A 2-Gb/s optical transceiver with accelerated bit-error-ratio test capability: Special Issue on Optical Interconnects

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Veröffentlicht in:Journal of lightwave technology 2004, Vol.22 (9), p.2158-2167
Hauptverfasser: XIAOQING WANG, KIAMILEV, Fouad, PING GUI, EKMAN, Jeremy, PAPEN, George C, MCFADDEN, Michael J, HANEY, Michael W, KUZNIA, Charles
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container_end_page 2167
container_issue 9
container_start_page 2158
container_title Journal of lightwave technology
container_volume 22
creator XIAOQING WANG
KIAMILEV, Fouad
PING GUI
EKMAN, Jeremy
PAPEN, George C
MCFADDEN, Michael J
HANEY, Michael W
KUZNIA, Charles
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format Article
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ispartof Journal of lightwave technology, 2004, Vol.22 (9), p.2158-2167
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1558-2213
language eng
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source IEEE Electronic Library (IEL)
subjects Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Integrated optoelectronics. Optoelectronic circuits
Optical and optoelectronic circuits
Optical computers, logic elements, interconnects, switches
neural networks
Optical elements, devices, and systems
Optics
Physics
title A 2-Gb/s optical transceiver with accelerated bit-error-ratio test capability: Special Issue on Optical Interconnects
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