Effects of Impurities on Alumina-Niobium InterfacialMicrostructures

Optical microscopy, scanning electron microscopy, and transmission electron microscopy were employed to examine the interfacial microstructural effects of impurities in alumina substrates used to fabricate alumina-niobium interfaces via liquid-film-assisted joining. Three types of alumina were used:...

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Veröffentlicht in:	Materials characterization 2005-06, Vol.57 (1)
Hauptverfasser:	McKeown, Joseph T., Sugar, Joshua D., Gronsky, Ronald, Glaeser,Andreas M.
Format:	Artikel
Sprache:	eng
Schlagworte:	BONDING GRAIN BOUNDARIES IMPURITIES MATERIALS SCIENCE NIOBIUM NIOBIUM SILICIDES OPTICAL MICROSCOPY SAPPHIRE SCANNING ELECTRON MICROSCOPY SILICIDES SUBSTRATES TRANSMISSION ELECTRON MICROSCOPY
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