Performance verification of a practical fault current limiter using YBCO thin film
Aiming at a practical use of superconducting fault current limiter, a newly designed device which consists of YBCO thin films and normal conducting films has been developed. The configuration allows increase of the resistance of the YBCO film without excess heating and partial overvoltage. To verify...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2001-03, Vol.11 (1), p.2499-2502 |
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| container_title | IEEE transactions on applied superconductivity |
| container_volume | 11 |
| creator | Takasaki, M. Torii, S. Taniguchi, H. Kubota, H. Kudo, Y. Yoshino, H. Nagamura, H. Shibuya, M. |
| description | Aiming at a practical use of superconducting fault current limiter, a newly designed device which consists of YBCO thin films and normal conducting films has been developed. The configuration allows increase of the resistance of the YBCO film without excess heating and partial overvoltage. To verify the current limiting performance and the reliability of the device, an analogue simulator test with a condition equivalent to a typical distribution system has been conducted. The developed device can limit a fault current to a target level within a half cycle and the increasing speed of the resistance is fast enough to mitigate the current overshoot after the fault. The series and parallel connection of the unit devices are feasible to attain large capacity. These test results prove that the proposed device has sufficient performance for applying to an actual power system. |
| doi_str_mv | 10.1109/77.920372 |
| format | Article |
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The configuration allows increase of the resistance of the YBCO film without excess heating and partial overvoltage. To verify the current limiting performance and the reliability of the device, an analogue simulator test with a condition equivalent to a typical distribution system has been conducted. The developed device can limit a fault current to a target level within a half cycle and the increasing speed of the resistance is fast enough to mitigate the current overshoot after the fault. The series and parallel connection of the unit devices are feasible to attain large capacity. These test results prove that the proposed device has sufficient performance for applying to an actual power system.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/77.920372</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Conductive films ; Connection and protection apparatus ; Constraining ; COPPER OXIDE ; Current limiters ; Devices ; Electrical engineering. Electrical power engineering ; ELECTRONIC PRODUCTS ; Equivalence ; Exact sciences and technology ; Fault current limiters ; Faults ; Resistance heating ; Superconducting films ; Superconducting thin films ; SUPERCONDUCTIVITY ; SUPERCONDUCTORS ; System testing ; Thin film devices ; THIN FILMS ; Voltage control ; YBCO superconductors ; Yttrium barium copper oxide ; YTTRIUM OXIDE</subject><ispartof>IEEE transactions on applied superconductivity, 2001-03, Vol.11 (1), p.2499-2502</ispartof><rights>2001 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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The configuration allows increase of the resistance of the YBCO film without excess heating and partial overvoltage. To verify the current limiting performance and the reliability of the device, an analogue simulator test with a condition equivalent to a typical distribution system has been conducted. The developed device can limit a fault current to a target level within a half cycle and the increasing speed of the resistance is fast enough to mitigate the current overshoot after the fault. The series and parallel connection of the unit devices are feasible to attain large capacity. These test results prove that the proposed device has sufficient performance for applying to an actual power system.</description><subject>Applied sciences</subject><subject>Conductive films</subject><subject>Connection and protection apparatus</subject><subject>Constraining</subject><subject>COPPER OXIDE</subject><subject>Current limiters</subject><subject>Devices</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>ELECTRONIC PRODUCTS</subject><subject>Equivalence</subject><subject>Exact sciences and technology</subject><subject>Fault current limiters</subject><subject>Faults</subject><subject>Resistance heating</subject><subject>Superconducting films</subject><subject>Superconducting thin films</subject><subject>SUPERCONDUCTIVITY</subject><subject>SUPERCONDUCTORS</subject><subject>System testing</subject><subject>Thin film devices</subject><subject>THIN FILMS</subject><subject>Voltage control</subject><subject>YBCO superconductors</subject><subject>Yttrium barium copper oxide</subject><subject>YTTRIUM OXIDE</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkU1LAzEQhhdRsFYPXj0FEcXD1iSbZJOjFr-gUBE9eFrS7ERT9qMmu4L_3pQtIh6UOcxk8szLJG-SHBI8IQSrizyfKIqznG4lI8K5TCknfDvWmJNUUprtJnshLDEmTDI-Sh4fwNvW17oxgD7AO-uM7lzboNYijVZemy52KmR1X3XI9N5D06HK1a4Dj_rgmlf0cjWdo-7NNci6qt5PdqyuAhxs8jh5vrl-mt6ls_nt_fRylhomaJcyUWpjqbUiHgHKrJTC5KXIVG4JwyXwhQCJjbELzcu47YJIrBYxBCGam2ycnA26K9--9xC6onbBQFXpBto-FIowwQhVJJKnf5JU8kwSpf4HhVQZwyyCx7_AZdv7Jj63iDI07p_LCJ0PkPFtCB5ssfKu1v6zILhYu1XkeTG4FdmTjaAO8butj4a48GOAMU7X2NGAOQD4vt1ofAErBZr8</recordid><startdate>20010301</startdate><enddate>20010301</enddate><creator>Takasaki, M.</creator><creator>Torii, S.</creator><creator>Taniguchi, H.</creator><creator>Kubota, H.</creator><creator>Kudo, Y.</creator><creator>Yoshino, H.</creator><creator>Nagamura, H.</creator><creator>Shibuya, M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Electrical power engineering</topic><topic>ELECTRONIC PRODUCTS</topic><topic>Equivalence</topic><topic>Exact sciences and technology</topic><topic>Fault current limiters</topic><topic>Faults</topic><topic>Resistance heating</topic><topic>Superconducting films</topic><topic>Superconducting thin films</topic><topic>SUPERCONDUCTIVITY</topic><topic>SUPERCONDUCTORS</topic><topic>System testing</topic><topic>Thin film devices</topic><topic>THIN FILMS</topic><topic>Voltage control</topic><topic>YBCO superconductors</topic><topic>Yttrium barium copper oxide</topic><topic>YTTRIUM OXIDE</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Takasaki, M.</creatorcontrib><creatorcontrib>Torii, S.</creatorcontrib><creatorcontrib>Taniguchi, H.</creatorcontrib><creatorcontrib>Kubota, H.</creatorcontrib><creatorcontrib>Kudo, Y.</creatorcontrib><creatorcontrib>Yoshino, H.</creatorcontrib><creatorcontrib>Nagamura, H.</creatorcontrib><creatorcontrib>Shibuya, M.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Ceramic Abstracts</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Takasaki, M.</au><au>Torii, S.</au><au>Taniguchi, H.</au><au>Kubota, H.</au><au>Kudo, Y.</au><au>Yoshino, H.</au><au>Nagamura, H.</au><au>Shibuya, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Performance verification of a practical fault current limiter using YBCO thin film</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>2001-03-01</date><risdate>2001</risdate><volume>11</volume><issue>1</issue><spage>2499</spage><epage>2502</epage><pages>2499-2502</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>Aiming at a practical use of superconducting fault current limiter, a newly designed device which consists of YBCO thin films and normal conducting films has been developed. The configuration allows increase of the resistance of the YBCO film without excess heating and partial overvoltage. To verify the current limiting performance and the reliability of the device, an analogue simulator test with a condition equivalent to a typical distribution system has been conducted. The developed device can limit a fault current to a target level within a half cycle and the increasing speed of the resistance is fast enough to mitigate the current overshoot after the fault. The series and parallel connection of the unit devices are feasible to attain large capacity. These test results prove that the proposed device has sufficient performance for applying to an actual power system.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/77.920372</doi><tpages>4</tpages></addata></record> |
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| subjects | Applied sciences Conductive films Connection and protection apparatus Constraining COPPER OXIDE Current limiters Devices Electrical engineering. Electrical power engineering ELECTRONIC PRODUCTS Equivalence Exact sciences and technology Fault current limiters Faults Resistance heating Superconducting films Superconducting thin films SUPERCONDUCTIVITY SUPERCONDUCTORS System testing Thin film devices THIN FILMS Voltage control YBCO superconductors Yttrium barium copper oxide YTTRIUM OXIDE |
| title | Performance verification of a practical fault current limiter using YBCO thin film |
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