Effect of epitaxial strain on ferroelectric polarization in multiferroic BiFeO3 films

Multiferroic BiFeO3 epitaxial films with thicknesses ranging from 40to960nm were grown by pulsed laser deposition on SrTiO3 (001) substrates with SrRuO3 bottom electrodes. X-ray characterization shows that the structure evolves from angularly distorted tetragonal with c∕a≈1.04 to more bulklike disto...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Applied physics letters 2008-01, Vol.92 (1)
Hauptverfasser:	Kim, Dae Ho, Lee, Ho Nyung, Biegalski, Michael D., Christen, Hans M.
Format:	Artikel
Sprache:	eng
Schlagworte:	BISMUTH OXIDES EPITAXY FERROELECTRIC MATERIALS IRON OXIDES MATERIALS SCIENCE NANOSCIENCE AND NANOTECHNOLOGY NANOSTRUCTURES POLARIZATION STRAINS THIN FILMS
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!