Nature of interface bonding of ethylene and benzene with Si(100)c(4 × 2): angle-dependent Si2p high resolution photoelectron spectroscopy studies

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Surface science 2002, Vol.513 (3), p.413-421
Hauptverfasser: NAGAO, Masashi, YAMASHITA, Yoshiyuki, MACHIDA, Shinichi, HAMAGUCHI, Kanae, YASUI, Fumiko, MUKAI, Kozo, YOSHINOBU, Jun
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 421
container_issue 3
container_start_page 413
container_title Surface science
container_volume 513
creator NAGAO, Masashi
YAMASHITA, Yoshiyuki
MACHIDA, Shinichi
HAMAGUCHI, Kanae
YASUI, Fumiko
MUKAI, Kozo
YOSHINOBU, Jun
description
format Article
fullrecord <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_13805741</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>13805741</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_138057413</originalsourceid><addsrcrecordid>eNqNiktOxDAQRC0EEuFzh94gzSwiOT-SsEUgVmyG_chjdxIj07bcjlA4BhsOxMXIIA5AbepV6Z2IrOjaPi_bpjsVmZRVn9_KsjsXF8yvck3dN5n4fFZpjgh-AEsJ46A0wsGTsTQeT0zT4pAQFBk4IH0c-d2mCXZ2U0i51Zsavr-g3N6tyugwNxiQDFJajTLAZMcJIrJ3c7KeIEw-eXSoU1wXh19g7cMCnGZjka_E2aAc4_VfX4qbx4eX-6c8KNbKDVGRtrwP0b6puOyLqpNNWxfVf70fp4paGQ</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Nature of interface bonding of ethylene and benzene with Si(100)c(4 × 2): angle-dependent Si2p high resolution photoelectron spectroscopy studies</title><source>Access via ScienceDirect (Elsevier)</source><creator>NAGAO, Masashi ; YAMASHITA, Yoshiyuki ; MACHIDA, Shinichi ; HAMAGUCHI, Kanae ; YASUI, Fumiko ; MUKAI, Kozo ; YOSHINOBU, Jun</creator><creatorcontrib>NAGAO, Masashi ; YAMASHITA, Yoshiyuki ; MACHIDA, Shinichi ; HAMAGUCHI, Kanae ; YASUI, Fumiko ; MUKAI, Kozo ; YOSHINOBU, Jun</creatorcontrib><identifier>ISSN: 0039-6028</identifier><identifier>EISSN: 1879-2758</identifier><identifier>CODEN: SUSCAS</identifier><language>eng</language><publisher>Amsterdam: Elsevier Science</publisher><subject>Adsorption and desorption kinetics; evaporation and condensation ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Exact sciences and technology ; Impurity and defect levels; energy states of adsorbed species ; Physics ; Solid-fluid interfaces ; Surface and interface electron states ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><ispartof>Surface science, 2002, Vol.513 (3), p.413-421</ispartof><rights>2002 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,781,785,4025</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=13805741$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>NAGAO, Masashi</creatorcontrib><creatorcontrib>YAMASHITA, Yoshiyuki</creatorcontrib><creatorcontrib>MACHIDA, Shinichi</creatorcontrib><creatorcontrib>HAMAGUCHI, Kanae</creatorcontrib><creatorcontrib>YASUI, Fumiko</creatorcontrib><creatorcontrib>MUKAI, Kozo</creatorcontrib><creatorcontrib>YOSHINOBU, Jun</creatorcontrib><title>Nature of interface bonding of ethylene and benzene with Si(100)c(4 × 2): angle-dependent Si2p high resolution photoelectron spectroscopy studies</title><title>Surface science</title><subject>Adsorption and desorption kinetics; evaporation and condensation</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</subject><subject>Exact sciences and technology</subject><subject>Impurity and defect levels; energy states of adsorbed species</subject><subject>Physics</subject><subject>Solid-fluid interfaces</subject><subject>Surface and interface electron states</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0039-6028</issn><issn>1879-2758</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNqNiktOxDAQRC0EEuFzh94gzSwiOT-SsEUgVmyG_chjdxIj07bcjlA4BhsOxMXIIA5AbepV6Z2IrOjaPi_bpjsVmZRVn9_KsjsXF8yvck3dN5n4fFZpjgh-AEsJ46A0wsGTsTQeT0zT4pAQFBk4IH0c-d2mCXZ2U0i51Zsavr-g3N6tyugwNxiQDFJajTLAZMcJIrJ3c7KeIEw-eXSoU1wXh19g7cMCnGZjka_E2aAc4_VfX4qbx4eX-6c8KNbKDVGRtrwP0b6puOyLqpNNWxfVf70fp4paGQ</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>NAGAO, Masashi</creator><creator>YAMASHITA, Yoshiyuki</creator><creator>MACHIDA, Shinichi</creator><creator>HAMAGUCHI, Kanae</creator><creator>YASUI, Fumiko</creator><creator>MUKAI, Kozo</creator><creator>YOSHINOBU, Jun</creator><general>Elsevier Science</general><scope>IQODW</scope></search><sort><creationdate>2002</creationdate><title>Nature of interface bonding of ethylene and benzene with Si(100)c(4 × 2): angle-dependent Si2p high resolution photoelectron spectroscopy studies</title><author>NAGAO, Masashi ; YAMASHITA, Yoshiyuki ; MACHIDA, Shinichi ; HAMAGUCHI, Kanae ; YASUI, Fumiko ; MUKAI, Kozo ; YOSHINOBU, Jun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_138057413</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Adsorption and desorption kinetics; evaporation and condensation</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</topic><topic>Exact sciences and technology</topic><topic>Impurity and defect levels; energy states of adsorbed species</topic><topic>Physics</topic><topic>Solid-fluid interfaces</topic><topic>Surface and interface electron states</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>NAGAO, Masashi</creatorcontrib><creatorcontrib>YAMASHITA, Yoshiyuki</creatorcontrib><creatorcontrib>MACHIDA, Shinichi</creatorcontrib><creatorcontrib>HAMAGUCHI, Kanae</creatorcontrib><creatorcontrib>YASUI, Fumiko</creatorcontrib><creatorcontrib>MUKAI, Kozo</creatorcontrib><creatorcontrib>YOSHINOBU, Jun</creatorcontrib><collection>Pascal-Francis</collection><jtitle>Surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>NAGAO, Masashi</au><au>YAMASHITA, Yoshiyuki</au><au>MACHIDA, Shinichi</au><au>HAMAGUCHI, Kanae</au><au>YASUI, Fumiko</au><au>MUKAI, Kozo</au><au>YOSHINOBU, Jun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nature of interface bonding of ethylene and benzene with Si(100)c(4 × 2): angle-dependent Si2p high resolution photoelectron spectroscopy studies</atitle><jtitle>Surface science</jtitle><date>2002</date><risdate>2002</risdate><volume>513</volume><issue>3</issue><spage>413</spage><epage>421</epage><pages>413-421</pages><issn>0039-6028</issn><eissn>1879-2758</eissn><coden>SUSCAS</coden><cop>Amsterdam</cop><cop>New York, NY</cop><cop>Lausanne</cop><pub>Elsevier Science</pub></addata></record>
fulltext fulltext
identifier ISSN: 0039-6028
ispartof Surface science, 2002, Vol.513 (3), p.413-421
issn 0039-6028
1879-2758
language eng
recordid cdi_pascalfrancis_primary_13805741
source Access via ScienceDirect (Elsevier)
subjects Adsorption and desorption kinetics
evaporation and condensation
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Exact sciences and technology
Impurity and defect levels
energy states of adsorbed species
Physics
Solid-fluid interfaces
Surface and interface electron states
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
title Nature of interface bonding of ethylene and benzene with Si(100)c(4 × 2): angle-dependent Si2p high resolution photoelectron spectroscopy studies
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T19%3A29%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nature%20of%20interface%20bonding%20of%20ethylene%20and%20benzene%20with%20Si(100)c(4%20%C3%97%202):%20angle-dependent%20Si2p%20high%20resolution%20photoelectron%20spectroscopy%20studies&rft.jtitle=Surface%20science&rft.au=NAGAO,%20Masashi&rft.date=2002&rft.volume=513&rft.issue=3&rft.spage=413&rft.epage=421&rft.pages=413-421&rft.issn=0039-6028&rft.eissn=1879-2758&rft.coden=SUSCAS&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E13805741%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true