Sum rules in surface differential reflectivity and reflectance anisotropy spectroscopies

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	CHIAROTTI, G, CHIARADIA, P, ARCIPRETE, F, GOLETTI, C
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Iii-v semiconductors Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	782
container_issue
container_start_page	777
container_title
container_volume	175-76
creator	CHIAROTTI, G CHIARADIA, P ARCIPRETE, F GOLETTI, C
description
format	Conference Proceeding
fullrecord	<record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_1002197</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1002197</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_10021973</originalsourceid><addsrcrecordid>eNqNizsLwjAURoMoWB__IYNrIenDtrMo7jq4ySVN4Eqahntbof_eDro7fXC-cxYi0XWVp2VZF0uRKH1s0iLPs7XYML-U0tn8JuJxGztJo7csMUgeyYGxskXnLNkwIHhJ1nlrBnzjMEkI7Q9AmE0IyP1AfZwkxxlSz6aPaHknVg482_13t-JwOd9P1zQCG_CO5hz5GQk7oOmplcp0U-V_ah8FmkZP</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Sum rules in surface differential reflectivity and reflectance anisotropy spectroscopies</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>CHIAROTTI, G ; CHIARADIA, P ; ARCIPRETE, F ; GOLETTI, C</creator><creatorcontrib>CHIAROTTI, G ; CHIARADIA, P ; ARCIPRETE, F ; GOLETTI, C</creatorcontrib><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><language>eng</language><publisher>Amsterdam: Elsevier Science</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Iii-v semiconductors ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Optical properties of specific thin films ; Physics</subject><ispartof>Applied surface science, 2001, Vol.175-76, p.777-782</ispartof><rights>2001 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,776,780,785,786,4035,4036,23910,23911,25119</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1002197$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>CHIAROTTI, G</creatorcontrib><creatorcontrib>CHIARADIA, P</creatorcontrib><creatorcontrib>ARCIPRETE, F</creatorcontrib><creatorcontrib>GOLETTI, C</creatorcontrib><title>Sum rules in surface differential reflectivity and reflectance anisotropy spectroscopies</title><title>Applied surface science</title><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Iii-v semiconductors</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of specific thin films</subject><subject>Physics</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2001</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNqNizsLwjAURoMoWB__IYNrIenDtrMo7jq4ySVN4Eqahntbof_eDro7fXC-cxYi0XWVp2VZF0uRKH1s0iLPs7XYML-U0tn8JuJxGztJo7csMUgeyYGxskXnLNkwIHhJ1nlrBnzjMEkI7Q9AmE0IyP1AfZwkxxlSz6aPaHknVg482_13t-JwOd9P1zQCG_CO5hz5GQk7oOmplcp0U-V_ah8FmkZP</recordid><startdate>2001</startdate><enddate>2001</enddate><creator>CHIAROTTI, G</creator><creator>CHIARADIA, P</creator><creator>ARCIPRETE, F</creator><creator>GOLETTI, C</creator><general>Elsevier Science</general><scope>IQODW</scope></search><sort><creationdate>2001</creationdate><title>Sum rules in surface differential reflectivity and reflectance anisotropy spectroscopies</title><author>CHIAROTTI, G ; CHIARADIA, P ; ARCIPRETE, F ; GOLETTI, C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_10021973</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Iii-v semiconductors</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Optical properties of specific thin films</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>CHIAROTTI, G</creatorcontrib><creatorcontrib>CHIARADIA, P</creatorcontrib><creatorcontrib>ARCIPRETE, F</creatorcontrib><creatorcontrib>GOLETTI, C</creatorcontrib><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>CHIAROTTI, G</au><au>CHIARADIA, P</au><au>ARCIPRETE, F</au><au>GOLETTI, C</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Sum rules in surface differential reflectivity and reflectance anisotropy spectroscopies</atitle><btitle>Applied surface science</btitle><date>2001</date><risdate>2001</risdate><volume>175-76</volume><spage>777</spage><epage>782</epage><pages>777-782</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><cop>Amsterdam</cop><pub>Elsevier Science</pub></addata></record>
fulltext	fulltext
identifier	ISSN: 0169-4332
ispartof	Applied surface science, 2001, Vol.175-76, p.777-782
issn	0169-4332 1873-5584
language	eng
recordid	cdi_pascalfrancis_primary_1002197
source	ScienceDirect Journals (5 years ago - present)
subjects	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Iii-v semiconductors Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics
title	Sum rules in surface differential reflectivity and reflectance anisotropy spectroscopies
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T16%3A06%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Sum%20rules%20in%20surface%20differential%20reflectivity%20and%20reflectance%20anisotropy%20spectroscopies&rft.btitle=Applied%20surface%20science&rft.au=CHIAROTTI,%20G&rft.date=2001&rft.volume=175-76&rft.spage=777&rft.epage=782&rft.pages=777-782&rft.issn=0169-4332&rft.eissn=1873-5584&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E1002197%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true