Effects of focused ion beam milling on the compressive behavior of directionally solidified micro-pillars and the nanoindentation response of an electro-polished surface
Focused ion beam (FIB) milling is the typical way in which micro-pillars are fabricated to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we te...
Gespeichert in:
| Veröffentlicht in: | Acta materialia 2009-01, Vol.57 (2) |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | 2 |
| container_start_page | |
| container_title | Acta materialia |
| container_volume | 57 |
| creator | Shim, Sang Hoon Bei, Hongbin Miller, Michael K Pharr, George Mathews George, Easo P |
| description | Focused ion beam (FIB) milling is the typical way in which micro-pillars are fabricated to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we tested Mo-alloy micro-pillars that were FIB milled following directional solidification, and compared their compressive response to pillars that were not FIB milled. We also FIB milled at glancing incidence a Mo-alloy single-crystal surface, and compared its nanoindentation response to an electro-polished surface of the same crystal. Consequences for the interpretation of data obtained from FIB milled micro-pillars are discussed. |
| doi_str_mv | 10.1016/j.actamat.2008.09.033 |
| format | Article |
| fullrecord | <record><control><sourceid>osti</sourceid><recordid>TN_cdi_osti_scitechconnect_947586</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>947586</sourcerecordid><originalsourceid>FETCH-osti_scitechconnect_9475863</originalsourceid><addsrcrecordid>eNqNzF1KxDAQwPEgCq4fRxDiAdpNm34-y4oH8H0Z08TOkiYlk13wSN7SqXgAnzJh5v8T4qlSZaWqbn8qwWRYIJe1UkOpxlJpfSV21dDrom5afc2zbseia9rmVtwRnZSq6r5RO_F9cM6aTDI66aI5k50kxiA_LCxyQe8xfEr-59lKE5c1WSK8WN7PcMGYtm7CxARX4P2XpOhxQocMLWhSLFZWIJGEMP0yAULEMNmQYYskk2sMZDcKgrSesS1jh2ZW6JwcGPsgbhx4so9_7714fj28v7wVkTIeyWC2ZjYxBM6PY9O3Q6f_c_MDOzFprA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Effects of focused ion beam milling on the compressive behavior of directionally solidified micro-pillars and the nanoindentation response of an electro-polished surface</title><source>Elsevier ScienceDirect Journals</source><creator>Shim, Sang Hoon ; Bei, Hongbin ; Miller, Michael K ; Pharr, George Mathews ; George, Easo P</creator><creatorcontrib>Shim, Sang Hoon ; Bei, Hongbin ; Miller, Michael K ; Pharr, George Mathews ; George, Easo P ; Shared Research Equipment Collaborative Research Center ; High Temperature Materials Laboratory ; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><description>Focused ion beam (FIB) milling is the typical way in which micro-pillars are fabricated to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we tested Mo-alloy micro-pillars that were FIB milled following directional solidification, and compared their compressive response to pillars that were not FIB milled. We also FIB milled at glancing incidence a Mo-alloy single-crystal surface, and compared its nanoindentation response to an electro-polished surface of the same crystal. Consequences for the interpretation of data obtained from FIB milled micro-pillars are discussed.</description><identifier>ISSN: 1359-6454</identifier><identifier>EISSN: 1873-2453</identifier><identifier>DOI: 10.1016/j.actamat.2008.09.033</identifier><language>eng</language><publisher>United States</publisher><subject>COMPRESSION ; Compression test ; ELECTROPOLISHING ; Focused ion beam (FIB) damage ; ION BEAMS ; MATERIALS SCIENCE ; MECHANICAL PROPERTIES ; MILLING ; MOLYBDENUM ALLOYS ; Nanoindentation ; Plastic deformation ; PLASTICITY ; RADIATION EFFECTS ; RODS ; Yield phenomena</subject><ispartof>Acta materialia, 2009-01, Vol.57 (2)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,776,780,881,27901,27902</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/947586$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Shim, Sang Hoon</creatorcontrib><creatorcontrib>Bei, Hongbin</creatorcontrib><creatorcontrib>Miller, Michael K</creatorcontrib><creatorcontrib>Pharr, George Mathews</creatorcontrib><creatorcontrib>George, Easo P</creatorcontrib><creatorcontrib>Shared Research Equipment Collaborative Research Center</creatorcontrib><creatorcontrib>High Temperature Materials Laboratory</creatorcontrib><creatorcontrib>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><title>Effects of focused ion beam milling on the compressive behavior of directionally solidified micro-pillars and the nanoindentation response of an electro-polished surface</title><title>Acta materialia</title><description>Focused ion beam (FIB) milling is the typical way in which micro-pillars are fabricated to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we tested Mo-alloy micro-pillars that were FIB milled following directional solidification, and compared their compressive response to pillars that were not FIB milled. We also FIB milled at glancing incidence a Mo-alloy single-crystal surface, and compared its nanoindentation response to an electro-polished surface of the same crystal. Consequences for the interpretation of data obtained from FIB milled micro-pillars are discussed.</description><subject>COMPRESSION</subject><subject>Compression test</subject><subject>ELECTROPOLISHING</subject><subject>Focused ion beam (FIB) damage</subject><subject>ION BEAMS</subject><subject>MATERIALS SCIENCE</subject><subject>MECHANICAL PROPERTIES</subject><subject>MILLING</subject><subject>MOLYBDENUM ALLOYS</subject><subject>Nanoindentation</subject><subject>Plastic deformation</subject><subject>PLASTICITY</subject><subject>RADIATION EFFECTS</subject><subject>RODS</subject><subject>Yield phenomena</subject><issn>1359-6454</issn><issn>1873-2453</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNqNzF1KxDAQwPEgCq4fRxDiAdpNm34-y4oH8H0Z08TOkiYlk13wSN7SqXgAnzJh5v8T4qlSZaWqbn8qwWRYIJe1UkOpxlJpfSV21dDrom5afc2zbseia9rmVtwRnZSq6r5RO_F9cM6aTDI66aI5k50kxiA_LCxyQe8xfEr-59lKE5c1WSK8WN7PcMGYtm7CxARX4P2XpOhxQocMLWhSLFZWIJGEMP0yAULEMNmQYYskk2sMZDcKgrSesS1jh2ZW6JwcGPsgbhx4so9_7714fj28v7wVkTIeyWC2ZjYxBM6PY9O3Q6f_c_MDOzFprA</recordid><startdate>20090101</startdate><enddate>20090101</enddate><creator>Shim, Sang Hoon</creator><creator>Bei, Hongbin</creator><creator>Miller, Michael K</creator><creator>Pharr, George Mathews</creator><creator>George, Easo P</creator><scope>OTOTI</scope></search><sort><creationdate>20090101</creationdate><title>Effects of focused ion beam milling on the compressive behavior of directionally solidified micro-pillars and the nanoindentation response of an electro-polished surface</title><author>Shim, Sang Hoon ; Bei, Hongbin ; Miller, Michael K ; Pharr, George Mathews ; George, Easo P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-osti_scitechconnect_9475863</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>COMPRESSION</topic><topic>Compression test</topic><topic>ELECTROPOLISHING</topic><topic>Focused ion beam (FIB) damage</topic><topic>ION BEAMS</topic><topic>MATERIALS SCIENCE</topic><topic>MECHANICAL PROPERTIES</topic><topic>MILLING</topic><topic>MOLYBDENUM ALLOYS</topic><topic>Nanoindentation</topic><topic>Plastic deformation</topic><topic>PLASTICITY</topic><topic>RADIATION EFFECTS</topic><topic>RODS</topic><topic>Yield phenomena</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shim, Sang Hoon</creatorcontrib><creatorcontrib>Bei, Hongbin</creatorcontrib><creatorcontrib>Miller, Michael K</creatorcontrib><creatorcontrib>Pharr, George Mathews</creatorcontrib><creatorcontrib>George, Easo P</creatorcontrib><creatorcontrib>Shared Research Equipment Collaborative Research Center</creatorcontrib><creatorcontrib>High Temperature Materials Laboratory</creatorcontrib><creatorcontrib>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><collection>OSTI.GOV</collection><jtitle>Acta materialia</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shim, Sang Hoon</au><au>Bei, Hongbin</au><au>Miller, Michael K</au><au>Pharr, George Mathews</au><au>George, Easo P</au><aucorp>Shared Research Equipment Collaborative Research Center</aucorp><aucorp>High Temperature Materials Laboratory</aucorp><aucorp>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effects of focused ion beam milling on the compressive behavior of directionally solidified micro-pillars and the nanoindentation response of an electro-polished surface</atitle><jtitle>Acta materialia</jtitle><date>2009-01-01</date><risdate>2009</risdate><volume>57</volume><issue>2</issue><issn>1359-6454</issn><eissn>1873-2453</eissn><abstract>Focused ion beam (FIB) milling is the typical way in which micro-pillars are fabricated to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we tested Mo-alloy micro-pillars that were FIB milled following directional solidification, and compared their compressive response to pillars that were not FIB milled. We also FIB milled at glancing incidence a Mo-alloy single-crystal surface, and compared its nanoindentation response to an electro-polished surface of the same crystal. Consequences for the interpretation of data obtained from FIB milled micro-pillars are discussed.</abstract><cop>United States</cop><doi>10.1016/j.actamat.2008.09.033</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1359-6454 |
| ispartof | Acta materialia, 2009-01, Vol.57 (2) |
| issn | 1359-6454 1873-2453 |
| language | eng |
| recordid | cdi_osti_scitechconnect_947586 |
| source | Elsevier ScienceDirect Journals |
| subjects | COMPRESSION Compression test ELECTROPOLISHING Focused ion beam (FIB) damage ION BEAMS MATERIALS SCIENCE MECHANICAL PROPERTIES MILLING MOLYBDENUM ALLOYS Nanoindentation Plastic deformation PLASTICITY RADIATION EFFECTS RODS Yield phenomena |
| title | Effects of focused ion beam milling on the compressive behavior of directionally solidified micro-pillars and the nanoindentation response of an electro-polished surface |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T00%3A55%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-osti&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Effects%20of%20focused%20ion%20beam%20milling%20on%20the%20compressive%20behavior%20of%20directionally%20solidified%20micro-pillars%20and%20the%20nanoindentation%20response%20of%20an%20electro-polished%20surface&rft.jtitle=Acta%20materialia&rft.au=Shim,%20Sang%20Hoon&rft.aucorp=Shared%20Research%20Equipment%20Collaborative%20Research%20Center&rft.date=2009-01-01&rft.volume=57&rft.issue=2&rft.issn=1359-6454&rft.eissn=1873-2453&rft_id=info:doi/10.1016/j.actamat.2008.09.033&rft_dat=%3Costi%3E947586%3C/osti%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |