Crystallinity and thickness control of well-ordered ultra-thin Al2O3 film on NiAl(110)

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Veröffentlicht in:Surface science 2002-06, Vol.511 (1-3), p.L313-L318
Hauptverfasser: YOSHITAKE, M, MEBARKI, B, LAY, T. T
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container_end_page L318
container_issue 1-3
container_start_page L313
container_title Surface science
container_volume 511
creator YOSHITAKE, M
MEBARKI, B
LAY, T. T
description
doi_str_mv 10.1016/S0039-6028(02)01567-4
format Article
fullrecord <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_13722879</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>13722879</sourcerecordid><originalsourceid>FETCH-LOGICAL-p183t-cb2ea75ded23a2d947562af51bbdebb1ab0d99dfc16704bdc0be1427fa76f16f3</originalsourceid><addsrcrecordid>eNo9kEtLAzEURoMoWKs_QchGaBfR3GQmmVmW4guKXfjYlpsXRtNMSUak_96C4tl8m8O3OIRcAr8GDurmmXPZM8VFN-NizqFVmjVHZAKd7pnQbXdMJv_KKTmr9YMfaPp2Qt6WZV9HTCnmOO4pZkfH92g_s6-V2iGPZUh0CPTbp8SG4nzxjn6lsSA7eJkuklhLGmLa0iHTp7hIMwA-PycnAVP1F387Ja93ty_LB7Za3z8uFyu2g06OzBrhUbfOOyFRuL7RrRIYWjDGeWMADXd974IFpXljnOXGQyN0QK0CqCCn5Or3d4fVYgoFs411sytxi2W_AamFOFSQP0gmVSY</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Crystallinity and thickness control of well-ordered ultra-thin Al2O3 film on NiAl(110)</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>YOSHITAKE, M ; MEBARKI, B ; LAY, T. T</creator><creatorcontrib>YOSHITAKE, M ; MEBARKI, B ; LAY, T. T</creatorcontrib><identifier>ISSN: 0039-6028</identifier><identifier>EISSN: 1879-2758</identifier><identifier>DOI: 10.1016/S0039-6028(02)01567-4</identifier><identifier>CODEN: SUSCAS</identifier><language>eng</language><publisher>Lausanne: Elsevier Science</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Physics ; Structure and morphology; thickness ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology</subject><ispartof>Surface science, 2002-06, Vol.511 (1-3), p.L313-L318</ispartof><rights>2002 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=13722879$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>YOSHITAKE, M</creatorcontrib><creatorcontrib>MEBARKI, B</creatorcontrib><creatorcontrib>LAY, T. T</creatorcontrib><title>Crystallinity and thickness control of well-ordered ultra-thin Al2O3 film on NiAl(110)</title><title>Surface science</title><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Structure and morphology; thickness</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><issn>0039-6028</issn><issn>1879-2758</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNo9kEtLAzEURoMoWKs_QchGaBfR3GQmmVmW4guKXfjYlpsXRtNMSUak_96C4tl8m8O3OIRcAr8GDurmmXPZM8VFN-NizqFVmjVHZAKd7pnQbXdMJv_KKTmr9YMfaPp2Qt6WZV9HTCnmOO4pZkfH92g_s6-V2iGPZUh0CPTbp8SG4nzxjn6lsSA7eJkuklhLGmLa0iHTp7hIMwA-PycnAVP1F387Ja93ty_LB7Za3z8uFyu2g06OzBrhUbfOOyFRuL7RrRIYWjDGeWMADXd974IFpXljnOXGQyN0QK0CqCCn5Or3d4fVYgoFs411sytxi2W_AamFOFSQP0gmVSY</recordid><startdate>20020610</startdate><enddate>20020610</enddate><creator>YOSHITAKE, M</creator><creator>MEBARKI, B</creator><creator>LAY, T. T</creator><general>Elsevier Science</general><scope>IQODW</scope></search><sort><creationdate>20020610</creationdate><title>Crystallinity and thickness control of well-ordered ultra-thin Al2O3 film on NiAl(110)</title><author>YOSHITAKE, M ; MEBARKI, B ; LAY, T. T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p183t-cb2ea75ded23a2d947562af51bbdebb1ab0d99dfc16704bdc0be1427fa76f16f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Structure and morphology; thickness</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>YOSHITAKE, M</creatorcontrib><creatorcontrib>MEBARKI, B</creatorcontrib><creatorcontrib>LAY, T. T</creatorcontrib><collection>Pascal-Francis</collection><jtitle>Surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>YOSHITAKE, M</au><au>MEBARKI, B</au><au>LAY, T. T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Crystallinity and thickness control of well-ordered ultra-thin Al2O3 film on NiAl(110)</atitle><jtitle>Surface science</jtitle><date>2002-06-10</date><risdate>2002</risdate><volume>511</volume><issue>1-3</issue><spage>L313</spage><epage>L318</epage><pages>L313-L318</pages><issn>0039-6028</issn><eissn>1879-2758</eissn><coden>SUSCAS</coden><cop>Lausanne</cop><cop>Amsterdam</cop><cop>New York, NY</cop><pub>Elsevier Science</pub><doi>10.1016/S0039-6028(02)01567-4</doi></addata></record>
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1879-2758
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source ScienceDirect Journals (5 years ago - present)
subjects Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
title Crystallinity and thickness control of well-ordered ultra-thin Al2O3 film on NiAl(110)
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T13%3A14%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Crystallinity%20and%20thickness%20control%20of%20well-ordered%20ultra-thin%20Al2O3%20film%20on%20NiAl(110)&rft.jtitle=Surface%20science&rft.au=YOSHITAKE,%20M&rft.date=2002-06-10&rft.volume=511&rft.issue=1-3&rft.spage=L313&rft.epage=L318&rft.pages=L313-L318&rft.issn=0039-6028&rft.eissn=1879-2758&rft.coden=SUSCAS&rft_id=info:doi/10.1016/S0039-6028(02)01567-4&rft_dat=%3Cpascalfrancis%3E13722879%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true