Scanning force microscopy investigations on electroactive polymer films
The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields.
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 468 |
|---|---|
| container_issue | |
| container_start_page | 465 |
| container_title | |
| container_volume | |
| creator | Sturm, H. Geub, M. Schulz, E. |
| description | The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields. |
| doi_str_mv | 10.1109/ISE.1999.832086 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>pascalfrancis_6IE</sourceid><recordid>TN_cdi_pascalfrancis_primary_1370704</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>832086</ieee_id><sourcerecordid>1370704</sourcerecordid><originalsourceid>FETCH-LOGICAL-i116t-d4bb1103112c3aa2f88d62116570a82cb708b0a97c0e4789a4a7f6f3738283b33</originalsourceid><addsrcrecordid>eNo9UD1rwzAUFJRCS5q50ElDV6dPH7aksYQ0DQQypJ3DsyIFFVsykgn439eQ0uPghjuO4wh5ZrBiDMzb7rhZMWPMSgsOurkjS6M0zBQ18BoeyLKUH5gha2mYfCTbo8UYQ7xQn7J1tA82p2LTMNEQr66M4YJjSLHQFKnrnB1zQjuGq6ND6qbeZepD15cncu-xK275pwvy_bH5Wn9W-8N2t37fV4GxZqzOsm3noYIxbgUi91qfGz5btQLU3LYKdAtolAUnlTYoUfnGCyU016IVYkFeb70DFoudzxhtKKchhx7zdGJCgQI5x15useCc-3dvp4hfJa1XAQ</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Scanning force microscopy investigations on electroactive polymer films</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Sturm, H. ; Geub, M. ; Schulz, E.</creator><creatorcontrib>Sturm, H. ; Geub, M. ; Schulz, E.</creatorcontrib><description>The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields.</description><identifier>ISBN: 9780780350250</identifier><identifier>ISBN: 0780350251</identifier><identifier>DOI: 10.1109/ISE.1999.832086</identifier><language>eng</language><publisher>New York NY: IEEE</publisher><subject>Calibration ; Capacitive sensors ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Dielectric, piezoelectric, ferroelectric and antiferroelectric materials ; Dielectrics, piezoelectrics, and ferroelectrics and their properties ; Electrodes ; Exact sciences and technology ; Gold ; Optical fiber sensors ; Physics ; Piezoelectric films ; Piezoelectricity and electromechanical effects ; Polymer films ; Polymers; organic compounds ; Scanning electron microscopy ; Strain measurement ; Surface topography</subject><ispartof>10th International Symposium on Electrets (ISE 10). Proceedings (Cat. No.99 CH36256), 1999, p.465-468</ispartof><rights>2000 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/832086$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,4048,4049,27924,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/832086$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1370704$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Sturm, H.</creatorcontrib><creatorcontrib>Geub, M.</creatorcontrib><creatorcontrib>Schulz, E.</creatorcontrib><title>Scanning force microscopy investigations on electroactive polymer films</title><title>10th International Symposium on Electrets (ISE 10). Proceedings (Cat. No.99 CH36256)</title><addtitle>ISE</addtitle><description>The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields.</description><subject>Calibration</subject><subject>Capacitive sensors</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Dielectric, piezoelectric, ferroelectric and antiferroelectric materials</subject><subject>Dielectrics, piezoelectrics, and ferroelectrics and their properties</subject><subject>Electrodes</subject><subject>Exact sciences and technology</subject><subject>Gold</subject><subject>Optical fiber sensors</subject><subject>Physics</subject><subject>Piezoelectric films</subject><subject>Piezoelectricity and electromechanical effects</subject><subject>Polymer films</subject><subject>Polymers; organic compounds</subject><subject>Scanning electron microscopy</subject><subject>Strain measurement</subject><subject>Surface topography</subject><isbn>9780780350250</isbn><isbn>0780350251</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1999</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9UD1rwzAUFJRCS5q50ElDV6dPH7aksYQ0DQQypJ3DsyIFFVsykgn439eQ0uPghjuO4wh5ZrBiDMzb7rhZMWPMSgsOurkjS6M0zBQ18BoeyLKUH5gha2mYfCTbo8UYQ7xQn7J1tA82p2LTMNEQr66M4YJjSLHQFKnrnB1zQjuGq6ND6qbeZepD15cncu-xK275pwvy_bH5Wn9W-8N2t37fV4GxZqzOsm3noYIxbgUi91qfGz5btQLU3LYKdAtolAUnlTYoUfnGCyU016IVYkFeb70DFoudzxhtKKchhx7zdGJCgQI5x15useCc-3dvp4hfJa1XAQ</recordid><startdate>1999</startdate><enddate>1999</enddate><creator>Sturm, H.</creator><creator>Geub, M.</creator><creator>Schulz, E.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>IQODW</scope></search><sort><creationdate>1999</creationdate><title>Scanning force microscopy investigations on electroactive polymer films</title><author>Sturm, H. ; Geub, M. ; Schulz, E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i116t-d4bb1103112c3aa2f88d62116570a82cb708b0a97c0e4789a4a7f6f3738283b33</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Calibration</topic><topic>Capacitive sensors</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Dielectric, piezoelectric, ferroelectric and antiferroelectric materials</topic><topic>Dielectrics, piezoelectrics, and ferroelectrics and their properties</topic><topic>Electrodes</topic><topic>Exact sciences and technology</topic><topic>Gold</topic><topic>Optical fiber sensors</topic><topic>Physics</topic><topic>Piezoelectric films</topic><topic>Piezoelectricity and electromechanical effects</topic><topic>Polymer films</topic><topic>Polymers; organic compounds</topic><topic>Scanning electron microscopy</topic><topic>Strain measurement</topic><topic>Surface topography</topic><toplevel>online_resources</toplevel><creatorcontrib>Sturm, H.</creatorcontrib><creatorcontrib>Geub, M.</creatorcontrib><creatorcontrib>Schulz, E.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sturm, H.</au><au>Geub, M.</au><au>Schulz, E.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Scanning force microscopy investigations on electroactive polymer films</atitle><btitle>10th International Symposium on Electrets (ISE 10). Proceedings (Cat. No.99 CH36256)</btitle><stitle>ISE</stitle><date>1999</date><risdate>1999</risdate><spage>465</spage><epage>468</epage><pages>465-468</pages><isbn>9780780350250</isbn><isbn>0780350251</isbn><abstract>The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields.</abstract><cop>New York NY</cop><pub>IEEE</pub><doi>10.1109/ISE.1999.832086</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISBN: 9780780350250 |
| ispartof | 10th International Symposium on Electrets (ISE 10). Proceedings (Cat. No.99 CH36256), 1999, p.465-468 |
| issn | |
| language | eng |
| recordid | cdi_pascalfrancis_primary_1370704 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Calibration Capacitive sensors Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric, piezoelectric, ferroelectric and antiferroelectric materials Dielectrics, piezoelectrics, and ferroelectrics and their properties Electrodes Exact sciences and technology Gold Optical fiber sensors Physics Piezoelectric films Piezoelectricity and electromechanical effects Polymer films Polymers organic compounds Scanning electron microscopy Strain measurement Surface topography |
| title | Scanning force microscopy investigations on electroactive polymer films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T12%3A08%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Scanning%20force%20microscopy%20investigations%20on%20electroactive%20polymer%20films&rft.btitle=10th%20International%20Symposium%20on%20Electrets%20(ISE%2010).%20Proceedings%20(Cat.%20No.99%20CH36256)&rft.au=Sturm,%20H.&rft.date=1999&rft.spage=465&rft.epage=468&rft.pages=465-468&rft.isbn=9780780350250&rft.isbn_list=0780350251&rft_id=info:doi/10.1109/ISE.1999.832086&rft_dat=%3Cpascalfrancis_6IE%3E1370704%3C/pascalfrancis_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=832086&rfr_iscdi=true |