A reverse electrochemical floating-layer technique of SPM tip preparation

Presents an experimental set-up involving a combination of reverse electrochemical etching and the floating layer technique of tungsten tip preparation for scanning probe microscopes. Only DC bias is used, avoiding the shortcomings of AC bias. This cost- and time-effective, in-laboratory approach yi...

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Veröffentlicht in:	Measurement science & technology 2000-10, Vol.11 (10), p.1426-1431
Hauptverfasser:	Kar, A K, Gangopadhyay, S, Mathur, B K
Format:	Artikel
Sprache:	eng
Schlagworte:	Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Scanning probe microscopes, components and techniques Scanning tunneling microscopes
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