Crystallinity and thickness control of well-ordered ultra-thin Al2O3 film on NiAl(110)
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Veröffentlicht in: | Surface science 2002-06, Vol.511 (1-3), p.L313-L318 |
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container_issue | 1-3 |
container_start_page | L313 |
container_title | Surface science |
container_volume | 511 |
creator | YOSHITAKE, M MEBARKI, B LAY, T. T |
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doi_str_mv | 10.1016/S0039-6028(02)01567-4 |
format | Article |
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ispartof | Surface science, 2002-06, Vol.511 (1-3), p.L313-L318 |
issn | 0039-6028 1879-2758 |
language | eng |
recordid | cdi_pascalfrancis_primary_13722879 |
source | ScienceDirect Journals (5 years ago - present) |
subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
title | Crystallinity and thickness control of well-ordered ultra-thin Al2O3 film on NiAl(110) |
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