and 414 nm, respectively. It is interesting that there is a tendency of redshift for the peak at 378 nm and that the PL intensity increases slightly for the peak at 414 nm as the Fe concentration increases. Discussions have been given to explain the different phenomena. |
| doi_str_mv | 10.1088/0022-3727/39/22/004 |
| format | Article |
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X-ray photoelectron spectroscopy study of the Zn1-xFexO films shows that Fe in the as-deposited film exists mainly in the form of Fe2+. And x-ray diffraction spectra show that all the films exhibited c-axis orientation. The room temperature photoluminescence (PL) properties of the Zn1-xFexO films were also discussed. Two obvious PL peaks appear at 378 nm and 414 nm, respectively. It is interesting that there is a tendency of redshift for the peak at 378 nm and that the PL intensity increases slightly for the peak at 414 nm as the Fe concentration increases. 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| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Other semiconductors Physics |
| title | Structure and photoluminescence properties of Fe-doped ZnO thin films |
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