Scum-free patterning of SU-8 resist for electroforming applications
A simple approach is developed to obtain scum-free pattern transfer in SU-8 resist by UV-lithography for electroforming applications. SU-8 is an epoxy-based negative resist used in the fabrication of high-aspect ratio microstructures. SU-8 resist poses considerable processing difficulties and tends...
Gespeichert in:
Veröffentlicht in: | Journal of micromechanics and microengineering 2005-01, Vol.15 (1), p.130-135 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 135 |
---|---|
container_issue | 1 |
container_start_page | 130 |
container_title | Journal of micromechanics and microengineering |
container_volume | 15 |
creator | Agarwal, M Gunasekaran, R A Coane, P Varahramyan, K |
description | A simple approach is developed to obtain scum-free pattern transfer in SU-8 resist by UV-lithography for electroforming applications. SU-8 is an epoxy-based negative resist used in the fabrication of high-aspect ratio microstructures. SU-8 resist poses considerable processing difficulties and tends to leave organic residues of undeveloped resist on the surface of the exposed metallic seed layer. Scum-free pattern transfer in SU-8 resist is important for the subsequent electroplating process used to fabricate the high-aspect ratio metallic microstructures. Dry plasma etching processes are commonly used to remove the SU-8 residue prior to electroplating. However, these processes are complex and not cost-effective. In this work, it is shown that scum-free SU-8 patterns could be achieved by proper selection of process parameters such as soft-bake temperature, exposure time, post-exposure-bake temperature, developing time and rinsing in solvents. The success of this particular process is due to controlled rinsing of the patterned sample in acetone to remove the resist scum. The results of our method for patterning the SU-8 resist to fabricate nickel microstructures using this mold are reported. |
doi_str_mv | 10.1088/0960-1317/15/1/020 |
format | Article |
fullrecord | <record><control><sourceid>proquest_pasca</sourceid><recordid>TN_cdi_pascalfrancis_primary_16400611</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>29600466</sourcerecordid><originalsourceid>FETCH-LOGICAL-c380t-7cd0a1315ea00a5c746ef298b2b29532407377f9ddfbeb80f16956a3b1d9d2c13</originalsourceid><addsrcrecordid>eNqNkD1PwzAQhi0EEqXwB5iygMRgcmcnjjOiii-pEkPpbDmOjYzyhZ0O_HsStYKhC9Pd8Lyv7h5CrhHuEaRMoRRAkWORYp5iCgxOyAK5QCoyXp6SxS9wTi5i_ARAlCgXZLUxu5a6YG0y6HG0ofPdR9K7ZLOlMgk2-jgmrg-JbawZQz-t7UzoYWi80aPvu3hJzpxuor06zCXZPj2-r17o-u35dfWwpoZLGGlhatDTCbnVADo3RSasY6WsWMXKnLMMCl4UrqxrV9lKgkNR5kLzCuuyZgb5ktzue4fQf-1sHFXro7FNozvb76Ji04-QCTGBbA-a0McYrFND8K0O3wpBzb7UrEPNOhTmCtXkawrdHNp1NLpxQXfGx7-kyAAEzlfQPef74X-9d8f8MaeG2vEfU5aEMA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>29600466</pqid></control><display><type>article</type><title>Scum-free patterning of SU-8 resist for electroforming applications</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Agarwal, M ; Gunasekaran, R A ; Coane, P ; Varahramyan, K</creator><creatorcontrib>Agarwal, M ; Gunasekaran, R A ; Coane, P ; Varahramyan, K</creatorcontrib><description>A simple approach is developed to obtain scum-free pattern transfer in SU-8 resist by UV-lithography for electroforming applications. SU-8 is an epoxy-based negative resist used in the fabrication of high-aspect ratio microstructures. SU-8 resist poses considerable processing difficulties and tends to leave organic residues of undeveloped resist on the surface of the exposed metallic seed layer. Scum-free pattern transfer in SU-8 resist is important for the subsequent electroplating process used to fabricate the high-aspect ratio metallic microstructures. Dry plasma etching processes are commonly used to remove the SU-8 residue prior to electroplating. However, these processes are complex and not cost-effective. In this work, it is shown that scum-free SU-8 patterns could be achieved by proper selection of process parameters such as soft-bake temperature, exposure time, post-exposure-bake temperature, developing time and rinsing in solvents. The success of this particular process is due to controlled rinsing of the patterned sample in acetone to remove the resist scum. The results of our method for patterning the SU-8 resist to fabricate nickel microstructures using this mold are reported.</description><identifier>ISSN: 0960-1317</identifier><identifier>EISSN: 1361-6439</identifier><identifier>DOI: 10.1088/0960-1317/15/1/020</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Mechanical engineering. Machine design ; Mechanical instruments, equipment and techniques ; Microelectronic fabrication (materials and surfaces technology) ; Micromechanical devices and systems ; Physics ; Precision engineering, watch making ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Journal of micromechanics and microengineering, 2005-01, Vol.15 (1), p.130-135</ispartof><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c380t-7cd0a1315ea00a5c746ef298b2b29532407377f9ddfbeb80f16956a3b1d9d2c13</citedby><cites>FETCH-LOGICAL-c380t-7cd0a1315ea00a5c746ef298b2b29532407377f9ddfbeb80f16956a3b1d9d2c13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/0960-1317/15/1/020/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,4010,27900,27901,27902,53805,53885</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16400611$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Agarwal, M</creatorcontrib><creatorcontrib>Gunasekaran, R A</creatorcontrib><creatorcontrib>Coane, P</creatorcontrib><creatorcontrib>Varahramyan, K</creatorcontrib><title>Scum-free patterning of SU-8 resist for electroforming applications</title><title>Journal of micromechanics and microengineering</title><description>A simple approach is developed to obtain scum-free pattern transfer in SU-8 resist by UV-lithography for electroforming applications. SU-8 is an epoxy-based negative resist used in the fabrication of high-aspect ratio microstructures. SU-8 resist poses considerable processing difficulties and tends to leave organic residues of undeveloped resist on the surface of the exposed metallic seed layer. Scum-free pattern transfer in SU-8 resist is important for the subsequent electroplating process used to fabricate the high-aspect ratio metallic microstructures. Dry plasma etching processes are commonly used to remove the SU-8 residue prior to electroplating. However, these processes are complex and not cost-effective. In this work, it is shown that scum-free SU-8 patterns could be achieved by proper selection of process parameters such as soft-bake temperature, exposure time, post-exposure-bake temperature, developing time and rinsing in solvents. The success of this particular process is due to controlled rinsing of the patterned sample in acetone to remove the resist scum. The results of our method for patterning the SU-8 resist to fabricate nickel microstructures using this mold are reported.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Mechanical engineering. Machine design</subject><subject>Mechanical instruments, equipment and techniques</subject><subject>Microelectronic fabrication (materials and surfaces technology)</subject><subject>Micromechanical devices and systems</subject><subject>Physics</subject><subject>Precision engineering, watch making</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>0960-1317</issn><issn>1361-6439</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNqNkD1PwzAQhi0EEqXwB5iygMRgcmcnjjOiii-pEkPpbDmOjYzyhZ0O_HsStYKhC9Pd8Lyv7h5CrhHuEaRMoRRAkWORYp5iCgxOyAK5QCoyXp6SxS9wTi5i_ARAlCgXZLUxu5a6YG0y6HG0ofPdR9K7ZLOlMgk2-jgmrg-JbawZQz-t7UzoYWi80aPvu3hJzpxuor06zCXZPj2-r17o-u35dfWwpoZLGGlhatDTCbnVADo3RSasY6WsWMXKnLMMCl4UrqxrV9lKgkNR5kLzCuuyZgb5ktzue4fQf-1sHFXro7FNozvb76Ji04-QCTGBbA-a0McYrFND8K0O3wpBzb7UrEPNOhTmCtXkawrdHNp1NLpxQXfGx7-kyAAEzlfQPef74X-9d8f8MaeG2vEfU5aEMA</recordid><startdate>20050101</startdate><enddate>20050101</enddate><creator>Agarwal, M</creator><creator>Gunasekaran, R A</creator><creator>Coane, P</creator><creator>Varahramyan, K</creator><general>IOP Publishing</general><general>Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>KR7</scope></search><sort><creationdate>20050101</creationdate><title>Scum-free patterning of SU-8 resist for electroforming applications</title><author>Agarwal, M ; Gunasekaran, R A ; Coane, P ; Varahramyan, K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c380t-7cd0a1315ea00a5c746ef298b2b29532407377f9ddfbeb80f16956a3b1d9d2c13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Mechanical engineering. Machine design</topic><topic>Mechanical instruments, equipment and techniques</topic><topic>Microelectronic fabrication (materials and surfaces technology)</topic><topic>Micromechanical devices and systems</topic><topic>Physics</topic><topic>Precision engineering, watch making</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Agarwal, M</creatorcontrib><creatorcontrib>Gunasekaran, R A</creatorcontrib><creatorcontrib>Coane, P</creatorcontrib><creatorcontrib>Varahramyan, K</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Civil Engineering Abstracts</collection><jtitle>Journal of micromechanics and microengineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Agarwal, M</au><au>Gunasekaran, R A</au><au>Coane, P</au><au>Varahramyan, K</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Scum-free patterning of SU-8 resist for electroforming applications</atitle><jtitle>Journal of micromechanics and microengineering</jtitle><date>2005-01-01</date><risdate>2005</risdate><volume>15</volume><issue>1</issue><spage>130</spage><epage>135</epage><pages>130-135</pages><issn>0960-1317</issn><eissn>1361-6439</eissn><abstract>A simple approach is developed to obtain scum-free pattern transfer in SU-8 resist by UV-lithography for electroforming applications. SU-8 is an epoxy-based negative resist used in the fabrication of high-aspect ratio microstructures. SU-8 resist poses considerable processing difficulties and tends to leave organic residues of undeveloped resist on the surface of the exposed metallic seed layer. Scum-free pattern transfer in SU-8 resist is important for the subsequent electroplating process used to fabricate the high-aspect ratio metallic microstructures. Dry plasma etching processes are commonly used to remove the SU-8 residue prior to electroplating. However, these processes are complex and not cost-effective. In this work, it is shown that scum-free SU-8 patterns could be achieved by proper selection of process parameters such as soft-bake temperature, exposure time, post-exposure-bake temperature, developing time and rinsing in solvents. The success of this particular process is due to controlled rinsing of the patterned sample in acetone to remove the resist scum. The results of our method for patterning the SU-8 resist to fabricate nickel microstructures using this mold are reported.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/0960-1317/15/1/020</doi><tpages>6</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0960-1317 |
ispartof | Journal of micromechanics and microengineering, 2005-01, Vol.15 (1), p.130-135 |
issn | 0960-1317 1361-6439 |
language | eng |
recordid | cdi_pascalfrancis_primary_16400611 |
source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
subjects | Applied sciences Electronics Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Mechanical engineering. Machine design Mechanical instruments, equipment and techniques Microelectronic fabrication (materials and surfaces technology) Micromechanical devices and systems Physics Precision engineering, watch making Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
title | Scum-free patterning of SU-8 resist for electroforming applications |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T13%3A52%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Scum-free%20patterning%20of%20SU-8%20resist%20for%20electroforming%20applications&rft.jtitle=Journal%20of%20micromechanics%20and%20microengineering&rft.au=Agarwal,%20M&rft.date=2005-01-01&rft.volume=15&rft.issue=1&rft.spage=130&rft.epage=135&rft.pages=130-135&rft.issn=0960-1317&rft.eissn=1361-6439&rft_id=info:doi/10.1088/0960-1317/15/1/020&rft_dat=%3Cproquest_pasca%3E29600466%3C/proquest_pasca%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=29600466&rft_id=info:pmid/&rfr_iscdi=true |