Electro-thermal tuning in a negative dielectric cholesteric liquid crystal material

The thermal and electrical tunability of a cholesteric liquid crystal containing a negative dielectric anisotropy liquid crystal in a planar alignment was studied. The physical, optical, and electro-optical characteristics of mixtures containing different ratios of chiral dopant S811 and the negativ...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 2008-05, Vol.103 (9), p.093107-093107-6
Hauptverfasser: Natarajan, Lalgudi V., Wofford, Jeremy M., Tondiglia, Vincent P., Sutherland, Richard L., Koerner, Hilmar, Vaia, Richard A., Bunning, Timothy J.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The thermal and electrical tunability of a cholesteric liquid crystal containing a negative dielectric anisotropy liquid crystal in a planar alignment was studied. The physical, optical, and electro-optical characteristics of mixtures containing different ratios of chiral dopant S811 and the negative dielectric anisotropy liquid crystal ZLI-2806 were examined. A smectic A phase was seen at room temperature for S811 loadings > 20 wt % . Below 20%, a room temperature cholesteric phase was observed. Upon heating mixtures with composition S811 > 20 % , the selective reflection notch of the cholesteric phase appeared and blueshifted with temperature. Thermal tuning from 2300 to 500 nm was observed over the temperature range of 23 - 55 ° C . Polarized optical microscopy, differential scanning calorimetry, and x-ray studies were utilized to confirm the temperature-dependent phase behavior. Tuning of ∼ 50 nm by the application of a direct current electric field was also observed with no onset of electrohydrodynamic instabilities for voltages up to ∼ 300 V . Bandwidth broadening but not tuning was obtained with the application of alternating current fields. Electrical tuning is likely due to pitch contraction brought about through the annealing of defects.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.2913326