Atomic and electronic structure of ([formula omitted])R 30°-In phase on Cu(111)
The atomic and electronic structure of (3×3)R30°-In phase on Cu(111) was studied by synchrotron radiation photoemission and scanning tunneling microscopy (STM). The two-dimensional states of In induced bands in the (3×3)R30° phase were measured by angle-resolved photoemission. Theoretical calculatio...
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| Veröffentlicht in: | Solid state communications 2003-03, Vol.125 (9), p.509-514 |
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| container_issue | 9 |
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| container_title | Solid state communications |
| container_volume | 125 |
| creator | Wang, P. Gao, X. Xun, K. Jia, J.F. Qian, H.J. Liu, F.Q. Ibrahim, K. Zhou, Y.M. Xue, Q.K. Wu, S.C. |
| description | The atomic and electronic structure of (3×3)R30°-In phase on Cu(111) was studied by synchrotron radiation photoemission and scanning tunneling microscopy (STM). The two-dimensional states of In induced bands in the (3×3)R30° phase were measured by angle-resolved photoemission. Theoretical calculations have been made to obtain further information on the In induced bands. |
| doi_str_mv | 10.1016/S0038-1098(02)00815-3 |
| format | Article |
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The two-dimensional states of In induced bands in the (3×3)R30° phase were measured by angle-resolved photoemission. Theoretical calculations have been made to obtain further information on the In induced bands.</description><identifier>ISSN: 0038-1098</identifier><identifier>EISSN: 1879-2766</identifier><identifier>DOI: 10.1016/S0038-1098(02)00815-3</identifier><identifier>CODEN: SSCOA4</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>A. Thin film growth ; C. Surface topography ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; D. Band structure ; Electron, ion, and scanning probe microscopy ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Exact sciences and technology ; Physics ; Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc ; Structure and morphology; thickness ; Structure of solids and liquids; crystallography ; Surface and interface electron states ; Surface states, band structure, electron density of states ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology</subject><ispartof>Solid state communications, 2003-03, Vol.125 (9), p.509-514</ispartof><rights>2003</rights><rights>2003 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0038-1098(02)00815-3$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,778,782,3539,27907,27908,45978</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=14532719$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Wang, P.</creatorcontrib><creatorcontrib>Gao, X.</creatorcontrib><creatorcontrib>Xun, K.</creatorcontrib><creatorcontrib>Jia, J.F.</creatorcontrib><creatorcontrib>Qian, H.J.</creatorcontrib><creatorcontrib>Liu, F.Q.</creatorcontrib><creatorcontrib>Ibrahim, K.</creatorcontrib><creatorcontrib>Zhou, Y.M.</creatorcontrib><creatorcontrib>Xue, Q.K.</creatorcontrib><creatorcontrib>Wu, S.C.</creatorcontrib><title>Atomic and electronic structure of ([formula omitted])R 30°-In phase on Cu(111)</title><title>Solid state communications</title><description>The atomic and electronic structure of (3×3)R30°-In phase on Cu(111) was studied by synchrotron radiation photoemission and scanning tunneling microscopy (STM). The two-dimensional states of In induced bands in the (3×3)R30° phase were measured by angle-resolved photoemission. Theoretical calculations have been made to obtain further information on the In induced bands.</description><subject>A. Thin film growth</subject><subject>C. Surface topography</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>D. Band structure</subject><subject>Electron, ion, and scanning probe microscopy</subject><subject>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc</subject><subject>Structure and morphology; thickness</subject><subject>Structure of solids and liquids; crystallography</subject><subject>Surface and interface electron states</subject><subject>Surface states, band structure, electron density of states</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><issn>0038-1098</issn><issn>1879-2766</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNo9kN9KwzAUxoMoOKePIORG2C6q5zRN01zJGFMHA8U_VyIhTROsdO1IUsG38hl8MrtNvDoc-PHxfT9CzhEuETC_egJgRYIgiwmkU4ACecIOyAgLIZNU5PkhGf0jx-QkhA8AEIXAEXmYxW5dG6rbitrGmui7dnhD9L2Jvbe0c3Ty6jq_7htNBzRGW71NHymDn-9k2dLNuw4D1dJ5P0HE6Sk5croJ9uzvjsnLzeJ5fpes7m-X89kqscizmEijS1bIVDINxmEm0Mmcs1QzV5Uy41prCRKdkCi4zdLtllwI4BzLsuQFG5OLfe5GB6Mb53Vr6qA2vl5r_6UwG8IEyoG73nN2KPNZW6-CqW1rbFX7Ya6qulohqK1ItROptpYUpGonUjH2C7mbZIk</recordid><startdate>200303</startdate><enddate>200303</enddate><creator>Wang, P.</creator><creator>Gao, X.</creator><creator>Xun, K.</creator><creator>Jia, J.F.</creator><creator>Qian, H.J.</creator><creator>Liu, F.Q.</creator><creator>Ibrahim, K.</creator><creator>Zhou, Y.M.</creator><creator>Xue, Q.K.</creator><creator>Wu, S.C.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope></search><sort><creationdate>200303</creationdate><title>Atomic and electronic structure of ([formula omitted])R 30°-In phase on Cu(111)</title><author>Wang, P. ; Gao, X. ; Xun, K. ; Jia, J.F. ; Qian, H.J. ; Liu, F.Q. ; Ibrahim, K. ; Zhou, Y.M. ; Xue, Q.K. ; Wu, S.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-e154t-9cab389293a0cf1471f96532a3fdb945aaa9091f79175e4218796770551bbb583</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>A. Thin film growth</topic><topic>C. Surface topography</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>D. Band structure</topic><topic>Electron, ion, and scanning probe microscopy</topic><topic>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc</topic><topic>Structure and morphology; thickness</topic><topic>Structure of solids and liquids; crystallography</topic><topic>Surface and interface electron states</topic><topic>Surface states, band structure, electron density of states</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, P.</creatorcontrib><creatorcontrib>Gao, X.</creatorcontrib><creatorcontrib>Xun, K.</creatorcontrib><creatorcontrib>Jia, J.F.</creatorcontrib><creatorcontrib>Qian, H.J.</creatorcontrib><creatorcontrib>Liu, F.Q.</creatorcontrib><creatorcontrib>Ibrahim, K.</creatorcontrib><creatorcontrib>Zhou, Y.M.</creatorcontrib><creatorcontrib>Xue, Q.K.</creatorcontrib><creatorcontrib>Wu, S.C.</creatorcontrib><collection>Pascal-Francis</collection><jtitle>Solid state communications</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, P.</au><au>Gao, X.</au><au>Xun, K.</au><au>Jia, J.F.</au><au>Qian, H.J.</au><au>Liu, F.Q.</au><au>Ibrahim, K.</au><au>Zhou, Y.M.</au><au>Xue, Q.K.</au><au>Wu, S.C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Atomic and electronic structure of ([formula omitted])R 30°-In phase on Cu(111)</atitle><jtitle>Solid state communications</jtitle><date>2003-03</date><risdate>2003</risdate><volume>125</volume><issue>9</issue><spage>509</spage><epage>514</epage><pages>509-514</pages><issn>0038-1098</issn><eissn>1879-2766</eissn><coden>SSCOA4</coden><abstract>The atomic and electronic structure of (3×3)R30°-In phase on Cu(111) was studied by synchrotron radiation photoemission and scanning tunneling microscopy (STM). The two-dimensional states of In induced bands in the (3×3)R30° phase were measured by angle-resolved photoemission. Theoretical calculations have been made to obtain further information on the In induced bands.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/S0038-1098(02)00815-3</doi><tpages>6</tpages></addata></record> |
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| ispartof | Solid state communications, 2003-03, Vol.125 (9), p.509-514 |
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| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | A. Thin film growth C. Surface topography Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties D. Band structure Electron, ion, and scanning probe microscopy Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Structure and morphology thickness Structure of solids and liquids crystallography Surface and interface electron states Surface states, band structure, electron density of states Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
| title | Atomic and electronic structure of ([formula omitted])R 30°-In phase on Cu(111) |
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