Switching spectroscopy piezoresponse force microscopy of ferroelectric materials
The application of ferroelectric materials for electronic devices necessitates the quantitative study of local switching behavior, including imprint, coercive bias, remanent and saturation responses, and work of switching. Here we introduce switching spectroscopy piezoresponse force microscopy as a...
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| Veröffentlicht in: | Applied physics letters 2006-02, Vol.88 (6) |
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| container_title | Applied physics letters |
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| creator | Jesse, Stephen Baddorf, Arthur P. Kalinin, Sergei V. |
| description | The application of ferroelectric materials for electronic devices necessitates the quantitative study of local switching behavior, including imprint, coercive bias, remanent and saturation responses, and work of switching. Here we introduce switching spectroscopy piezoresponse force microscopy as a tool for real-space imaging of switching properties on the nanoscale. The hysteresis curves, acquired at each point in the image, are analyzed in the thermodynamic and kinetic limits. We expect that this approach will further understanding of the relationships between material microstructure and polarization switching phenomena on the nanoscale, and provide a quantitative tool for ferroelectric-based device characterization. |
| doi_str_mv | 10.1063/1.2172216 |
| format | Article |
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(ORNL), Oak Ridge, TN (United States)</creatorcontrib><title>Switching spectroscopy piezoresponse force microscopy of ferroelectric materials</title><title>Applied physics letters</title><description>The application of ferroelectric materials for electronic devices necessitates the quantitative study of local switching behavior, including imprint, coercive bias, remanent and saturation responses, and work of switching. Here we introduce switching spectroscopy piezoresponse force microscopy as a tool for real-space imaging of switching properties on the nanoscale. The hysteresis curves, acquired at each point in the image, are analyzed in the thermodynamic and kinetic limits. 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Here we introduce switching spectroscopy piezoresponse force microscopy as a tool for real-space imaging of switching properties on the nanoscale. The hysteresis curves, acquired at each point in the image, are analyzed in the thermodynamic and kinetic limits. We expect that this approach will further understanding of the relationships between material microstructure and polarization switching phenomena on the nanoscale, and provide a quantitative tool for ferroelectric-based device characterization.</abstract><cop>United States</cop><doi>10.1063/1.2172216</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2006-02, Vol.88 (6) |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_osti_scitechconnect_978057 |
| source | AIP Journals Complete; AIP Digital Archive |
| subjects | CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS FERROELECTRIC MATERIALS HYSTERESIS KINETICS MICROSCOPY MICROSTRUCTURE POLARIZATION SATURATION SPECTROSCOPY THERMODYNAMICS |
| title | Switching spectroscopy piezoresponse force microscopy of ferroelectric materials |
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