A conventional 45nm CMOS node low-cost platform for general purpose and low power applications
In this work, a low-cost 45nm node platform for general purpose and low power applications based on conventional bulk approach is proposed. Performant Lg=30nm/45nm devices with SiON gate oxide, shallow junctions and process induced strain are demonstrated. GP nFET/pFET devices feature I/sub on/= 820...
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | In this work, a low-cost 45nm node platform for general purpose and low power applications based on conventional bulk approach is proposed. Performant Lg=30nm/45nm devices with SiON gate oxide, shallow junctions and process induced strain are demonstrated. GP nFET/pFET devices feature I/sub on/= 820/spl mu/A//spl mu/m/340 /spl mu/A//spl mu/m at I/sub off/ = 20nA//spl mu/m at V/sub dd/=1.0V. RO features Tp < 10ps. LP devices feature I/sub on/= 505 /spl mu/A//spl mu/m 1240 /spl mu/A//spl mu/m at I/sub off/ = 0.1 nA//spl mu/m at V/sub dd/= 1.2V. In addition, high-voltage 50A/2.5V devices are made to complete the CMOS platform. |
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DOI: | 10.1109/IEDM.2004.1419177 |