A 2-Gb/s optical transceiver with accelerated bit-error-ratio test capability: Special Issue on Optical Interconnects
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Veröffentlicht in: | Journal of lightwave technology 2004, Vol.22 (9), p.2158-2167 |
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container_title | Journal of lightwave technology |
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creator | XIAOQING WANG KIAMILEV, Fouad PING GUI EKMAN, Jeremy PAPEN, George C MCFADDEN, Michael J HANEY, Michael W KUZNIA, Charles |
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ispartof | Journal of lightwave technology, 2004, Vol.22 (9), p.2158-2167 |
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language | eng |
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source | IEEE Electronic Library (IEL) |
subjects | Applied sciences Circuit properties Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Fundamental areas of phenomenology (including applications) Integrated optoelectronics. Optoelectronic circuits Optical and optoelectronic circuits Optical computers, logic elements, interconnects, switches neural networks Optical elements, devices, and systems Optics Physics |
title | A 2-Gb/s optical transceiver with accelerated bit-error-ratio test capability: Special Issue on Optical Interconnects |
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