Status and direction of communication technologies : SiGe BiCMOS and RFCMOS: Special issue on silicon germanium - advanced technology, modeling, and design

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Veröffentlicht in:Proceedings of the IEEE 2005, Vol.93 (9), p.1539-1558
Hauptverfasser: JOSEPH, Alvin J, HARAME, David L, NOWAK, Edward, JAGANNATHAN, Basanth, COOLBAUGH, Doug, AHLGREN, David, MAGERLEIN, John, LANZEROTTI, Louis, FEILCHENFELD, Natalie, ONGE, Stephen St, DUNN, James
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container_end_page 1558
container_issue 9
container_start_page 1539
container_title Proceedings of the IEEE
container_volume 93
creator JOSEPH, Alvin J
HARAME, David L
NOWAK, Edward
JAGANNATHAN, Basanth
COOLBAUGH, Doug
AHLGREN, David
MAGERLEIN, John
LANZEROTTI, Louis
FEILCHENFELD, Natalie
ONGE, Stephen St
DUNN, James
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format Article
fullrecord <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_17046998</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>17046998</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_170469983</originalsourceid><addsrcrecordid>eNqNi8sKwjAUBYMoWB__kI3LQtqa2ri0WAURwbovlzTVK21SknTh34viB7g6wzBnRIKI8yyMY56OScBYlIUijsSUzJx7MsYSniYBOZUe_OAo6JrWaJX0aDQ1DZWm6waNEr7CK_nQpjV3VI5uaYkHRXeYny_l93ktPrggkwZap5a_nZNVsb_lx7AHJ6FtLGiJruotdmBfVbRh61SILPm3ewOPOz8K</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Status and direction of communication technologies : SiGe BiCMOS and RFCMOS: Special issue on silicon germanium - advanced technology, modeling, and design</title><source>IEEE Electronic Library (IEL)</source><creator>JOSEPH, Alvin J ; HARAME, David L ; NOWAK, Edward ; JAGANNATHAN, Basanth ; COOLBAUGH, Doug ; AHLGREN, David ; MAGERLEIN, John ; LANZEROTTI, Louis ; FEILCHENFELD, Natalie ; ONGE, Stephen St ; DUNN, James</creator><creatorcontrib>JOSEPH, Alvin J ; HARAME, David L ; NOWAK, Edward ; JAGANNATHAN, Basanth ; COOLBAUGH, Doug ; AHLGREN, David ; MAGERLEIN, John ; LANZEROTTI, Louis ; FEILCHENFELD, Natalie ; ONGE, Stephen St ; DUNN, James</creatorcontrib><identifier>ISSN: 0018-9219</identifier><identifier>EISSN: 1558-2256</identifier><identifier>CODEN: IEEPAD</identifier><language>eng</language><publisher>New York, NY: Institute of Electrical and Electronics Engineers</publisher><subject>Applied sciences ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Integrated circuits ; Operation, maintenance, reliability ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Systems, networks and services of telecommunications ; Telecommunications ; Telecommunications and information theory</subject><ispartof>Proceedings of the IEEE, 2005, Vol.93 (9), p.1539-1558</ispartof><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,4024</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=17046998$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>JOSEPH, Alvin J</creatorcontrib><creatorcontrib>HARAME, David L</creatorcontrib><creatorcontrib>NOWAK, Edward</creatorcontrib><creatorcontrib>JAGANNATHAN, Basanth</creatorcontrib><creatorcontrib>COOLBAUGH, Doug</creatorcontrib><creatorcontrib>AHLGREN, David</creatorcontrib><creatorcontrib>MAGERLEIN, John</creatorcontrib><creatorcontrib>LANZEROTTI, Louis</creatorcontrib><creatorcontrib>FEILCHENFELD, Natalie</creatorcontrib><creatorcontrib>ONGE, Stephen St</creatorcontrib><creatorcontrib>DUNN, James</creatorcontrib><title>Status and direction of communication technologies : SiGe BiCMOS and RFCMOS: Special issue on silicon germanium - advanced technology, modeling, and design</title><title>Proceedings of the IEEE</title><subject>Applied sciences</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>Operation, maintenance, reliability</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Systems, networks and services of telecommunications</subject><subject>Telecommunications</subject><subject>Telecommunications and information theory</subject><issn>0018-9219</issn><issn>1558-2256</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNqNi8sKwjAUBYMoWB__kI3LQtqa2ri0WAURwbovlzTVK21SknTh34viB7g6wzBnRIKI8yyMY56OScBYlIUijsSUzJx7MsYSniYBOZUe_OAo6JrWaJX0aDQ1DZWm6waNEr7CK_nQpjV3VI5uaYkHRXeYny_l93ktPrggkwZap5a_nZNVsb_lx7AHJ6FtLGiJruotdmBfVbRh61SILPm3ewOPOz8K</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>JOSEPH, Alvin J</creator><creator>HARAME, David L</creator><creator>NOWAK, Edward</creator><creator>JAGANNATHAN, Basanth</creator><creator>COOLBAUGH, Doug</creator><creator>AHLGREN, David</creator><creator>MAGERLEIN, John</creator><creator>LANZEROTTI, Louis</creator><creator>FEILCHENFELD, Natalie</creator><creator>ONGE, Stephen St</creator><creator>DUNN, James</creator><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope></search><sort><creationdate>2005</creationdate><title>Status and direction of communication technologies : SiGe BiCMOS and RFCMOS</title><author>JOSEPH, Alvin J ; HARAME, David L ; NOWAK, Edward ; JAGANNATHAN, Basanth ; COOLBAUGH, Doug ; AHLGREN, David ; MAGERLEIN, John ; LANZEROTTI, Louis ; FEILCHENFELD, Natalie ; ONGE, Stephen St ; DUNN, James</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_170469983</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>Operation, maintenance, reliability</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Systems, networks and services of telecommunications</topic><topic>Telecommunications</topic><topic>Telecommunications and information theory</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>JOSEPH, Alvin J</creatorcontrib><creatorcontrib>HARAME, David L</creatorcontrib><creatorcontrib>NOWAK, Edward</creatorcontrib><creatorcontrib>JAGANNATHAN, Basanth</creatorcontrib><creatorcontrib>COOLBAUGH, Doug</creatorcontrib><creatorcontrib>AHLGREN, David</creatorcontrib><creatorcontrib>MAGERLEIN, John</creatorcontrib><creatorcontrib>LANZEROTTI, Louis</creatorcontrib><creatorcontrib>FEILCHENFELD, Natalie</creatorcontrib><creatorcontrib>ONGE, Stephen St</creatorcontrib><creatorcontrib>DUNN, James</creatorcontrib><collection>Pascal-Francis</collection><jtitle>Proceedings of the IEEE</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>JOSEPH, Alvin J</au><au>HARAME, David L</au><au>NOWAK, Edward</au><au>JAGANNATHAN, Basanth</au><au>COOLBAUGH, Doug</au><au>AHLGREN, David</au><au>MAGERLEIN, John</au><au>LANZEROTTI, Louis</au><au>FEILCHENFELD, Natalie</au><au>ONGE, Stephen St</au><au>DUNN, James</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Status and direction of communication technologies : SiGe BiCMOS and RFCMOS: Special issue on silicon germanium - advanced technology, modeling, and design</atitle><jtitle>Proceedings of the IEEE</jtitle><date>2005</date><risdate>2005</risdate><volume>93</volume><issue>9</issue><spage>1539</spage><epage>1558</epage><pages>1539-1558</pages><issn>0018-9219</issn><eissn>1558-2256</eissn><coden>IEEPAD</coden><cop>New York, NY</cop><pub>Institute of Electrical and Electronics Engineers</pub></addata></record>
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source IEEE Electronic Library (IEL)
subjects Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Operation, maintenance, reliability
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Systems, networks and services of telecommunications
Telecommunications
Telecommunications and information theory
title Status and direction of communication technologies : SiGe BiCMOS and RFCMOS: Special issue on silicon germanium - advanced technology, modeling, and design
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T07%3A20%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Status%20and%20direction%20of%20communication%20technologies%20:%20SiGe%20BiCMOS%20and%20RFCMOS:%20Special%20issue%20on%20silicon%20germanium%20-%20advanced%20technology,%20modeling,%20and%20design&rft.jtitle=Proceedings%20of%20the%20IEEE&rft.au=JOSEPH,%20Alvin%20J&rft.date=2005&rft.volume=93&rft.issue=9&rft.spage=1539&rft.epage=1558&rft.pages=1539-1558&rft.issn=0018-9219&rft.eissn=1558-2256&rft.coden=IEEPAD&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E17046998%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true