Local, submicron, strain gradients as the cause of Sn whisker growth

It has been shown experimentally that local in-plane residual strain gradients occur around the root of spontaneously growing Sn whiskers on the surface of Sn coatings deposited on Cu. The strain distribution has been determined with synchrotron white beam micro Laue diffraction measurements. The ob...

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Veröffentlicht in:	Applied physics letters 2009-06, Vol.94 (22), p.221901-221901-3
Hauptverfasser:	Sobiech, M., Wohlschlögel, M., Welzel, U., Mittemeijer, E. J., Hügel, W., Seekamp, A., Liu, W., Ice, G. E.
Format:	Artikel
Sprache:	eng
Schlagworte:	COATINGS COPPER CRYSTAL GROWTH DEPOSITION DIFFRACTION DISTRIBUTION MATERIALS SCIENCE PARTICLE ACCELERATORS STRAINS SYNCHROTRONS TIN WHISKERS
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