Ellipsometric characterization of surface freezing in Ga-based alloys

We present results on surface freezing of Ga-based alloys, GaBi, GaPb and GaTl, above the liquidus line between the Ga-rich eutectic and the monotectic point. Spectroscopic ellipsometry (0.8 eV < =hnu < =4.2 eV) and kinetic single wavelength ellipsometry (2.75 eV) have been employed to probe t...

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Veröffentlicht in:	Journal of physics. Condensed matter 2006-04, Vol.18 (15), p.3535-3542
Hauptverfasser:	Bartel, K, Nattland, D, Kumar, A, Dogel, S, Freyland, W
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Phase transitions and critical phenomena Physics Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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